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EZM MK-328 TR/LCR/ESR User Manual

Transistor /lcr/esr tester

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MK-328 TR\LCR\ESR
Transistor \LCR\ESR Tester User Guide
EZM ELECTRONICS STUDIO
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Summary of Contents for EZM MK-328 TR/LCR/ESR

  • Page 1 MK-328 TR\LCR\ESR Transistor \LCR\ESR Tester User Guide EZM ELECTRONICS STUDIO...
  • Page 2 1.troduction This meter is an intelligent semiconductor device analyzer, it can measure most of the diodes, bipolar transistors, Junction/MOS FETs and low power thyristors. It automatically identifies the type of devices and pinouts, measures the current gain HFE, gate theshhold and FET junction capacitance, a typical application is to pair two transistors or identify an unknown SMD device.
  • Page 3 off the power automatically if you don’t use it within 20 seconds ③ : Test terminal 1, Yellow, will display as pin 1 on LCD. ④ : Test terminal 2, Green, will display as pin 2 on LCD. ⑤ : Test terminal 3, Red, will display as pin 3 on LCD. 2.2 Test clips and test jig For those big size DUTs (device under test), you may connect them directly to the test terminals, otherwise, you need the test clips and test jig as shown in Figure 2 and Figure 3.
  • Page 4 Figure 4: Test Transistor with Test Clips 3.2 Test Jig: It is used for small pin pitch and thin pin lead device, such as low power transistor, resistor and capacitors,.This jig has a test area for SMD devices. Figure 5 shows an example of capacitor test .
  • Page 5 Figure 5: Test Capacitor with Test Jig 4.Test examples It shows that no device is connected on test terminals or an unknown part. It may also be that the devise was damaged -----------------------------------------------------------------------------------------------------------------------------------------...
  • Page 6 4.2 Test a NPN transistor It shows that the DUT is NPN transistor, test terminal 1,2,and 3 are connected to E,C and B pins, Gain is 248, and forward voltage on junction B and E is 619Mv, leakage current ICE0=0,ICES=0. 4.3 Test a PNP transistor It shows that the DUT is a PNP transistor, the test terminals 1, 2 and 3 are connected to transistor pin E, C and B, Gain is 356, the forward voltage on B and E junction is 662mV, leakage current ICE0=0,ICES=0.
  • Page 7 It shows that DUT is a thyristor, test terminals 1, 2 and 3 are connected to pin C (cathode), G (control gate) and A (anode), the forward voltage is 0.78V. 4.7 Test a triac It shows that the DUT is a triac, test terminals 1, 2 and 3 are connected to first anode 1, control gate G, second anode2, and the forward voltage is 0.99V ----------------------------------------------------------------------------------------------------------------------------------------- 4.8 Test a diode...
  • Page 8 4.11 Test an inductor It shows that the DUT between terminal 1 and 3 is an inductor, L=0.09mH, and DC resistance is 1.4ohm 4.12 Test a capacitor It shows that the DUT between terminal 1 and 3 is a capacitor. Capacitance =1168uF, ESR=0.06 ohm and Voltage loss is 1.7%.
  • Page 9 6.Features 6.1 Operates with ATmega328 microcontrollers. 6.2 Displaying the results to a 128x64 graphic LCD-Display. 6.3 One key operation with automatic power shutdown. 6.4 Shutdown current is only about 20nA. 6.5 Automatic detection of NPN and PNP bipolar transistors, N- and P-Channel MOSFETs, JFETs, diodes, double diodes, Thyristors and Triacs.
  • Page 10 6.27 Display the Collector cutoff current ICE0 with currentless base (10µA units) and Collector residual current ICES with base hold to emitter level . This values are only shown, if they are not zero (especially for Germanium transistors). 6.28 Thyristors and Triacs can only be detected, if the test current is above the holding current. Some Thyristors and Triacs need as higher gate trigger current, than this Tester can deliver.