Bell System DATASPEED 40/4 Testing And Troubleshooting

BELL SYSTEM PRACTICES
AT&TCo Standard
SECTION 582-200-501
Issue 5, February 1982
SYNCHRONOUS "DATASPEED*" 40/4
MAXI-CLUSTER AND MINI-CLUSTER STATION ARRANGEMENTS
TESTING AND TROUBLESHOOTING
CONTENTS
PAGE
1.
GENERAL ....................
1
2. TESTS ........................
4
CONTROLLER SELF-TEST .......
4
LOCAL TESTS .................
8
A. KO/Controller Local Test .....
8
B.
Printer Local Tests . ; ........
13
C. KO Local Test ..............
16
D.
Data Set Analog Loopback
Self Test ..................
29
ON-LINE TESTS ................
32
A. Preliminary On-Line
32
Testing ...................
32
B. On-Line Test Methods ........
C. Checkout of Received
Printer Message .............
36
D. Checkout of Received
36
KO Message ................
E.
Completion of End-to-End
37
Installation Test . . . . . . . . . . . .
3.
TROUBLESHOOTING ........... 37
4. CIRCUIT CARD
49
COMPATIBILITY ...............
5. CABLE TROUBLESHOOT-ING· ....
51
6. WIRING DIAGRAMS AND
52
PARTS ..................... - . .
7.
TESTING SSI CABLE FOR
52
40/4 APPLICATIONS ............
1. GENERAL
1.01 This section_ includes all testing of the
Synchronous , DAT ASPEED 40 / 4
maxi-
cluster and mini-cluster station arrangements
(hereafter referred to as 40/4 type).· It also
includes trouble analysis.
1.02 The reason for reissue of this section is to
provide information for testing SSI cable
for 40/4 applications.
*Registered Trademark of AT&TCo.
1.03 Troubles isolated to the data set, tele-
phone lines, or associated systems are not
analyzed in this section.
1.04 The correction of troubles in this section
is based on replacement of defective major
subassemblies ( eg, monitor, opcon, printer, power
supply, etc). Field level repair of the major sub-
assemblies are given in the DAT ASPEED 40 Com-
ponent Service Manual.
Note:
Before replacing PROM or EPROM cir-
cuit cards in a controller, see 4. CIRCUIT CARD
COMPATIBILITY.
1.05 See Section 582-200-701 for grounding
strap locations.
Note:
When ordering replaceable parts or com-
ponents, unless otherwise specified, prefix each
part number with the letters "TP" (ie, TP410055).
1.06- Test switches and indicators are shown in
Fig. 1.
Note:
The operation of test switches and indi-
cators should be done under the direction of
Parts 2. TESTS and 3. TROUBLESHOOTING of
this section or referenced sections.
1.07 Reference Sections
582-200-101 - Description and Operation
582-200-201 - Installation
582-200-212 - Keyboard Display Amplifier
58-2-200-300 - Maintenance Controller
Arrangements
582-200-401 - Wiring Diagrams
582-200-701 - Disassembly/Reassembly and
Parts
582-200-751 - Routine Maintenance
582-211-210 - Keyboard Disable Lock
1.08 ASCII indicates American National
Standard Code for Information Inter-
change. EBCDIC indicates Extended Binary Coded
Decimal Interchange Code.
Prepared for American Telephone and Telegraph Company by Teletype Corporation
©1973, 1975, 1976, 1977, 1978, 1979, and 1981 by Teletype Corporation
Alliights_reserv~d .
Printed in U.S.A.
Page 1