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ATTENTION
Static Sensitive
Devices
This instrument was constructed
in
a n E S D (electro-static discharge)
protected environment. This i s because most of the semi-conductor
devices used in this instrument are susceptible to damage
by
static
discharge.
Depending on the magnitude of the charge, device substrates can be
punctured or destroyed
by
contact or mere proximity of a static charge.
The results can cause degradation o f device performance, early failure,
or
immediate destruction.
These charges are generated in numerous ways such as simple contact,
separation of materials, and normal motions of persons working with
static sensitive devices.
W h e n handling or servicing equipment containing static sensitive
devices, adequate precautions
must
be taken to prevent device damage
or destruction.
Only those who are thoroughly familiar with industry accepted
techniques for handling static sensitive devices should attempt to
service circuitry with these devices.
In all instances, measures must be taken to prevent static charge
build-up on work surfaces and persons handling the devices.
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