Page 1: Abstract
User Manual DA1458x/DA1468x Production Line Tool UM-B-041 Abstract This document describes the DA1458x/DA1468x Production Line Tool (PLT). The various software applications, as well as the PLT hardware are explained in detail. The purpose of this document is to help users to become familiar with the tool and help them use it in a short amount of time.
Page 2: Table Of Contents
Homekit Hash Setup Code .................. 46 6.11.2 Custom data CSV file format ................48 6.12 Golden Unit Scan Test ......................49 6.13 Creating Firmware Files under “binaries” Folder ..............50 User Manual Revision 4.2 10-Oct-2017 CFR0012 2 of 180 © 2017 Dialog Semiconductor...
Page 3 UART Baud Rate ................89 7.2.10 Test Settings (DA1468x)..................90 7.2.10.1 XTAL Trim ..................90 7.2.10.2 RF Tests ..................90 7.2.10.3 Current Measurement Test .............. 97 7.2.10.4 GPIO/LED Test ................99 User Manual Revision 4.2 10-Oct-2017 CFR0012 3 of 180 © 2017 Dialog Semiconductor...
Page 4 Appendix J Settings for DA14586 Internal SPI Flash Memory............ 160 Appendix K Honeywell Xenon 1900 Barcode Scanner Setup ............. 161 Appendix L Program the Golden Unit SPI Flash Memory ............162 User Manual Revision 4.2 10-Oct-2017 CFR0012 4 of 180 © 2017 Dialog Semiconductor...
Page 5: Figures
Figure 41: Statistics ..........................61 Figure 42: Test Options ........................62 Figure 43: BD Address Assignment ....................63 Figure 44: Example for Load from File Mode ..................64 User Manual Revision 4.2 10-Oct-2017 CFR0012 5 of 180 © 2017 Dialog Semiconductor...
Page 6 Figure 101: Barcode Scan Option in GUI PLT .................. 118 Figure 102: Barcode Scanner Controls ..................... 118 Figure 103: Barcode Scan - BD Address Assignment ..............118 User Manual Revision 4.2 10-Oct-2017 CFR0012 6 of 180 © 2017 Dialog Semiconductor...
Page 7: Tables
Table 11: DA1458x_DA1468x_GUI_PLT.exe Application Execution ..........35 Table 12: DA1458x_DA1468x_CLI_PLT.exe Application Execution ..........36 Table 13: DA1458x Test Sequence ....................36 Table 14: DA1468x Test Sequence ....................40 User Manual Revision 4.2 10-Oct-2017 CFR0012 7 of 180 © 2017 Dialog Semiconductor...
Page 8 Table 71: Path Losses per DUT from RF Tests DA1468x Options ............. 97 Table 72: Current Measurement Tests - DA1458x ................98 Table 73: Current Measurement for each Sleep State ................ 98 User Manual Revision 4.2 10-Oct-2017 CFR0012 8 of 180 © 2017 Dialog Semiconductor...
Page 9 Table 97: RF Test RSSI Results ....................... 150 Table 98: FTDI "DialogSemi" Serial Number ..................155 Table 99: DA14583 Internal SPI Flash Connections ................. 159 Table 100: DA14586 Internal SPI Flash Connections ............... 160 User Manual Revision 4.2 10-Oct-2017 CFR0012 9 of 180 © 2017 Dialog Semiconductor...
Page 10: Terms And Definitions
Receive SCPI Standard Commands for Programmable Instruments System on Chip Software Development Kit Serial Peripheral Interface Software Transmit UART Universal Asynchronous Receiver/Transmitter User Interface Universal Serial Bus User Manual Revision 4.2 10-Oct-2017 CFR0012 10 of 180 © 2017 Dialog Semiconductor...
Page 11 UM-B-041 DA1458x/DA1468x Production Line Tool VISA Virtual Instrument Software Architecture Programming supply voltage (pin) Extensible Markup Language XTAL Crystal XML Schema Definition User Manual Revision 4.2 10-Oct-2017 CFR0012 11 of 180 © 2017 Dialog Semiconductor...
Page 12: References
NI USB TC-01, http://sine.ni.com/nips/cds/view/p/lang/en/nid/208177 [10] Honeywell Xenon 1900, https://www.honeywellaidc.com/products/barcode-scanners/general- duty/xenon-1900g-1902g [11] Zebra/Motorola LS2208, https://www.zebra.com/us/en/products/scanners/general-purpose- scanners/handheld/ls2208.html [12] AN-B-020, DA14580 End product testing and programming guidelines, Application Note, Dialog Semiconductor [13] Litepoint IQXel-M, http://www.litepoint.com/test-solutions-for-manufacturing/iqxel-m/ [14] NI USB-6009 DAQ, http://sine.ni.com/nips/cds/view/p/lang/en/nid/201987 [15] Keysight 34461A, http://www.keysight.com/en/pd-2270273-pn-34461A/digital-multimeter-6-digit- 34401a-replacement-truevolt-dmm?cc=GR&lc=eng User Manual Revision 4.2...
Page 13: New Version Features
DA15100/1 devices. Improved current In case of failure, the PLT switches off the devices one by one until the measurements. failed DUT is found. User Manual Revision 4.2 10-Oct-2017 CFR0012 13 of 180 © 2017 Dialog Semiconductor...
Page 14: Introduction
5. Burn the OTP header. 6. Perform Scan test. Reset the DUTs and set the GU to scan for the DUT BLE advertisements. Figure 1: Production Line Tool Hardware User Manual Revision 4.2 10-Oct-2017 CFR0012 14 of 180 © 2017 Dialog Semiconductor...
Page 15: Hardware
4x URX/UTX Commands XTAL trim pulse VPP Enable CPLD VBAT Enable URX/UTX URX/UTX URX/UTX URX/UTX DUT1 DUT2 DUT3 DUT16 Figure 2: Production Line Tool Hardware Board Block Diagram User Manual Revision 4.2 10-Oct-2017 CFR0012 15 of 180 © 2017 Dialog Semiconductor...
Page 16: Printed Circuit Board Layout
The blue banana sockets can be used for device current measurements. Figure 4: PLT Hardware Power Connections User Manual Revision 4.2 10-Oct-2017 CFR0012 16 of 180 © 2017 Dialog Semiconductor...
Page 17: Dut Connector
This is connected to the device UART TX pin. This pin must be connected. This pin provides the 6.8V required to program the OTP in the DA14580/1/2/3 devices. Note: This option is not available with the VBAT as Reset mode. User Manual Revision 4.2 10-Oct-2017 CFR0012 17 of 180 © 2017 Dialog Semiconductor...
