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5. 시험 측정 방법 및 규정 1) 전기적 특성 측정 방법 : 제품 성능 시험 업무 절차서 LG(45)-B-4602-51 표준 시험 방법에 준한다. 2) 신뢰성 시험 방법 : 제품 신뢰성 시험 업무 절차서 LG(45)-B-4602-54 표준 시험 방법에 준한다. 3) U/I 검증 시험방법...
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LGE Internal Use Only C1018 D:\Expedition\00_Stern\01_SU950_MAIN\SU950_MAIN_SPFY0221401_10\PCB\SU950_MAIN_SPFY0221401_10.pcb - Page 1 of 1 pages.
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LGE Internal Use Only CN1000 D:\Expedition\00_Stern\03_SU950_F_MAIN\SU950_F_MAIN_SPCY0231001_10\PCB\SU950_F_MAIN_SPCY0231001_D.pcb - Page 1 of 1 pages.
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LGE Internal Use Only D:\Expedition\00_Stern\03_SU950_F_MAIN\SU950_F_MAIN_SPCY0231001_10\PCB\SU950_F_MAIN_SPCY0231001_D.pcb - Page 1 of 1 pages.
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MIPI_CLK+ MIPI_DATA1- MIPI_DATA1+ +1.8V_MCAM_IOVDD +2.8V_MCAM_AF 5M_CAM_RESET/ 5M_CAM_SDA VCM_DRIVER_EN R1009 +2.8V_MCAM_AF 5M_CAM_SCL C1007 C1010 C1009 C1008 C1037 2.2u 2.2u 2.2u 2.2u LG Electronics TITLE SU950_Sub SIZE LGE Internal Use Only DWG NO SPCY0222801 RevE DRAWN BY SHEET Date KIM HEECHEOL 2010.03.05...
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POUT PROX_OUT I2C2_SDA SC2000 SC2001 SC2002 SC2003 +2.6V_VREG_MSMP34 C2007 C2006 C2001 C2008 R2015 C2000 0.1u 4.7u CLIP TYPE-SHIELD CAN CLIP LG Electronics TITLE SU950_Sub SIZE LGE Internal Use Only DWG NO SPCY0222801 RevE DRAWN BY SHEET Date KIM HEECHEOL 2010.03.05...
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MSM_KEY_ROW_IN[0]_F MIC_BIAS MSM_KEY_COLUMN_OUT[0] INOUT_A4 INOUT_B4 MSM_KEY_COLUMN_OUT[0]_F KYPD_LED_DRV/ MIC1+ CAMERA KEY ENBY0039601 GB042-20S-H10-E3000 LS-MTRON EVPAHBD6A SW3000 MSM_KEY_COLUMN_OUT[2]_F MSM_KEY_ROW_IN[1]_F LG Electronics MSM_KEY_ROW_IN[2]_F ESCY0006101 CAMERA PANASONIC TITLE SU950_Sub SIZE LGE Internal Use Only DWG NO SPCY0222801 RevE DRAWN BY SHEET Date KIM HEECHEOL...
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MDDI_STB_N MSM_KEY_ROW_IN[2] MSM_KEY_COLUMN_OUT[1] MSM_KEY_COLUMN_OUT[1] KYPD_PWR_ON/ KYPD_PWR_ON/ MIC_BIAS MIC_BIAS KYPD_LED_DRV/ MIC1+ KYPD_LED_DRV/ MIC1+ ENBY0039501 ENBY0039501 GB042-20P-H10-E3000 GB042-20P-H10-E3000 LS-MTRON LS-MTRON LG Electronics TITLE SU950_Sub SIZE LGE Internal Use Only DWG NO PDM NUMBER RevA DRAWN BY SHEET Date KIM HEECHEOL 2009.11.03 SIZE=...