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4. TROUBLE SHOOTING
4.9 Speaker Trouble
TEST POINT
U205
TP2_FB205
CIRCUIT
AMP_SUBSYSTEM
U206
U206
C253
220n
C2
IN1-
EPN
C252
220n
C1
IN1+
EPP
U206
C254
1u
D2
IN2-
HSR
C255
1u
D1
IN2+
HSL
C267
220n
D3
IN3-
C268
220n
C3
IN3+
I2C_SCL
I2C_SDA
LGE Internal Use Only
TP6_C261
VBAT
C251
C250
DNI
0.1u
TP1
FB204
120
TP2
FB205
120
C263
C5
OUT+
D5
1.5n
OUT-
TP5
A2
HPL
A1
HPR
TP6
TP5
C261
B5
0.1u
CPVDD
A3
CPVSS
A4
CP
R270
A5
CN
C259
2.2u
20
C260
C269
TP6
2.2u
2.2u
1V8_VDD
C270
2.2u
C257
C271
2.2u
0.1u
2. TROUBLE SHOOTING
Figure 4.11.1
RCV_SPK_P
RCV_SPK_N
C264
TP1
USB_DM
1.5n
USB_DP
UART_RX
HP_LOUT
TP2
UART_TX
HP_ROUT
TP4
C262
HP_LOUT
0.1u
HP_ROUT
TP
C274
C273
R271
DNI
DNI
20
I2C_SCL
I2C_SDA
TP4
MUIC_INT
TP3
- 90 -
Copyright © 2010 LG Electronics. Inc. All right reserved.
TP3_R263
TP4_R262
TP5_C262
U206
TP1_FB204
VBAT
1V8_VDD
C244
U205
0.1u
(10V)
R226
R209
2.2K
DNI
U205
D2
BAT
R220
1
A4
DN1
R233
1
A5
DP2
R264
1
B3
U1
U205
R265
1
A3
U2
A1
MIC
R262
10
D4
AUD1
R263
10
D3
AUD2
C235
C237
C265
C266
A2
ISET
DNI
DNI
390p
390p
Only for training and service purposes
D5
VB
C5
COMN1
B5
COMP2
B4
UID
B1
RES
D1
CAP
C4
GND
C3
IC
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