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Huntron Tracker 30 User Manual

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Tracker Model 30
User's Manual
P/N 21-2562
Rev. D
October, 2015
Copyright  2015 Huntron, Inc. All rights reserved.
Huntron, Tracker, Sig Assist and Huntron Access are registered trademarks of Huntron, Inc. All other names are
trademarks or registered trademarks of their respective companies.
This document may not be copied in whole or in part, or otherwise reproduced except as specifically permitted
under U.S. copyright law, without the prior written consent of Huntron, Inc.,
15720 Main Street, Suite#100, Mill Creek, WA, 98012, USA.
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  • Page 1 October, 2015 Copyright  2015 Huntron, Inc. All rights reserved. Huntron, Tracker, Sig Assist and Huntron Access are registered trademarks of Huntron, Inc. All other names are trademarks or registered trademarks of their respective companies. This document may not be copied in whole or in part, or otherwise reproduced except as specifically permitted under U.S.
  • Page 2 Huntron Tracker Model 30 at the time of purchase and for the period of one (1) year thereafter. The above warranties are in lieu of all other warranties, express or implied, including all warranties of merchantability and/or fitness for a particular purpose.

  • Page 3: Table Of Contents

    Table Of Contents SECTION 1. INTRODUCTION ........................4 1-1 W 30? ......................... 4 HAT IS A RACKER ODEL 1-2 S .............................. 5 PECIFICATIONS 1-3 S ) ................ 6 AFETY NFORMATION NFORMATION SUR LA SÉCURITÉ 1-4 WEEE HS ............................8 1-5 H ......................

  • Page 4: Section 1. Introduction

    1-1 What is a Tracker Model 30? A Huntron Tracker Model 30 is a troubleshooting instrument that connects to a PC USB port. Throughout this manual it will be referred to as the Model 30. This instrument uses a troubleshooting technique called Analog Signature Analysis (ASA) for applying a current limited sine-wave voltage to an un-powered circuit or electronic component.

  • Page 5: Specifications

    Huntron Access Prober which automatically moves a test probe over designated test points on a circuit card. The Model 30 can be connected to a Huntron Scanner II (Model 30s) or Huntron Scanner (Model 31s). These scanners can be connected to boards under test via IC clip cables, custom cabling or bed- of-nails fixtures.

  • Page 6: Safety Information (Information Sur La Sécurité )

    98-0028 10K Jumper 98-0029 1K Jumper 98-0043 Test Lead Black 98-0249 1 pair Huntron Microprobes MP20 98-0418 USB Cable 98-0463 1 set Huntron Workstation 4.0 Software 1-3 Safety Information (Information sur la sécurité ) Symbols and Warnings: (Symboles et avertissements:) The following symbols are used either in this manual or on the unit: Les symboles suivants sont utilisés soit dans ce manuel ou sur l'appareil:...
  • Page 7 Pour votre sécurité toujours suivre les instructions à côté du symbole de l'unité et dans le manuel. The Huntron Tracker Model 30 conforms to the following Standards: EN 55011 EN 61000-3-2:2000...

  • Page 8: Weee And Rohs

    RoHS directives. We are working for total compliance to RoHS. 1-5 Huntron Workstation Software The Huntron Workstation Software allows control of the Model 30 and uses Windows-like features to implement the troubleshooting process using ASA techniques. Huntron Workstation Software Features ...

  • Page 9: Section 2. Installation And Connections

    The Model 30 is a dual channel Instrument. The front panel BNC connectors are connections for the Huntron Access Prober. The Banana jacks on the front panel are for a set of Huntron Micro-probes. You can therefore manually probe using the Micro-probes without disconnecting the Access Prober BNC connections.
  • Page 10 Pin 4: LINE OUT. The normally Low state can be driven to High state via software control for detection by external instrumentation. Pin 5: LINE IN. The normally High state can be externally shorted to GND to drive it Low for detection by the software.

  • Page 11: Scanner Connector Description

    2-4 Scanner connector description The rear panel Scanner DB15 connector pins are shown below. These pins should only be used to connect to a Huntron Scanner II (Model 30s) or Huntron Scanner (Model 31s). Pin 1: TSTCLK. Clock signal to set test relays.