Page 18: Data Streaming
CPLD TIMER Tg  CPLD S4  DUT RxD (programmed as GPIO). UART-TxD data is transported via the BLUE arrows (BB): PC  USB  USB HUB  Quad UART  CPLD signal ‘BB’  DUT TxD. User Manual Revision 4.2 10-Oct-2017 CFR0012 18 of 180 © 2017 Dialog Semiconductor...
Page 19: Figure 7: Cpld Xtal Trim Pulse Data Stream
This could cause problems with the Power On Reset (POR) and the product might not boot correctly. The CPLD will switch off the UART signals when the VBAT is not present. User Manual Revision 4.2 10-Oct-2017 CFR0012 19 of 180 © 2017 Dialog Semiconductor...
Page 20: Golden Unit
Making pin DTR low for a short period of time will reset the GU. Every time the PLT tests start, a hardware reset is issued to the Golden Unit. Jumper J47 should be ON and J46 OFF for this reset method to operate. User Manual Revision 4.2 10-Oct-2017 CFR0012 20 of 180 © 2017 Dialog Semiconductor...
Page 21: Current Measurements
Connects the VBAT line from the PLT power supply to the DUTs. This jumper can be used when there is no multi-meter instrument connected for current measurement. User Manual Revision 4.2 10-Oct-2017 CFR0012 21 of 180 © 2017 Dialog Semiconductor...
Page 22: J26 - Current Measurements
DA1468x DUT. Note: The VPP line feature cannot be used with the VBAT as Reset mode. Figure 13: VPP Control Circuit Schematic User Manual Revision 4.2 10-Oct-2017 CFR0012 22 of 180 © 2017 Dialog Semiconductor...
Page 23: J47, J46 - Gu Reset
SysRAM via the JTAG connector or via UART. Figure 17 shows the circuit schematic and Figure 18 shows the location of jumper J37 on the PLT PCB. User Manual Revision 4.2 10-Oct-2017 CFR0012 23 of 180 © 2017 Dialog Semiconductor...
Page 24: Figure 17: J37 - Gu Programming Jumper Schematics
UM-B-041 DA1458x/DA1468x Production Line Tool Figure 17: J37 - GU Programming Jumper Schematics Figure 18: Location of J37 Jumper User Manual Revision 4.2 10-Oct-2017 CFR0012 24 of 180 © 2017 Dialog Semiconductor...
Page 25: Plt Functional Blocks
DUT 13 DUT 14 DUT 15 12MHz DUT 16 Xtal USB UART Golden Unit Power 6.7V Vbat Vbat DUTs VDDIO VDDIO CPLD Figure 19: PLT Functional Blocks User Manual Revision 4.2 10-Oct-2017 CFR0012 25 of 180 © 2017 Dialog Semiconductor...
Page 26: Software
Graphical User Interface (GUI) application. Performs the actual device validation and memory programming. Provides a visual indication of the test results and access to the result logs. User Manual Revision 4.2 10-Oct-2017 CFR0012 26 of 180 © 2017 Dialog Semiconductor...
Page 27: Da15100/1 Support
Contains the BLE tester instrument DLLs. This is the DLL that performs the Direct Test Mode RF tests ble_tester_instr_plugins/mt8852b.dll using the Anritsu MT8852B instrument [5]. User Manual Revision 4.2 10-Oct-2017 CFR0012 27 of 180 © 2017 Dialog Semiconductor...
Page 28 Honeywell Xenon 1900 and the Motorola LS2208 barcode scan readers [10] [11].. This is the DLL that loads and accesses all BLE tester ble_tester_driver.dll/.lib instrument DLLs from inside ble_tester_instr_plugins folder. User Manual Revision 4.2 10-Oct-2017 CFR0012 28 of 180 © 2017 Dialog Semiconductor...
Page 29: Prerequisites
Used if a barcode scanner is going to be used for scanning the device BD addresses and/or custom memory data. NI-VISA 15.5 Used for optional instrument control, like BLE tester and voltage meter. User Manual Revision 4.2 10-Oct-2017 CFR0012 29 of 180 © 2017 Dialog Semiconductor...
Page 30: System Requirements
Special care should be taken to work with multiple PLT hardware and software. Most probably, two different BD address files should be used for each different PLT hardware. User Manual Revision 4.2 10-Oct-2017 CFR0012 30 of 180 © 2017 Dialog Semiconductor...
Page 31: Building The Code
Download the latest PLT software package (e.g. DA1458x_DA1468x_PLT_v_4.x.zip) Extract the software package. The following two folders should exist. Go to folder 'source\production_line_tool'. The following files and folders should exist. User Manual Revision 4.2 10-Oct-2017 CFR0012 31 of 180 © 2017 Dialog Semiconductor...
Page 32: Executing The Applications
Table 10: DA1458x_DA1468x_CFG_PLT.exe Application Execution Step Description Download the latest PLT software package (e.g. DA1458x_DA1468x_PLT_v_4.x.zip). Extract the software package. The following two folders should exist. User Manual Revision 4.2 10-Oct-2017 CFR0012 32 of 180 © 2017 Dialog Semiconductor...
Page 33 Therefore, this warning message indicates that the GU COM port set in the params.xml file is not valid or that the GU USB cable is not connected to the PC. Press 'OK' if the warning message appears. User Manual Revision 4.2 10-Oct-2017 CFR0012 33 of 180 © 2017 Dialog Semiconductor...
Page 34 Windows Device Manager that 17 new COM ports were found, 16 for the DUTs and 1 for the GU. The following picture is an example of a Device Manager COM ports for a PC that has the PLT connected. User Manual Revision 4.2 10-Oct-2017 CFR0012 34 of 180 © 2017 Dialog Semiconductor...
Page 35: Table 11: Da1458X_Da1468X_Gui_Plt.exe Application Execution
Double click the DA1458x_DA1468x_GUI_PLT.exe application executable. The following initial screen will appear. By clicking the keyboard spacebar, the START button will be pressed and the preconfigured tests and memory actions will start to be executed. User Manual Revision 4.2 10-Oct-2017 CFR0012 35 of 180 © 2017 Dialog Semiconductor...
Page 36: Test Sequence
Table 13: DA1458x Test Sequence Step Device Action Description DA1458x Statistics update Update the total tests executed. DA1458x BD addresses Update the BD addresses for all DUTs. User Manual Revision 4.2 10-Oct-2017 CFR0012 36 of 180 © 2017 Dialog Semiconductor...
Page 37 Perform the GPIO/LED test, if the test is active. DA14582 Audio test Perform the audio test, only for DA145482 and DA14585/6 only devices and only if the particular test is enabled. User Manual Revision 4.2 10-Oct-2017 CFR0012 37 of 180 © 2017 Dialog Semiconductor...
