ProT Ar-Ge FADOS7F1 User Manual

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Endüstriyel Proje Tasarım Ar-Ge Ltd. Şti.

Industrial Project Design R&D Co. Ltd.

FADOS7F1 (10V3)

FAULT DETECTOR AND PC OSCILLOSCOPE

USER MANUAL

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Page 1 Endüstriyel Proje Tasarım Ar-Ge Ltd. Şti. Industrial Project Design R&D Co. Ltd. FADOS7F1 (10V3) FAULT DETECTOR AND PC OSCILLOSCOPE USER MANUAL...
Page 2: Product Description
Using feature of recording reference values to memory and comparing data from memory, it can test easily electronic cards. In addition to the basic features, FADOS7F1 VI Tester can also be used dual-channel oscilloscope, square wave generator and analogue voltage output.
Page 3: Security
SECURITY 1- FADOS7F1 is produced by using lead-free solder and designed in accordance CE regulations; users must use the following usage rules. 2- Chassis must be isolated and grounded. Connect the chassis ground connection point of the probe is the same as your computer, careful to avoid the potential difference.
Page 4: Technical Features
TECHNICAL FEATURES A- FAULT DETECTION FEATURE: Output Voltage : ±1V, ±2V, ±5V, ±10V Output Resistance : Current Level: : 47 KΩ Medium : 2,7 KΩ High : 550 Ohm Short Circuit Current : Low Current : 212 μA (10V) Medium Current : 3.7 (10V) High Current...
Page 5: Product Content
Dimensions : 75 mm Width 2 Oscilloscope Probes : 40 mm Height 1 USB Cable : 20 mm Deep 1 Software CD Weights : 450 gram with all accessories 1 Hand Bag for FADOS7F1 Picture 1: FADOS 7F1, USB Cable, Probes...
Page 6: Table Of Contents
CONTENTS Page PRODUCT DESCRIPTION ................2 SECURITY ...................... 3 TECHNICAL FEATURES .................. 4 ....................5 RODUCT ONTENT ) ............. 5 HYSICAL EATURES ITHOUT CCESSORIES FADOS 7F1 FAULT DETECTOR AND PC OSCILLOSCOPE........ 7 ...................... 7 SAGE REAS ....................7 NIQUE EATURES .....................
Page 7: Fados 7F1 Fault Detector And Pc Oscilloscope
Fault Detector and PC Oscilloscope have been especially developed to determine faults at all type electronic cards by ProT Ar-Ge Industrial Project Design R&D Ltd. Co. The main purpose, make it easier to find fault of electronic cards. It is included oscilloscope, signal source, multimeter etc.
Page 8 FADOS 7F1 includes 7 important functions: 1. Double - Channel Fault Detection (VI Graph) Comparing solid and faulty card without giving energy. 2. Equivalent Circuit Diagram Composing R, C, or Diode Circuit Diagram according to the point touched. 3. Measuring of Resistor, Capacitor, and Diode Feature of measuring the value of touched point.
Page 9 Picture 3: FADOS 7F1 Fault Detector – VI Tester Screen Picture 4: FADOS 7F1 Oscilloscope – Analog Output Screen...
Page 10: Installation
2- Click FADOS7F1 SETUP.exe and install program. 3- Run FADOS7F1.exe DRIVER INSTALLATION 1- Connect FADOS7F1 to PC via USB. Windows XP 'New Hardware Found' with warning direct you to install the driver. Insert the CD into the CD rom and install the driver.
Page 11: General Usage Information
Note: Each product has different calibration settings, so that please do not lost program CD. GENERAL USAGE INFORMATION 1. Product Oscilloscope – Analog Output screen pop-up and if you click Fault Detector – VI Tester button, input screen Fault Detect. 2.
Page 12 to horizontal makes an angle. If angle is more, capacitor is faulty. Due to current this test may be misleading, while testing a capacitor at circuit. Therefore considering this situation to test. For capacitor quality, the best measurement in this product is done by looking at the Capacity Resistance curve.
Page 13: Vi Test - Program Features Of Fault Detecton Part
VI TEST – PROGRAM FEATURES OF FAULT DETECTON PART FADOS 7F1 was developed by ProT Ar-Ge Industrial Project Design R&D Ltd. Co. for finding fault of electronic cards. While testing with V/I graph, do not apply power to card. Generally, probe chassis is connected to card chassis and a signal is applied to touch point by the device.
Page 14 Channel: Used to select channel. Auto: When Auto is selected, according to feature of touched point, the most appropriate values of voltage, frequency, and current steps are determined. Voltage Step: FADOS 7F1 has various voltage steps ±1V, ±2V, ±5V, ±10V. simultaneously.
Page 15: Passive Components R, L, C (Resistor, Inductor, Capacitor) Current - Voltage Vi Graphs
PASSIVE COMPONENTS R, L, C (RESISTOR, INDUCTOR, CAPACITOR) CURRENT – VOLTAGE VI GRAPHS Resistor VI Graph Resistor current – voltage (V/I) graph appears with a specific angle to horizon; and resistor symbol and value are seen at the bottom of the graph. While resistors at high values appear with angle close to horizontal axis, resistors at low values are seen at screen with an angle close to vertical axis.
