Spring Constant Calibration References - JPK instruments nanowizard afm Handbook

Atomic force microscope
Table of Contents

Advertisement

J.J. Davis, K.S. Coleman, K.L. Busuttil, C.B. Bagshaw, "Spatially resolved Suzuki
coupling reaction initiated and controlled using a catalytic AFM probe" J. Am.
Chem. Soc. 127: 13082-13083 (2005)
J.J. Davis, C.B. Bagshaw, K.L. Busuttil, Y. Hanyu, K.S. Coleman, "Spatially
controlled Suzuki and Heck catalytic molecular coupling", J. Am. Chem. Soc. 128
(43): 14135-14141 (2006)
S.W. Schmidt, M.K. Beyer, H. Clausen-Schaumann, "Dynamic strength of the
silicon-carbon bond observed over three decades of force-loading rates", J. Am.
Chem. Soc., 130 (11): 3664 -3668 (2008)
W.-Y. Lee, H. Lin, L. Gu, K.-C. Leou, C.-H. Tsai, "CVD catalytic growth of single-
walled carbon nanotubes with a selective diameter distribution", Diamond & Related
Materials 17: 66–71 (2008)
R.Y. Kannan, H.J. Salacinski, J. De Groot, I. Clatworthy, L. Bozec, M. Horton, P.E.
Butler, A.M. Seifalian, "The antithrombogenic potential of a polyhedral oligomeric
silsesquioxane (POSS) nanocomposite", Biomacromolecules 7: 215-223 (2006)
T.M. Blättler, A. Binkert, M. Zimmermann, M. Textor, J. Vörös, E. Reimhult, "From
particle
self-assembly
Nanotechnology 19: 075301 (2008)

10.2 Spring constant calibration references

General cantilever calibration
C.A. Clifford, M.P. Seah,
"The determination of atomic force microscope cantilever spring constants via
dimensional methods for nanomechanical analysis"
Nanotechnology 16 (2005) 1666-1680.
J.E. Sader, I. Larson, P. Mulvaney, L.R. White
"Method for the calibration of atomic force microscope cantilevers"
Rev. Sci. Instrum. 66 (1995) 3789-3798
J.E. Sader, J.W.M. Chon, P. Mulvaney
"Calibration of rectangular atomic force microscope cantilevers"
Rev. Sci. Instrum. 70 (1999) 3967-3969.
J.P. Cleveland, S. Manne, D. Bocek, P.K. Hansma
"A nondestructive method for determining the spring constant of cantilevers for
scanning force microscopy"
Rev. Sci. Instrum. 64 (1993) 403-405.
Thermal noise calibration
J.L. Hutter, J. Bechhoefer
"Calibration of atomic-force microscope tips"
Rev. Sci. Instrum. 64 (1993) 1868-1873.
to
functionalized
sub-micron
JPK Instruments
protein
patterns",
®
NanoWizard
Handbook
Electrochemistry
Electrochemistry
Force measurement
Carbon nanotubes
Surface patterning
Spring constant calculation from
Spring constant calculation from
dimensions and frequency
Spring constant calculation from
dimensions, frequency and Q
Spring constant determination from
adding masses
Original paper where thermal noise
analysis is described
Version 2.2a
Biomaterials
dimensions
53

Hide quick links:

Advertisement

Table of Contents
loading

Table of Contents