Page 38 PLT expects to find devices in the air with the BD addresses programmed by the same tool, so it can match the BD addresses returned by the GU. User Manual Revision 4.2 10-Oct-2017 CFR0012 38 of 180 © 2017 Dialog Semiconductor...
Page 39: Figure 22: Da1458X Test Sequence
EEPROM Test Firmware Empty Memory Test Write Test Image Address Address Header Version Memory Scan Test Memory Programming Single Test Multiple Tests Figure 22: DA1458x Test Sequence User Manual Revision 4.2 10-Oct-2017 CFR0012 39 of 180 © 2017 Dialog Semiconductor...
Page 40: Da1468X Test Sequence
DA14681-00 IC, then the ADC gain calibration procedure takes place using an external voltage meter instrument. DA1468x XTAL trim Perform the XTAL trim procedure, if this is active. User Manual Revision 4.2 10-Oct-2017 CFR0012 40 of 180 © 2017 Dialog Semiconductor...
Page 41 DA1468x- QSPI ADC gain calibration If enabled, the ADC gain calibration value calculated 00 only write during the calibration procedure will be burned into the QSPI flash. User Manual Revision 4.2 10-Oct-2017 CFR0012 41 of 180 © 2017 Dialog Semiconductor...
Page 42 The PLT expects to find devices in the air with the BD addresses programmed by the same tool, so it can match the BD addresses returned by the GU. User Manual Revision 4.2 10-Oct-2017 CFR0012 42 of 180 © 2017 Dialog Semiconductor...
Page 43: Figure 23: Da1468X Test Sequence
Read OTP Write OTP Scan Test Memory Image BD Address BD Address XTAL Trim Calibration Header Memory Programming Single Test Multiple Tests Figure 23: DA1468x Test Sequence User Manual Revision 4.2 10-Oct-2017 CFR0012 43 of 180 © 2017 Dialog Semiconductor...
Page 44: 6.10 Vbat/Reset Signals Operation
Since the DUTs will be powered through the PLT HW, using the VBAT line, then the Current Measurement Test for the DA14580/1/2/3/5/6 and the Current Measurement Test for the DA14681/2/3 are supported using an external multi meter as described in Current Measurements. User Manual Revision 4.2 10-Oct-2017 CFR0012 44 of 180 © 2017 Dialog Semiconductor...
Page 45: Vbat On With Reset
Each DUT can be reset independently using the VBAT lines. This mode has advantage over VBAT On with Reset since VBAT lines can independently be controlled as opposed to the PLT Reset line. User Manual Revision 4.2 10-Oct-2017 CFR0012 45 of 180 © 2017 Dialog Semiconductor...
Page 46: 6.11 Custom Memory Data
The PLT supports the hashing and programming of homekit setup codes. This feature is only supported for the DA14681/2/3 DUTs and can be enabled in the Custom Memory Data test using the User Manual Revision 4.2 10-Oct-2017 CFR0012 46 of 180 © 2017 Dialog Semiconductor...
Page 47: Table 16: Homekit Setup Code Format
+= characters[index]; else sum += characters[index] * 3; sum = sum % 36; if (sum != 0) sum = 36 - sum; check = checkCharList[sum]; return check; User Manual Revision 4.2 10-Oct-2017 CFR0012 47 of 180 © 2017 Dialog Semiconductor...
Page 48: Custom Data Csv File Format
Memory type (DA14580/1/2/3/5/6 can have OTP, SPI, EEPROM and DA14681/2/3 can have OTP and QSPI), ● Start address ● Size of data in bytes ● Data to be written. User Manual Revision 4.2 10-Oct-2017 CFR0012 48 of 180 © 2017 Dialog Semiconductor...
Page 49: 6.12 Golden Unit Scan Test
Scan retries set by the user. The PLT will reset the Golden Unit after a specific number or retries, given in DUT reboot option. Finally, the parameters DUT reboot time and User Manual Revision 4.2 10-Oct-2017 49 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 50: 6.13 Creating Firmware Files Under "Binaries" Folder
30. In order to create these firmware, the default SDK packages can be used, downloaded from the customer portal, and then apply to them the source code patches located under the fw_files folder in the PLT software package, shown in Figure User Manual Revision 4.2 10-Oct-2017 50 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 51: Figure 30: Binaries
2. Copy all the contents from the “…\fw_files\GU\DA1458x_SDK_5.0.4\DA1458x_SDK\5.0.4\” folder to the default SDK. 3. The Keil v5 project file of the prod_test_GU.bin is the “prod_test.uvprojx” under the folder “\5.0.4\projects\target_apps\prod_test\prod_test\Keil_5\”. User Manual Revision 4.2 10-Oct-2017 51 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 52 3. The Keil v5 project file of the prod_test_582.bin is the “prod_test.uvprojx” under the folder “\5.0.4\projects\target_apps\prod_test\prod_test\Keil_5\”. In “Select Target” option select the “prod_test_580”, “clean” and “build” the project. User Manual Revision 4.2 10-Oct-2017 52 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 53 “QSPI_Release” option for each chip. Each binary will be created under the project folder in a folder having the same name as the selected option. User Manual Revision 4.2 10-Oct-2017 53 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 54 Note: The pxp_reporter source code generates a .bin file. In order to write it to the QSPI Flash memory and boot from it, a .cached version of the binary must be created using the “bin2image.exe”. See for more details. User Manual Revision 4.2 10-Oct-2017 54 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 55: Applications
Warning message will be displayed and if OK is pressed the Hardware Setup tab will be loaded with the DUT 1 checkbox in red and the displayed value will be the default value taken from the XML schema document (params.xsd). User Manual Revision 4.2 10-Oct-2017 55 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 56: Xml And Xsd Files
XML parser, editor and parameter validator. It has an easy-to-use API for reading and manipulating the params.xml file. File params.xsd is the XML schema used for parameter validation. User Manual Revision 4.2 10-Oct-2017 56 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 57: Table 20: Xml File Parts
An example part of the XSD file is given in Figure User Manual Revision 4.2 10-Oct-2017 57 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 58: Hardware Setup
.."/> will be loaded by the cfg_dll.dll API and used in the CFG PLT tooltips as shown in the bottom part of Figure 7.2.2 Hardware Setup This section describes the Hardware Setup settings available for the PLT hardware board, as shown Figure User Manual Revision 4.2 10-Oct-2017 58 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 59: Station Identification
Device IC. Table 22: Device IC Option Description Device IC The Dialog BLE chipset used in the device under test. 7.2.2.3 Active DUTs Figure 37: Active DUTs Enables or disables the testing for each DUT.
