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4. TROUBLE SHOOTING
TEST POINT
Figure 4.15
CIRCUIT
TP1
X100
FC-135
32.768KHz
TP2
LGE Internal Use Only
LGE Internal Use Only
TP1
TP2
JTAGEN
C140
22p
HPMIC_DET_3.5
R109
10M
C147
VBAT
CHG_ABB
22p
BATT TEMP
1u
C141
1u
C142
R110
68K
(1%)
Copyright © 2008 LG Electronics. Inc. All right reserved.
Only for training and service purposes
- 98 -
Copyright © 2009 LG Electronics. Inc. All right reserved.
Y1
JTAGEN
F2
TESTMODE
B18
TEMP1
A18
TEMP2
D16
AUXADC1
B17
AUXADC2
A21
REF
C17
REFOUT
A7
OSCIN
A8
OSCOUT
A15
VCHG
C15
GATEDRIVE
B16
ISENSE
A17
VBATSENSE
D19
REFCHG
B15
VATTYPE
Only for training and service purposes
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