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4.15 Micro SD Trouble
TEST POINT
TP1
CIRCUIT
SIM1_RST
MMC_DATA0
MMC_DATA1
MMC_CLK
MMC_CMD
MMC_DATA3
D205
DNI
Copyright © 2010 LG Electronics. Inc. All right reserved.
Only for training and service purposes
Figure 4.15.1
VMMC
VSIM1
C263
C262
C261
C205
TP
DNI
DNI
1u
1u
TP3
4. TROUBLE SHOOTING
TP2
TP3
VBAT
VSIM1
R238
DNI
CN200
1
20
2
19
3
18
4
17
5
16
6
15
7
14
8
13
9
12
VIB_P
10
11
ENBY0039601
GB042-20S-H10-E3000
C265
D206
D207
DNI
DNI
DNI
- 89 -
4. TROUBLE SHOOTING
TP2
VIO
R236
TP2
100K
RCV_N
RCV_P
SIM1_DATA
SIM1_CLK
MMC_DATA2
MMC_DET
VIB_N
C206
C264
DNI
1n
LGE Internal Use Only
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