Page 60: Dut Com Ports
Refreshes the Dropdown menu with all the available system COM ports. Dropdown Menu Manually select the Golden Unit COM port from all of the available system COM ports. User Manual Revision 4.2 10-Oct-2017 60 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 61: Vbat/Reset Mode
BD Address Assignment. Shows how many DUTs are still to be tested. This option is available only when Range Left mode is enabled in the BD Address Assignment. User Manual Revision 4.2 10-Oct-2017 61 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 62: Test Options
If this option is enabled the VBAT line will be toggled. If not selected, the DUTs will keep in RAM the last test firmware downloaded by the PLT. User Manual Revision 4.2 10-Oct-2017 62 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 63: Bd Addresses
Note: In CFG PLT only the Start BD address is given. The assignment of the actual device BD addresses occurs in the GUI PLT at the beginning of each test run. Note: The only invalid BD address is 00:00:00:00:00:00. User Manual Revision 4.2 10-Oct-2017 63 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 64: Figure 44: Example For Load From File Mode
BD address file used in this example. The PLT will search for the Next BD address in the file and load it to the first active DUT: DUT3. It will User Manual Revision 4.2 10-Oct-2017 64 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 65: Uart (Da1458X)
TX-RX pins of the UART Boot Pins Setup DA1458x options. The TX-RX pins selection defines the UART pins and the baud rate that will be used for firmware downloading to the DA1458x during booting. User Manual Revision 4.2 10-Oct-2017 65 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 66: Uart Baud Rate
Figure 47: UART Programming GPIOs Setup - DA1458x Table 35 shows the available options for the UART Programming GPIOs to be used during memory programming for the DA1458x devices. User Manual Revision 4.2 10-Oct-2017 66 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 67: Test Settings (Da1458X)
When this option is selected, the XTAL trim value calculated from the automated calibration process will be written into the OTP XTAL trim header field and the OTP XTAL calibration flag will be set. User Manual Revision 4.2 10-Oct-2017 67 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 68: Rf Tests
In the BLE Tester panels a number of tests can be enabled that require an external BLE tester instrument. More detailed information about the BLE tester can be found in [1]. User Manual Revision 4.2 10-Oct-2017 68 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 69: Figure 50: Ble Tester General Settings - Da1458X
Interface The interface of the instrument to be used by the driver. BLE Tester - TX Power Figure 51: BLE Tester TX Power - DA1458x User Manual Revision 4.2 10-Oct-2017 69 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 70: Figure 52: Ble Tester Frequency Offset - Da1458X
The name assigned to each test. If this field is non-empty, then the assigned name will be shown on the tab and next to it an indication showing whether the specific test Is enabled or not. User Manual Revision 4.2 10-Oct-2017 70 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 71: Figure 53: Ble Tester Modulation Index - Da1458X
Is enabled or not. Frequency The BLE channel frequency used in the BLE TX modulation index offset test. User Manual Revision 4.2 10-Oct-2017 71 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 72: Figure 54: Ble Tester Rx Sensitivity - Da1458X
The BLE channel frequency used in the BLE RX sensitivity test. Pattern The bit pattern of the TX data. Available options are: ● PRBS9 ● 10101010 ● 11110000 User Manual Revision 4.2 10-Oct-2017 72 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 73: Figure 55: Path Losses Per Dut - Da1458X
Set the calibrated path loss value for each DUT. These will be added as corrections to the limits of the TX Power and RF RX RSSI tests. User Manual Revision 4.2 10-Oct-2017 73 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 74: Current Measurement Test
Select the Ammeter instrument DLL name. Names are shown only if an ammeter instrument DLL exists in the project ammeter_instr_plugins folder. Interface The interface of the instrument to be used by the driver. User Manual Revision 4.2 10-Oct-2017 74 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 75: Gpio/Led Test
GPIO/LED Tests can have multiple instances with different settings. Tests can be added or removed using the two buttons (e.g. Figure 57) at the bottom right side of each panel. User Manual Revision 4.2 10-Oct-2017 75 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 76: Audio Test
Table 47: Audio Test Option Description Enable This option enables the Audio testing. Power level The threshold limit of the power level calculated for the 4 kHz tone. User Manual Revision 4.2 10-Oct-2017 76 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 77: Sensor Test
Enables the sensor interrupt signal test via GPIO. Interrupt GPIO Select the GPIO to be used as a sensor interrupt. Expected data The received sensor byte that will be expected on a successful operation. User Manual Revision 4.2 10-Oct-2017 77 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 78: Custom Test
DA1458x Temperature Measurement Test. Table 50: Temperature Measurement Test - DA1458x Option Description Enable This option enables the temperature measurement test. User Manual Revision 4.2 10-Oct-2017 78 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 79: Scan Test
By enabling this option a new image will be downloaded to all active DUTs before scanning for BLE advertising devices. Firmware path The path of the binary file to download to the devices for the scan test. User Manual Revision 4.2 10-Oct-2017 79 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 80: Memory Functions (Da1458X)
‘X’ denotes the DUT number. For example, if the user has activated DUTs 1, 5 and 10 then img_01.img, img_05.img and img_10.img binary files should exist in the selected OTP image path as shown in Figure User Manual Revision 4.2 10-Oct-2017 80 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 81: Spi Flash Memory
For the DA14583 and DA1586 this option will be disabled and their default pin configuration as described in Appendix I Appendix J will be used. User Manual Revision 4.2 10-Oct-2017 81 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 82: Table 54: Spi Flash Erase - Da1458X
Start address The user can configure the SPI Flash start address where the image will be written. If Bootable image is selected, this option will be disabled. User Manual Revision 4.2 10-Oct-2017 82 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 83: I2C Eeprom Memory
I2C EEPROM Image Write operation. Table 57: I2C EEPROM Image Write - DA1458x Option Description Write enable This will enable the specific I2C/EEPROM image programming test. User Manual Revision 4.2 10-Oct-2017 83 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 84: Memory Read
The name assigned to each test. If this field is non-empty, then the assigned name will be shown on the tab and next to it an indication showing whether the specific test Is enabled or not. User Manual Revision 4.2 10-Oct-2017 84 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 85: Memory Header (Da1458X)
Table 59 describes the available options for DA1458x OTP Header programming. Table 59: OTP Header - DA1458x Option Description Write This option enables the OTP header programming. User Manual Revision 4.2 10-Oct-2017 85 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 86 The size (in words) for the DMA controller to copy from OTP to system RAM during boot. Should match the OTP image size. Max value for the DA14580-1-2-3 devices is 0x1FC0. Max value for the DA14585-6 devices is 0x3E00. User Manual Revision 4.2 10-Oct-2017 86 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 87: Bd Address
