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4.11 Earphone Trouble
TEST POINT
CIRCUIT
JACK_LDO_EN
SPK_SEL
Copyright © 2007 LG Electronics. Inc. All right reserved.
Only for training and service purposes
Figure 20
2V8_VEXT
U302
1
3
VDD
VOUT
4
2
R301
NC
GND1
6
5
CE
GND2
4.7K
C305
R1114D251D
R302
C303
C304
EUSY0299301
1u
0.1u
100K
1u
FB302
EAR_MIC_IN
EAR_MIC
0
2V8_VEXT
C300
33 uF
HEADSET_R
U300
ECTH0004804
R300
0
6
1
S
B1
FM_AUDIO
5
2
VCC
GND
4
3
A
B0
AUXOP
NLAS4157DFT2G
R325
C302
EUSY0263301
1u
NA
U300
SPK_SEL
STATE
L
A-B0
H
A-B1
- 69 -
4. TROUBLE SHOOTING
EAR-MIC
2V6_JACK
C306
15p
2V6_JACK
R305
1K
C307
R306
R307
EAR_MIC
1.5K
100ohm
0.1u
C308
C309
39p
22uF
2012
ECTH0004806
R308
100ohm
C313
C314
C315
47n
27p
39p
2V8_VEXT
U301
AUX_ON
AUXON
2
5
NO1
IN1
10
7
HEADSET_R
NO2
IN2
1
3
VCC
COM1
9
C301
COM2
11
4
1u
PGND
NC1
6
8
GND
NC2
MAX4764ETB
U301
HEADSET_EN
0
1
HEADSET_SPK
CN300
U301
U300
U302
U303
AUXIN
AUXIP
HEADSET_EN
MMI_PIN4
R326
MMI_PIN5
USC4
NA
USC5
USC5
STATE
USC
LGE Internal Use Only
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