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B.3.2
Test Pattern Subtab
The Test Pattern subtab for the AFE5832 has the following feature:
•
Selecting preset or custom test patterns to be generated by ADC for LVDS or on certain clock lines
SLOU489 – August 2017
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Figure 52. AFE5832: ADC: Test Pattern
Copyright © 2017, Texas Instruments Incorporated
Overview of the AFE5832 EVM GUI Features
ADC Tab
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