If the Read option is enabled, a comparison will be performed between the read BD Compare address and the BD address entered in the DUT by the PLT, as described in the BD address DUT assignment method. User Manual Revision 4.2 10-Oct-2017 87 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 88: Custom Memory Data
Note: For the FLASH and EEPROM memories the pin configurations are taken from SPI Flash Memory I2C EEPROM Memory sections. These options must be enabled in order for the Memory Read test to operate successfully. User Manual Revision 4.2 10-Oct-2017 88 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 89: Uart (Da1468X)
All following UART communications with the DUT will be performed using the new baud rate. Please note that this is happening only during memory programming where uartboot.bin User Manual Revision 4.2 10-Oct-2017 89 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 90: Test Settings (Da1468X)
Note: When adding or removing a test all settings are refreshed with the values written to the XML file, meaning that any unsaved settings will be lost. User Manual Revision 4.2 10-Oct-2017 90 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 91: Figure 74: Golden Unit Rf Tests - Da1468X
RSSI of the device after it has received the packets transmitted from the Golden Unit is less than this value, the test will be considered as failed. User Manual Revision 4.2 10-Oct-2017 91 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 92: Figure 75: Ble Tester General Settings - Da1468X
Selects the BLE tester DLL. Names are shown only if a BLE tester instrument DLL exists in the project folder ble_tester_instr_plugins. Interface The interface of the instrument to be used by the driver. User Manual Revision 4.2 10-Oct-2017 92 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 93: Figure 76: Ble Tester Tx Power - Da1468X
Set the average low power limit for the BLE TX output power pass/fail test criteria. Peak average Set the peak-to-average power limit for the BLE TX output power pass/fail test criteria. User Manual Revision 4.2 10-Oct-2017 93 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 94: Figure 77: Ble Tester Frequency Offset - Da1468X
Set the overall packet drift in kHz for the TX drift pass/fail test criteria. Set the drift rate limit in kHz/50 s for the TX drift pass/fail test criteria. Drift rate limit User Manual Revision 4.2 10-Oct-2017 94 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 95: Figure 78: Ble Tester Modulation Index - Da1468X
Set the F2 maximum limit in kHz for the TX modulation index pass/fail test criteria. F1/F2 ratio Set the F1/F2 maximum average ratio limit for the TX modulation index pass/fail test criteria. User Manual Revision 4.2 10-Oct-2017 95 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 96: Figure 79: Ble Tester Rx Sensitivity - Da1468X
The RSSI limit for pass/fail criteria in the RF RX sensitivity test. If the average RSSI of the device after it has received the transmitted packets is less than this value, the test will be considered as failed. User Manual Revision 4.2 10-Oct-2017 96 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 97: Current Measurement Test
Set the path loss value for each DUT. These will be added as corrections to the limits of the TX Power and RF RX RSSI tests 7.2.10.3 Current Measurement Test Figure 81: Current Measurement Tests - DA1468x User Manual Revision 4.2 10-Oct-2017 97 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 98: Table 72: Current Measurement Tests - Da1458X
An SCPI command to be passed to the ammeter instrument just before the measurement is taken. Supports multiple commands separated with a column. Up to 256 characters are supported. User Manual Revision 4.2 10-Oct-2017 98 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 99: Gpio/Led Test
High Sets the amount of the ON time of the pulse in ms for the specific test. GPIO power level Sets the power level of the GPIOs. User Manual Revision 4.2 10-Oct-2017 99 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 100: Sensor Test
Enables the sensor interrupt signal test via GPIO. Interrupt GPIO Select the GPIO to be used as a sensor interrupt. GPIO power level Sets the power level of the GPIOs. User Manual Revision 4.2 10-Oct-2017 100 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 101: Adc Calibration (Da14681-00 Ad Only)
Write to OTP Enable the writing of the ADC calibration value to OTP. Write to OTP - Verify Verify the writing of the ADC calibration value to OTP. User Manual Revision 4.2 10-Oct-2017 101 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 102: Custom Test
This option enables the Temperature measurement test. Instrument Select the Temperature measurement DLL. Names are shown only if a Temperature measurement instrument DLL exists in the project folder temp_meas_instr_plugins. User Manual Revision 4.2 10-Oct-2017 102 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 103: Scan Test
DUT reboot time The time the VBAT will remain low during the device reboot.
This value is time in ms*100. (e.g. 15 is 1500ms). User Manual Revision 4.2 10-Oct-2017 103 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 104: Memory Functions (Da1468X)
‘X’ denotes the DUT number. For example, if the user has activated DUTs 1, 5 and 10 then img_01.img, img_05.img and img_10.img binary files should exist in the selected OTP image path, as shown in Figure User Manual Revision 4.2 10-Oct-2017 104 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 105: Qspi Flash Memory
QSPI Flash Image Write operation. Table 82: QSPI Flash Image Write - DA1468x Option Description Write enable This will enable the specific QSPI Flash image programming test. User Manual Revision 4.2 10-Oct-2017 105 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 106: Memory Read
The type of memory to read the data from. Available options are: OTP and QSPI FLASH. 7.2.12 Memory Header (DA1468x) This section describes the Memory Header programming settings (OTP and QSPI), available when using DA1468x devices. User Manual Revision 4.2 10-Oct-2017 106 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 107: Otp Header
Each value written in the OTP header can be read back and compared with the original ones to verify a successful write. Non-volatile memory Enable OTP NVM mode. Available options are: ● FLASH ● User Manual Revision 4.2 10-Oct-2017 107 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 108: Otp Header - Bd Address
DA1468x BD Address programming. Table 85: OTP Header BD Address - DA1468x Option Description Write Enable burning the BD address into the device OTP header. User Manual Revision 4.2 10-Oct-2017 108 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 109: Otp Header - Xtal Trim
Crystal oscillator calibration value common to all devices. Can be burned only if the automatic crystal burn calibration operation for the OTP memory in XTAL Trim disabled. User Manual Revision 4.2 10-Oct-2017 109 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 110: Qspi Header - Bd Address
Crystal oscillator calibration value common to all devices. Can be burned only if the automatic crystal burn calibration operation for the QSPI memory in XTAL Trim disabled. User Manual Revision 4.2 10-Oct-2017 110 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 111: Custom Memory Data
CSV file format. Edit data Hexadecimal data input of up to 256 bytes to burn. These data will (Manual data) be burned to all active DUTs. User Manual Revision 4.2 10-Oct-2017 111 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 112: Debug Settings
If enabled the input memory data from the barcode scanner will be applied as input to generator (available the Dialog Homekit setup code binary generator. PLT will automatically call the setup with Barcode scanner code binary generator and burn the files created.
