National Instruments IMAQ Vision for Measurement Studio User Manual page 75

For measurement studio
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© National Instruments Corporation
You can configure the following processing functions to overlay different
types of information on the inspection image:
imaqFindEdge()
imaqFindCircularEdge()
imaqFindConcentricEdge()
imaqClampMax()
imaqClampMin()
imaqFindPattern()
imaqCountObjects()
imaqFindTransformRect()
imaqFindTransformRects()
imaqFindTransformPattern()
You can overlay the following information with all the above functions
except
imaqFindPattern()
The search area input into the function.
The search lines used for edge detection.
The edges detected along the search lines
The result of the function.
With
imaqFindPattern()
Select the information you want to overlay by setting the element that
corresponds to the information type to TRUE in the options input
parameter.
Use
imaqClearOverlay()
from the image. Use
imaqWriteVisionFile()
its overlay information to a file. You can read the information from the
file into an image using
information, overlay information is removed from an image when the
image size or orientation changes.
:
, you can overlay the search area and the result.
to clear any previous overlay information
imaqReadVisionFile()
5-29
IMAQ Vision for LabWindows/CVI User Manual
Chapter 5
Machine Vision
to save an image with
. As with calibration

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