Park Systems NX20 Manuals

Manuals and User Guides for Park Systems NX20. We have 1 Park Systems NX20 manual available for free PDF download: User Manual

Park Systems NX20 User Manual (321 pages)

Brand: Park Systems | Category: Microscope | Size: 14 MB

Table of Contents
19
Chapter 1. Introduction to Nx20

33
- Scanning Probe Microscope
  33
- Atomic Force Microscope
  33
- Park Systems AFM
  38
Chapter 2. Components of Nx20

44
- NX20 Main System
  45
- NX20 Control Electronics
  58
- Computer & Monitor
  64
- Acoustic and Vibration Isolation System
  65
Chapter 3. Installation

70
- Environment
  70
- Component List
  74
- Uncrate
  77
- System Setup
  78
- System Relocation
  85
Chapter 4. Cantilever Selection

88
- Cantilever Characteristics
  88
- Cantilever Selection
  90
- Cantilever Mounting
  91
- Cantilever DB
  98
- Cantilever Storage
  102
- SLD Detector Chip Carrier
  102
Chapter 5. Operation Procedure 5-1. Basic Procedure

106
- Sample Loading
  122
- Operating Concept
  126
- Maintenance
  132
- Reliability Test
  151
Chapter 6. Afm in Contact Mode

153
- Principle of Contact Mode AFM
  153
- Contact Mode Setup
  155
- Cantilever Selection
  155
- Measurement Procedure
  157
Chapter 7. Lateral Force Microscopy (Lfm)

159
- Principle of Lateral Force Microscopy (LFM)
  159
- Conversion to LFM
  161
- Cantilever Selection
  162
- Measurement Procedure
  162
Chapter 8. Afm in Non-Contact Mode

164
- Principle of Non-Contact Mode AFM
  164
- Non-Contact Mode Setup
  168
- Resonant Frequency Setup
  168
- Cantilever Selection
  170
- Measurement Procedure
  171
Chapter 9. Dynamic Force Microscopy (Dfm)

172
- Principle of Dynamic Force Microscopy
  172
- Conversion to DFM
  175
- Resonant Frequency Setup
  175
- Cantilever Selection
  176
- Measurement Procedure
  176
Chapter 10. Approach Spectroscopy

178
- Spectroscopy Parameters View
  185
- Spectroscopy Positions View
  193
- Data View
  196
- Spectroscopy Data List View
  197
- FD Spectroscopy
  199
- Spectroscopy
  202
- Indenter
  204
- AD Spectroscopy
  208
- TA Spectroscopy
  210
- General Procedure for Spectroscopy Measurement
  213
Chapter 11. Q Control Mode

248
- Principle of Q Control Mode
  248
- Q Control User Interface
  252
- Q Control Procedure
  254
Chapter 12. Magnetic Force Microscopy (Mfm)

255
- Principle of Magnetic Force Microscopy
  255
- Components
  258
- Setup
  258
- Operation
  260
- Practice
  265
- Advanced Application
  266
- Magnetic Field Generator (Optional)
  270
Chapter 13. Force Modulation Microscopy (Fmm)

274
- Principle of Force Modulation Microscopy
  274
- Operation
  276
Chapter 14. Electrostatic Force Microscopy (Efm)

281
- Principle of Electrostatic Force Microscopy
  282
- Setup
  287
- Software UI
  289
- Operation
  294
- Practice
  304
- Advanced Application
  310
- Index
  316

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More Park Systems Manuals

Park Systems NX20 Manuals

Park Systems NX20 User Manual (321 pages)

Table of Contents

Chapter 1. Introduction to Nx20

Chapter 2. Components of Nx20

Chapter 3. Installation

Chapter 4. Cantilever Selection

Chapter 5. Operation Procedure 5-1. Basic Procedure

Chapter 6. Afm in Contact Mode

Chapter 7. Lateral Force Microscopy (Lfm)

Chapter 8. Afm in Non-Contact Mode

Chapter 9. Dynamic Force Microscopy (Dfm)

Chapter 10. Approach Spectroscopy

Chapter 11. Q Control Mode

Chapter 12. Magnetic Force Microscopy (Mfm)

Chapter 13. Force Modulation Microscopy (Fmm)

Chapter 14. Electrostatic Force Microscopy (Efm)

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