Page 113: Security
The GUI PLT (DA1458x_DA1468x_GUI_PLT.exe) is a Graphical User Interface application that performs the device validation and programming process. At the same time it allows the users to User Manual Revision 4.2 10-Oct-2017 113 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 114: Figure 99: Gui Plt Main Screen
Contains a list with all the available CSV files to open. File > Exit Exits the GUI PLT application. Edit options Edit > Settings Opens the GUI PLT Settings window. User Manual Revision 4.2 10-Oct-2017 114 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 115 START button initiates the production procedure. Bottom of the main screen Left panel: Shows the full path of the XML file that is currently used. User Manual Revision 4.2 10-Oct-2017 115 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 116: Gui Plt Settings
This option will hide the BLE Tester column in the GU panel of the GUI PLT. Temp This option will hide the Temp column in the GU panel of the GUI PLT. User Manual Revision 4.2 10-Oct-2017 116 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 117: Barcode Scanner Mode
If the START button is pressed without any BD address being assigned to the device, the PLT will not run the tests. User Manual Revision 4.2 10-Oct-2017 117 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 118: Figure 101: Barcode Scan Option In Gui Plt
Note: If the Barcode Scan button is pressed again, all BD addresses will be reset and the BD address assignment procedure will begin again. Figure 103: Barcode Scan - BD Address Assignment User Manual Revision 4.2 10-Oct-2017 118 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 119: Homekit Setup Code Scan Example
Go to Hardware Setup-> Active DUTs and select DUT13, DUT14, DUT15 and DUT16. Press the Save* button. Go to Hardware Setup-> Golden Unit COM Port and auto-detect the COM port. Press the Auto button. Press the Save* button. User Manual Revision 4.2 10-Oct-2017 119 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 120 These settings will enable the XTAL trim calibration test. The result of the XTAL trim calibration will be saved into QSPI flash. Dialog SDK firmware is able to read the value from this specific QSPI address (0x8F000) and apply it to the appropriate chipset XTAL trim register.
Page 121 Change the Scanner Interface COM port according to the COM port assigned to the barcode scanner in step 9. Press the Save* button. Close DA1458x_DA1468x_CFG_PLT.exe and open DA1458x_DA1468x_GUI_PLT.exe. The initial DA1458x_DA1468x_GUI_PLT.exe screen will appear. User Manual Revision 4.2 10-Oct-2017 121 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 122 If everything went well just press the END button. The tool will return to its initial screen as shown in step User Manual Revision 4.2 10-Oct-2017 122 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 123 The binaries will reside inside DA1458x_DA1468x_PLT_v_4.x.x.x\executables\binaries. If everything finished with no error the following screen will be shown. Press the FINISHED button to return to the main screen. User Manual Revision 4.2 10-Oct-2017 123 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 124: Running The Gui Plt And Executing Tests
DUT Log File to get more details about the parameters used, calculated values and the reason of failure in the case of an error. User Manual Revision 4.2 10-Oct-2017 124 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 125: Figure 105: Gui Plt During Testing (2 Of 2)
(including the BD addresses) remain the same and only the tests that failed are retested. At this time the CSV File and all the DUT Log Files will be updated. Figure 106: GUI PLT Tests Finished User Manual Revision 4.2 10-Oct-2017 125 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 126: Debug Console
Debug Console. Depending on the type of the message a different color is used: DEBUG messages are light blue, INFO messages are white and ERROR messages are red. Figure 108: Debug Console User Manual Revision 4.2 10-Oct-2017 126 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 127: Dut Log File
DUT and a timestamp of the event. After the tests finish the header is updated with the end time of the test and the firmware versions, which were retrieved during testing. User Manual Revision 4.2 10-Oct-2017 127 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 128: Csv File
DUT information. The CSV file keeps information about all the production tests of a single day. A new CSV file will be created every day. User Manual Revision 4.2 10-Oct-2017 128 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 129: Cli Plt Application
● Example: “t 580”. ● ● ● ● Initializes the PLT with the parameters found in the params.xml file. Path to XML configuration file. Example: “i params\params.xml”. User Manual Revision 4.2 10-Oct-2017 129 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 130 Number of tests to This command is used only for PLT evaluation. It starts multiple tests. run. These are executed one after the other without user intervention. User Manual Revision 4.2 10-Oct-2017 130 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 131: Running The Cli And Executing Tests
To Reset the XML parameters in the configuration file to their defaults use the ‘z’ command. Example: >z ● To reload the configuration file or to load another one use the ‘i’ command. User Manual Revision 4.2 10-Oct-2017 131 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 132: Figure 113: Cli Plt Dut Com Port Enumeration ('P' Command)
The following example will read the BD address from the QSPI memory header and compare it with the one currently assigned to the DUTs. Example: >v qspi User Manual Revision 4.2 10-Oct-2017 132 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 133: Figure 114: Cli Plt Read And Compare Bd Address In Qspi ('V' Command)
DUTs to use, with DUT 1 being the LSB. In the following example the PLT hardware will be reset and DUTs 1, 2, 15 and 16 will be used. Example: >m 1C003 User Manual Revision 4.2 10-Oct-2017 133 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 134: Using Cli Commands As Arguments
5. '-v qspi': Read only the BD address written in the QSPI header and compare it with the one assigned to the DUT1. These are the same. User Manual Revision 4.2 10-Oct-2017 134 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 135: Example Usage