  • Page 12: Testing Passive Components

    As you go through the following section, make a mental note on the relationship between the Model 30's test range parameters: voltage, resistance and frequency. Put the red test lead in the Channel A jack, and the black test lead in the Common jack. Micro Probe Adjustment: Figure 3-1. Huntron MicroProbe Adjustment.
  • Page 13 To display the analog signature of a resistor: 1. Select the Tracker tab of the Signature pane of the Huntron Workstation Software. 2. Select the 50 ohm range by clicking the Resistance dropdown button and selecting 50. 3. Place or clip a test lead on the opposite ends of a resistor and observe the signature.
  • Page 14 Now that you have an idea of what the signatures of different resistor values look like in different ranges, the next part will give you an idea of what happens when you vary R source resistance, V source voltage and F source frequency of the Model 30 and how it affects the resistive analog signature.
  • Page 15 The Affect of F on Resistor Analog Signatures. Select the 10V, 50 and 20Hz range. Change the Frequency to 60Hz, 1KHz and 5KHz. Observe the resistor signatures in the following figures do not change as F changes. Fs = 20 Hz Fs = 60 Hz Fs = 1KHz Fs = 5KHz...
  • Page 16 REVIEW  The signature of a purely resistive circuit is a straight line because the relationship between voltage and current in a purely resistive circuit is linear.  This straight line signature can vary from  completely horizontal (an open) ...

  • Page 17: Capacitors

    3-2. CAPACITORS With a capacitor connected to the Model 30, the test signal across it responds quite differently than a resistor. The typical analog signature of a capacitor is an elliptical or circular pattern due to the fact that relationship between the test signal's current and voltage are non linear.
  • Page 18 The device to be tested must have all power turned off, and have all high voltage capacitors discharged before connecting the Model 30 to the device. Do the following to display the analog signature of a capacitor: 1. Select the 10V, 50 and 60Hz range 2.
  • Page 19 test frequency has a signature that looks similar to an open circuit. And likewise, the same capacitor at a high frequency has a signature that's similar to a short circuit. ) ON THE SIGNATURE OF A 0.1 F CAPACITOR AFFECT OF FREQUENCY (F Select 10V, 1K...
  • Page 20 UNDERSTANDING CAPACITOR ANALOG SIGNATURES Figure 3-13. Model 30 Core Circuit Block Diagram With A Capacitor. The Huntron Workstation Software displays the Model 30 signature as a response to its test signal, an analog signature that represents the relationship between voltage, current and resistance of a component.
  • Page 21  Changing frequency F : As the frequency of the test signal increases, the capacitive reactance X will decrease and the amount of current in the circuit will increase. On the Model 30, the elliptical signature will become increasingly vertical that implies more current flow.
  • Page 22 The figure above shows how the three variable parameters affect the capacitive signature. Frequency F and internal resistance R has the greatest affect, while increasing voltage V has no affect. Table 3-1 shows the Model 30's limits for the minimum and maximum capacitance values it can handle.
  • Page 23 Another example of capacitive leakage is shown for a 10 F capacitor. Normal Capacitor Leaky Capacitor Figure 3-16. Signatures Of A 10 F Capacitor With Dielectric Leakage at 10V, 500, 60Hz Again, this example only simulates the leakage flaw by adding a 68  resistor in parallel to a 10 F capacitor.

