Testing The Evm In Digital Time Gain Compensation (Dtgc) Mode - Texas Instruments AFE5832 User Manual

32-channel analog front-end evaluation module
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Testing the EVM in Digital Time Gain Compensation (DTGC) Mode

Use the following steps to test the EVM in DTGC mode:
a. Input a 5-MHz, –20-dBm signal to any SMA input on the AFE EVM. Connect a 5-MHz filter to the input
signal. Connect a single SMA-SMA cable from J11 (TSW EVM) to J37 (AFE EVM).
b. Change the jumper configurations as outlined in
LMK input clock to J56 or clock at 4× the desired ADC sample rate.
c. Set the switches of the AFE5832 EVM at S5 for 'Up-Down Ramp Mode' as
D6-D8 should be lit and LED D5 should be off.
d. Choose AFE5832.ini as firmware on HSDC Pro.
e. Change the DTGC Mode on the AFE5832 EVM GUI to 'Up-Down Ramp Mode' and configure the other
formats as shown in
f. In HSDC Pro, navigate to the Trigger Option menu. Choose "Trigger mode enable" and "Arm on next
capture button press" as shown in
SLOU489 – August 2017
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Figure 15. DTGC Mode Test: AFE5832 EVM Switches (S5)
Figure
16:
Figure 16. DTGC Mode Test: Change GUI Configuration
Figure
AFE5832 32-Channel Analog Front-End Evaluation Module (EVM Rev. A)
Copyright © 2017, Texas Instruments Incorporated
Testing the EVM in Digital Time Gain Compensation (DTGC) Mode
Section C.1.3
and apply a 160-MHz, 10-dBm external
17.
Figure 15
illustrates. LEDs
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