PLT hardware and the Reset signal will not be used, use the VBAT only option. General Statistics Press the Reset Button and then Save. User Manual Revision 4.2 10-Oct-2017 135 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 136 Only one test is enabled for Golden Unit this example. In Golden Unit: ● Check Enable ● Select 2424 MHz as frequency ● Set the RSSI limit to -70 User Manual Revision 4.2 10-Oct-2017 136 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 137 Check Verify image Check Bootable image Make sure prox_reporter_580.bin is selected. OTP Header General Disable all options BD address Disable all options GUI PLT Open GUI PLT. User Manual Revision 4.2 10-Oct-2017 137 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 138 The firmware download (prod_test_580.bin) begins. From the log file the test lasted for about 4.3 s, which can be verified from the logic analyzer capture. PLT begins the operation to get the version of the prod_test_580.bin firmware. User Manual Revision 4.2 10-Oct-2017 138 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 139 The blocks of data after the SPI check empty and before the SPI image write are SPI traffic on P0_5 which is the UART RX and the SPI MISO pin at the same time. User Manual Revision 4.2 10-Oct-2017 139 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 140 15 s. This is verified from both the log files and the CSV file. Both files are shown below. User Manual Revision 4.2 10-Oct-2017 140 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 141 UM-B-041 DA1458x/DA1468x Production Line Tool Step Description cont. User Manual Revision 4.2 10-Oct-2017 141 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 142: Appendix A Top-View Of Plt Pcb Version D
UM-B-041 DA1458x/DA1468x Production Line Tool Appendix A Top-view of PLT PCB Version D Figure 118: Top-view of PLT PCB Version D User Manual Revision 4.2 10-Oct-2017 142 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 143: Appendix B Electrical Schematics
UM-B-041 DA1458x/DA1468x Production Line Tool Appendix B Electrical Schematics Figure 119: VBAT and VPP Control from CPLD Figure 120: CPLD DUT UART Connections User Manual Revision 4.2 10-Oct-2017 143 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 144: Figure 121: Cpld Ftdi And Gu Control Connections
UM-B-041 DA1458x/DA1468x Production Line Tool Figure 121: CPLD FTDI and GU Control Connections Figure 122: FTDI Chip for USB UART to DUTs 1, 2, 3 and 4 User Manual Revision 4.2 10-Oct-2017 144 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 145: Figure 123: Quad Usb Hub
USB HUB: provides 5 V input for the 3.3 V LDO and USB input-signals to the four Quad FTDI chips. Figure 123: Quad USB HUB Figure 124: Golden Unit - Dedicated USB Port and FTDI Chip User Manual Revision 4.2 10-Oct-2017 145 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 146: Figure 125: Golden Unit - Gu Led And Spi Flash Memory
The Golden Unit SW (prod_test_GU.bin) is located in the SPI Flash memory mounted on the PLT hardware and is loaded into the GU’s system RAM when powered on. Figure 126: VBAT_DUT and VDDIO Supplies Figure 127: GU Supply and VPP Generation User Manual Revision 4.2 10-Oct-2017 146 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 147: Appendix C Hardware Modifications Plt Version D
J47 were added in series to the GU reset circuit. Figure 128: DA14580_RD_tester Version D Figure 129: Jumper J47 Added Next to Golden Unit Socket Figure 130: R365 (10 k) Added Next to Reset Button User Manual Revision 4.2 10-Oct-2017 147 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 148: Figure 131: R365, J47 And Reset Shown In Electrical Schematic
UM-B-041 DA1458x/DA1468x Production Line Tool Figure 131: R365, J47 and RESET Shown in Electrical Schematic User Manual Revision 4.2 10-Oct-2017 148 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 149: Appendix D Suggestions About Hardware And Cabling
The control lines from the PLT to the DUTs must be kept as short as possible. ● A vertical GU antenna has different characteristics from a horizontal one. See Figure 132. User Manual Revision 4.2 10-Oct-2017 149 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 150: Figure 133: Possible Solution Of Antenna On Cable And Duts Put In Line
DUT moved 20 cm to the right relative to the GU. DUT moved 30 cm to the right relative to the GU. normal DUT and GU boards are inline, functioning normally. User Manual Revision 4.2 10-Oct-2017 150 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 151 16 MHz crystal oscillator not working well. Received packets ~ 0. Golden Unit output power = 0 dBm For more details on the RF setup refer to [12]. User Manual Revision 4.2 10-Oct-2017 151 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 152: Appendix E Hex2Bin
4. The binary file (blinky_1.bin) will be produced in the same directory. Figure 135 shows the directory and the files used in this example. Figure 135: Hex2Bin Example Directory with Files User Manual Revision 4.2 10-Oct-2017 152 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 153: Figure 136: Hex2Bin.exe Example
UM-B-041 DA1458x/DA1468x Production Line Tool Figure 136: Hex2Bin.exe Example User Manual Revision 4.2 10-Oct-2017 153 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 154: Appendix F Bin2Image
The file bin2image.exe must be put in the same directory as the file to be converted. Figure 137 shows the directory and the files used in this example. Figure 137: Bin2Image Example Directory with Files Figure 138: Bin2Image Example User Manual Revision 4.2 10-Oct-2017 154 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 155: Appendix G Automatic Gu Com Port Find
Select 'Devices > Scan and Parse. A single 'FT232' device should be found. Select 'USB String Descriptors'. Uncheck the 'Auto Generate Serial No:'. Edit ‘Serial Number’ to "DialogSemi" as shown below. User Manual Revision 4.2 10-Oct-2017 155 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 156 Press ‘Close’. Unplug and reconnect the GU USB cable to the PC. Verify the Serial Number change by running FT_Prog.exe again and reading the Serial Number value. User Manual Revision 4.2 10-Oct-2017 156 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 157: Appendix H Improving Cabling Between Plt And Duts
‘Twisted Pair’ cables VBAT Pulse not used not used not used DUT TX DUT RX (pinning 100 mil) UART RX UART TX Figure 140: Location of Pull-Down Resistors User Manual Revision 4.2 10-Oct-2017 157 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 158: Figure 141: Anti-Ringing Solution
‘Twisted Pair’ cables VBAT Pulse not used not used not used DUT TX DUT RX (pinning 100 mil) UART RX UART TX 2 * 100R Figure 141: Anti-Ringing Solution User Manual Revision 4.2 10-Oct-2017 158 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 159: Appendix I Settings For Da14583 Internal Spi Flash Memory
Table 99: DA14583 Internal SPI Flash Connections DA14583 Pin SPI Function Description P2_0 SPI_CLK SPI Clock P2_9 SPI_DI MOSI P2_4 SPI_DO MISO P2_3 SPI_EN SPI Chip Select User Manual Revision 4.2 10-Oct-2017 159 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 160: Appendix J Settings For Da14586 Internal Spi Flash Memory
Table 100: DA14586 Internal SPI Flash Connections DA14586 Pin SPI Function Description P2_0 SPI_CLK SPI Clock P2_9 SPI_DI MOSI P2_4 SPI_DO MISO P2_3 SPI_EN SPI Chip Select User Manual Revision 4.2 10-Oct-2017 160 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 161: Appendix K Honeywell Xenon 1900 Barcode Scanner Setup