  • Page 24: Inductors

    3-3. INDUCTORS Inductors, like capacitors, have elliptical analog signatures and respond to Model 30's test signal non-linearly. Also like capacitors, an inductor's reactance (resistance to an AC test signal) is dependent on the test signal's frequency. Because of the way they are constructed using wire with some amount of resistance in it, it is hard to find a pure inductance.
  • Page 25 that looks similar to an open circuit. And likewise, a small value inductor has a signature that's similar to a short circuit. AFFECT OF FREQUENCY F ON INDUCTOR SIGNATURES Select 10V, 50, 60Hz. Then Select 1KHz and 5KHz. = 60 Hz = 1KHz = 5KHz Figure 3-18.
  • Page 26 AFFECT OF INTERNAL RESISTANCE R ON INDUCTOR SIGNATURES Select 2V, 10, 60Hz. Then Select 50 and 200. = 10  = 50  = 200  Figure 3-20. Affect Of Varying R On 12,000 µH Inductor Signatures. Note that the signature changes from a horizontal to a vertical position as the Model 30's internal resistance R increases.
  • Page 27 Since inductors in reality are not pure inductors, the elliptical signatures they form on the Model 30 display usually is distorted. Inductors constructed with a ferrite core makes the inductive characteristics different from those constructed without. The Model 30 responds with a unique analog signature for each inductor type.
  • Page 28 REVIEW  Inductors display elliptical signatures similar to capacitors. Since the inductor also exhibits resistance, due to its construction, the ellipse may be distorted.  As the Model 30 test signal’s frequency is increased, the ellipse signature becomes flatter. This response is opposite to that of a capacitor. ...

  • Page 29: Electromechanical Switching Components

    3-4. ELECTROMECHANICAL SWITCHING COMPONENTS Switches are electrical devices that either stop or allow current to flow in a circuit. They are either in an on or off state. Switching devices come in all types and sizes. There are simple mechanical switches, relays, optical switches, and many kinds of semiconductor switches. They are different because each uses a different kind of stimulus to turn them on or off.
  • Page 30  The switch has internal resistance.  As the test signal's voltage decreases with each range change, the volts per division of the horizontal axis also decreases so that its analog signature becomes more pronounced. This is caused by the small voltage drop across the switch's internal resistance.
  • Page 31 REVIEW  The Model 30 can test switches in real time. This makes an excellent test for microswitches, power switches, control switches, pressure and heat sensor switches.  As the mechanical switch closes, watch for erratic or discontinuous signature. Switch bounce will display as multiple closure signatures.

  • Page 32: Section 4 Testing Discrete Semiconductors

    SECTION 4 TESTING DISCRETE SEMICONDUCTORS 4-1. DIODES The most basic type of solid state semiconductor component is the diode. Diodes are formed by creating a junction between p-type and n-type semiconductor material. The pn junction gives diodes and semiconductor components polarity characteristics that allow them to conduct current when an external voltage is applied.
  • Page 33 Figure 4-2. Model 30 Core Circuit Block Diagram With A Diode. You can see this "knee" signature on some diodes in the next section. Do the following to display the analog signature of a diode: 1. Select 50, 10V and 60Hz. 2.
  • Page 34 AFFECTS OF FREQUENCY (F ) ON THE DIODE SIGNATURE With the 3V, 50 selected and the test signal frequency of 60 Hz, the signature of the diode is shown on the left figure below. Changing only the test signal frequency to 5 kHz displays the signature on the right.
  • Page 35 UNDERSTANDING DIODE SIGNATURES Figure 5-6 reviews the Model 30's three range parameters and how they affect the diode signature. How Tracker Parameter Changes affect Diode Signatures Figure 4-6. Range Parameters Changes and Affects On Diode Signatures. THE COMPOSITE DIODE SIGNATURE A composite analog signature is a combination of several components connected together in an electronic circuit.
  • Page 36 Figure 4-7. Composite Model Of A Diode And Capacitor In Parallel. = 10 V, F = 20 Hz = 10 V, F = 1KHz =200 mV, F = 1KHz Figure 4-8. Composite Signature - 1N914 Diode And 1F Capacitor In Parallel. The signature on the left shows only the diode signature because the test signal frequency is set below any visible contribution due the capacitive reactance.
  • Page 37 = 50  = 10 V, R = 10 V, R = 1K V = 200 mV, R = 1K Figure 4-10. Composite Signature - 1N914 Diode And 1.5KResistor In Parallel. The signature on the left shows only the diode signature because the test signal resistance is set below any visible contribution due the 1.5 k...
  • Page 38 54 10V 1K 15V 20K, 20V Figure 4-12. Defective Diode Signature With A 50  Series Resistor. The LOW range shows that there is a resistive component to the signature when the diode is conducting. This is the result of a defect in the diode's internal PN junction. The resistance is visible only in LOW range because the voltage drop across it is small.
  • Page 39 ZENER DIODES Normal switching and signal diodes conduct when forward biased only. When reverse biased, they act as opens unless they are operated outside design limits. If this condition occurs then so much voltage is applied that they break down and can no longer prevent current flow.
  • Page 40 Single 1N5239B Zener Diode 2 Zener Diodes in Series, 1N5239B Figure 4-17. Signatures Of A Zener Diodes at 20V, 20K Since each horizontal division on the Signature graticule (in 20V range) is approximately 5 Volts, from the signature on the left you can estimate that this is about a 9 volt zener diode. The signature at the right is the signature of two zener diodes connected in series.

  • Page 41: Transistors

     Look for the zener effect when checking voltage regulators such as the 7805 type. This can help determine an unknown or faulty device.  The Model 30 can be used to test and determine the four pin connections on a bridge rectifier, (AC1, AC2, + and -).
  • Page 42 Most bipolar transistor circuit designers take into account a wide variation in h as a normal occurrence and design the related circuitry to function properly over the expected range of . The effects mentioned above are for the most part much smaller than the normal device variation so that the use of this instrument will have no effect on the functionality of good devices and can fulfill its intended purpose of a means to locate faulty components.
  • Page 43 BIPOLAR TRANSISTOR BASE-COLLECTOR SIGNATURES Do the following to display the analog signatures of a bipolar transistor: 1. Select the 1K and 15V. 2. Place or clip the red test lead from the Model 30's Channel A jack to collector lead of the transistor.
  • Page 44 We can see that the base-emitter signature of the NPN transistor is nearly identical to the signature of the zener diode. The emitter-base signature of a PNP transistor is also nearly identical but opposite in polarity to the zener diode. PNP Transistor - 2N3906 NPN Transistor - PN2222A Figure 4-22.
  • Page 45 4. This looks like a collector-base signature. What you do not know yet, is which pin is the collector and which pin is the base? 5. Probe pin 3 with the red probe and pin 2 with the black probe. 6.
  • Page 46 DARLINGTON BIPOLAR TRANSISTOR SIGNATURES The Darlington transistor is basically two transistors paired together in a special configuration. The emitter of the first transistor is connected to the base of the second transistor. The collectors of both transistors are connected together. The base of the first transistor serves as the external base lead and the emitter of the second transistor serves as the external emitter lead.
  • Page 47 REVIEW  A PNP bipolar transistor consists of a layer of N-type silicon sandwiched between two layers of P-type silicon.  A NPN bipolar transistor consists of a layer of P-type silicon sandwiched between two layers of N-type silicon.  To test a transistor, the base-emitter (B-E), collector-base (C-B) and collector-emitter (C- E) junctions all need to be examined.

  • Page 48: Solid State Switching Components

    4-3. SOLID STATE SWITCHING COMPONENTS OPTICAL SWITCHES There are two types of optical switches: phototransistors and optocouplers. Phototransistors can be used in two modes depending on the application. It can be used as either a light activated transistor or as a light activated diode. In either mode, light is used to turn it on and allow current to flow.
  • Page 49 MRD3056 With No Light MRD3056 With Light Figure 4-29. Signatures Of A NPN C-E Junction Phototransistor at 15V and 1K. The phototransistor's signature is similar to a diode's signature in reverse breakdown mode when not activated by light and as a short signature when activated by a bright external light. SCRS AND TRIACS A SCR and triac are semiconductor components that are used in switching applications.
  • Page 50 4. Move the black test probe from the SCR's anode lead to cathode lead (K) of the component. 5. Observe the gate-cathode signature of the SCR. 6. Place the red test probe to the SCR's anode lead and the black test probe to the SCR's cathode lead.