2. Scan Restore factory defaults at page 198 (Resetting the Factory Defaults) 3. Program the USB to Serial Interface. Scan code at Page 32 (TRMUSB130) 4. Download Xenon USB to Serial drivers HSM USB Serial Driver version 3.5.5.zip User Manual Revision 4.2 10-Oct-2017 161 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 162: Appendix L Program The Golden Unit Spi Flash Memory
10. Remove the JTAG from the Rd tester board and then manually reset the Golden Unit using the reset button next to it. The Golden Unit has now booted with the new firmware. User Manual Revision 4.2 10-Oct-2017 162 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 163: Appendix M Connecting A Speaker To The Golden Unit For Audio Test
Test. A speaker can be connected to the Golden Unit using GPIOs P1_0 (AL4) and P1_1 (AL5) as shown in Figure 144 to generate the 4 kHz tone. Figure 144: Speaker Connection for Audio Test. User Manual Revision 4.2 10-Oct-2017 163 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 164: Appendix N Ftdi Driver Removal And Installation
3. Check in the Windows Device manager that now the driver version of the 17 PLT COM Ports- >USB Serial Ports (COMx) is the latest. FTDI driver versions v2.12.24, v2.12.26 and 2.12.28 have been tested. User Manual Revision 4.2 10-Oct-2017 164 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 165: Appendix O Da1458X Dk Pro Motherboard Connection
PCB print (left of J5). A triple jumper must be used to connect the P0_5 (J5 – pin13) with the SPI MISO (J6 – pin2) and the PLT UART-Rx pin (on DUT connector – pin9). Figure 145: DA14580/5 Pro Motherboard DK Wiring. User Manual Revision 4.2 10-Oct-2017 165 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 166: Appendix P Da1468X Dk Pro Motherboard Connection
DUT connector pin10 <-> Solder to Reset button (K2) (Optional). Note: All jumpers must be removed. Power supply will be provided from the PLT HW (VBAT line). Figure 146: DA14680/1/2/3 Pro Motherboard DK Wiring. User Manual Revision 4.2 10-Oct-2017 166 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 167: Appendix Q Connecting Dut With Battery Supply
In order to program the OTP for the DA14580/1/2/3 DUTs an external VPP voltage must be supplied. VPP lines on the DUT connectors will not provide any voltage in VBAT as Reset mode so they cannot be used. User Manual Revision 4.2 10-Oct-2017 167 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 168: Appendix R Dut Status Codes
DUT_PDLL_HCI_STANDARD_ERROR Production test - COM port DUT_PDLL_COM_PORT_INIT PDLL Device COM port open initialized. DUT_PDLL_COM_PORT_START PDLL Device COM port open started. PDLL Device COM port opened successfully. DUT_PDLL_COM_PORT_OK User Manual Revision 4.2 10-Oct-2017 168 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 169 Read register value DUT_PDLL_XTAL_TRIM_READ_INIT XTAL trim value read initialized. DUT_PDLL_XTAL_TRIM_READ_START XTAL trim value read started. DUT_PDLL_XTAL_TRIM_READ_OK XTAL trim value read success. DUT_PDLL_XTAL_TRIM_READ_FAILED XTAL trim value read failed. User Manual Revision 4.2 10-Oct-2017 169 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 170 RF packet TX failed to end. Production test - GPIO/LED test DUT_PDLL_GPIO_TOGGLE_INIT GPIO-LED test operation initialized. DUT_PDLL_GPIO_TOGGLE_START GPIO-LED test operation start. DUT_PDLL_GPIO_TOGGLE_FINISHED_OK GPIO-LED test operation completed successfully. User Manual Revision 4.2 10-Oct-2017 170 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 171 DUT_PDLL_ADC_CALIB_VBAT_RD_FAILED ADC calibration process. VBAT voltage read failed. DUT_PDLL_ADC_CALIB_DUT_RD_INIT ADC calibration process. Initialize reading device ADC samples. DUT_PDLL_ADC_CALIB_DUT_RD_START ADC calibration process. Start reading device ADC samples. User Manual Revision 4.2 10-Oct-2017 171 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 172 Firmware download DUT_UDLL_FW_DOWNLOAD_INIT UDLL firmware download initialized. DUT_UDLL_FW_DOWNLOAD_STARTED UDLL firmware download started successfully. DUT_UDLL_FW_DOWNLOAD_RETRY UDLL firmware download retry. DUT_UDLL_FW_DOWNLOAD_OK UDLL firmware downloaded successfully. DUT_UDLL_FW_DOWNLOAD_FAILED UDLL firmware download failed. User Manual Revision 4.2 10-Oct-2017 172 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 173 Operation to check whether the OTP field to burn is empty started. DUT_UDLL_OTP_CHECK_EMPTY_OK The OTP field to burn is empty. DUT_UDLL_OTP_CHECK_SAME_DATA_OK The OTP field contains the same data as the ones to User Manual Revision 4.2 10-Oct-2017 173 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 174 QSPI image write operation ended successfully. DUT_UDLL_QSPI_IMG_WR_FAILED QSPI image write operation failed. Memory programming - BD address write to QSPI memory DUT_UDLL_QSPI_BDA_WR_INIT QSPI BD address write operation initialized. User Manual Revision 4.2 10-Oct-2017 174 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 175 Memory programming - memory read operation DUT_UDLL_MEM_RD_INIT Memory read operation initialized. DUT_UDLL_MEM_RD_STARTED Memory read operation started. DUT_UDLL_MEM_RD_OK Memory read operation ended successfully. DUT_UDLL_MEM_RD_FAILED Memory read operation failed. User Manual Revision 4.2 10-Oct-2017 175 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 176: Appendix S Golden Unit Status Codes
Golden Unit PDLL firmware version acquisition FAILED. GU_PDLL_FW_VERSION_VALID The Golden Unit firmware version is valid. GU_PDLL_FW_VERSION_NOT_VALID The Golden Unit firmware version is not valid. An upgrade may be needed. User Manual Revision 4.2 10-Oct-2017 176 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 177 PLT HW tester pulse width success. GU_PDLL_RDTESTER_PULSE_WIDTH_FAILED PLT HW tester pulse width failed. GU_PDLL_RDTESTER_VBAT_CNTRL_INIT PLT HW tester VBAT control initialized. GU_PDLL_RDTESTER_VBAT_CNTRL_START PLT HW tester VBAT control started. User Manual Revision 4.2 10-Oct-2017 177 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 178 Golden Unit BLE advertising scan test GU_PDLL_BLE_SCAN_INIT Golden Unit scan operation initialized. GU_PDLL_BLE_SCAN_START Golden Unit scan operation started. GU_PDLL_BLE_SCAN_OK Golden Unit scan operation completed successfully. GU_PDLL_BLE_SCAN_FAILED Golden Unit scan operation failed. User Manual Revision 4.2 10-Oct-2017 178 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 179: Revision History
Adding text and drawings 22-May-2016 Adding changes for the DA1468x 22-Dec-2016 Updated for DA1458x_DA1468x_PLT_v4.0 software release 06-Oct-2017 Updated for DA1458x_DA1468x_PLT_v4.1 software release 10-Oct-2017 Updated for DA1458x_DA1468x_PLT_v4.2 software release User Manual Revision 4.2 10-Oct-2017 179 of 180 CFR0012 © 2017 Dialog Semiconductor...
Page 180 Dialog Semiconductor excludes all liability in this respect. Customer notes that nothing in this document may be construed as a license for customer to use the Dialog Semiconductor products, software and applications referred to in this document. Such license must be separately sought by customer with Dialog Semiconductor.

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Dialog DA1458 Series User Manual

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