  • Page 51: Section 5 Testing Integrated Circuits

    SECTION 5 TESTING INTEGRATED CIRCUITS 5-1. DIGITAL INTEGRATED CIRCUITS Digital integrated circuit (IC) chips are made from transistors on a common substrate. Their analog signatures are typically variations of the discrete diode and transistor signatures. Most logic ICs, contain multiple circuits in one chip. These chips can have pins from 14 to over 200, although quite often many pins share quite similar signatures.
  • Page 52 DIGITAL INTEGRATED CIRCUIT SIGNATURES Before we examine the analog signatures of an IC, let's study the block diagram of a 74LS245 octal bi-directional bus buffer to introduce some basic concepts. This IC is a member of the low power Schottky transistor-transistor logic family (LSTTL). Examine the block diagram for this chip below.
  • Page 53 4. Use the red test lead from the Model 30's Signal jack. Probe the enable input pins of the IC and view their signatures on the signature display. For this example, the enable pins of the 74LS245 are pin 1 and 19 and will have the same signatures. (Note: This is only for ICs out of circuit.) 5.
  • Page 54 COMPARING TWO TTL FAMILIES Although the logic function is the same, there are differences in the circuitry of each logic family. These differences can be readily seen in their signatures using the Model 30. We will illustrate these concepts with the following example of two hex inverters, a 7404 and a 74LS04 from different logic families.
  • Page 55 another reference chip available just compare each input's signature with the other five inputs. Similarly, compare each output's signature with the other five outputs. CMOS LOGIC FAMILY CMOS circuits are constructed differently than TTL circuits. The inputs to CMOS transistors are capacitive due to the use of field-effect transistors (FET) instead of bipolar transistors used in TTL.
  • Page 56 50, 10V, 60Hz Range Figure 5-7. Signatures Of A 74HC14 CMOS Hex Inverter. CMOS COMPONENTS AND TEST SIGNAL FREQUENCY F CMOS logic circuits inherently have a significant amount of internal capacitance. This junction capacitance is visible in the CMOS signatures when using the Model 30. Capacitance in CMOS circuitry may be emphasized or de-emphasized by changing the frequency of the test signal.
  • Page 57 TROUBLESHOOTING DIGITAL LOGIC ICS Comparison testing is a very powerful and effective test strategy when troubleshooting digital logic using ASA. The Model 30's Alt feature makes this technique quick and simple. Instead of having to remember the specific signatures of a good component, all that's needed is to have a reference component or board along side the one that's suspect.

  • Page 58: Analog Circuits

    5-2. ANALOG CIRCUITS Analog components and circuits represent another family of integrated circuit components and include operational amplifiers (op amps), comparators, references, regulators, timers and many other specialized functions. These components and circuits present more troubleshooting challenges that are unique to this particular family of ICs. OP AMPS Frequently, each pin of an op amp creates a different signature on the Model 30.
  • Page 59 Pin 2 -Input Pin 3 +Input Pin 6 Output Figure 5-10. Signatures of an Op Amp (741) at 10V, 50, 60Hz with Common To Pin 4. Pin 2 -Input Pin 3 +Input Pin 6 Output Figure 5-11. Signatures of an Op Amp (741) at 20V, 20K, 60Hz with Common to Pin 4. TROUBLESHOOTING OP AMP CIRCUITS Troubleshooting an op amp in-circuit may be very challenging.
  • Page 60 Voltage regulators are commonly found in many electronic assemblies. Some of the most popular integrated circuits of this type are three terminal devices like the 7805, a +5 volt DC regulator. The next figure shows the schematic and pin layout of the 7805 regulator. Different manufacturers implement their products with different topologies and manufacturing processes.

  • Page 61: Low Voltage

     The IC signatures resemble zener diodes.  There are many causes for IC failures and the Model 30 can display its "health" as resistive leakage, an open or a short.  Functionally identical pins on a single IC out-of-circuit will display the same signature. ...
  • Page 62 Buffer pins Enable pins Power pin 3V, 10K, 60Hz, Ground Pin To Test Common Figure 5-15. Signatures of a Low Voltage IC (74LVQ45 Type). The ranges used above enhance the resistive fault signatures that are commonly found when troubleshooting this logic family. The test signal voltage V is lower than the TTL range groups to ensure that most descriptive signature is displayed.

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