Page 16 Picture 7: Resistor VI Graph, The Equivalent Circuit Diagram and Value Measurement Picture 8: Short Circuit and Resistor VI Graph...
Page 17: Capacitor Vi Graph
Capacitor VI Graph Due to their energy storage characteristics, reactive components produce a phase shift between voltage and current flow. This is displayed as a circular or elliptical signature. Capacitor symbol and value are seen at the bottom. Picture 9 displays capacitor typical signals and values for the equivalent circuit.
Page 18 Picture 10: High Quality Capacitor Picture 11: Low Quality Capacitor...
Page 19: Inductor Vi Graph
Picture 12: Capacitor and RC Circuit If capacitor and resistor are parallel, elliptical shape makes an angle to horizon. Inductor VI Graph The diagram below shows the signature of a ferrite transformer primary winding with the test voltage range set Low and test frequency set High. This demonstrates the effect of a significant value of resistance causing the inductive ellipse to be tilted.
Page 20: Semi Cundoctors
Picture 13: Inductor VI Graph, The Equivalent Circuit Diagram SEMI CONDUCTORS Diode – Zener Diode VI Graph Diodes start to transmit current after high transmission voltage. For this reason, diodes are seen horizontally at one part of the graph, and are seen vertically at the other part.
Page 21 Picture 14: Diode and Serial Diode - Resistor VI Graph, The Equivalent Circuit Diagram Picture 15: Zener Diode VI Graph, The Equivalent Circuit Diagram...
Page 22: Transistor - Triac - Thyristor - Fet - Igbt Vi Graph
Transistor – Triac – Thyristor – FET - IGBT VI Graph Active components such as transistor, triac and FET can be tested by transmitting them while both of two channels are used. A transistor contains two semiconductor junctions connected. Transistors also must have emitter chassis. First, touch collector with a probe (Channel 1 probe or Channel 2 probe).
Page 23: Testing Integrated (Ic - Smd Integrates)
Picture 17: FET VI Graph TESTING INTEGRATED (IC – SMD INTEGRATES) Integrated circuits can be tested all the pins with the help of probes. Circuits made up of many components encapsulated within a single package. The component count within an IC may vary from as few as half a dozen devices on a "chip" to many thousands of components in, for instance, a modern microprocessor.
Page 24 When testing integrates signals display similar to the double-inverse diode, zener diode and diodes. It can be capacitors or resistors are connected to these. If pin of integrated has double reverse diode, it means this pin can be solid. We can use the same technique to locate faults in ICs which are large and very complex, such as memory chips and microprocessors.
Page 25: Electronic Circuit Registration Memory And Comparision With
ELECTRONIC CIRCUIT REGISTRATION MEMORY AND COMPARISON WITH MEMORY It is possible to save points touched on a card in an order, and then comparing them with other cards. First, open a new file by writing name or code of card that will be saved. For uploading image;...
Page 26: Comparision Testing Components Of Electronic Circuit
New Folder: Opens a folder by using the name given to a new circuit. Open Image: Open and upload the circuit of the image. Add Number: Add numbers automatically test point. Inc.: Increments number automatically. Save: Saves the value of test point with mentioned name to the determined folder.
Page 27 Picture 19: Comparison Test Comparing this system is very sensitive and is considered compatible with the values within the given tolerance. Picture 20: Comparison Test A significant difference, different resistance value of the test circuit from reference circuit.
Page 28 Picture 21: Comparison Test Integrated circuit is usually double reverse diode. It can be capacitors or resistors are connected to these. If pin of integrated has double reverse diode, it means this pin can be solid.
Page 29 Picture 22: Comparison Test – Integrated Pin Faults Using FADOS 7F1, faults can be easily find. Pin of integrated is damaged reverse diode by deterioration; diodes can be resistance, open circuit or short circuit. It is integrated fault. One diode damaged and now it is a resistor.
Page 30 Picture 23: Comparison Test – Integrated Pin Faults Picture 24: Comparison Test – Parallel Resistor Faults...
Page 31 Picture 25: Parallel Capacitor Faults Picture 26: Comparison Test...
Page 32: Different Graph Display
3G - 3 DIFFERENT GRAPH DISPLAYS If you click 1G button, you see 2G and 3G. It means 1, 2 or 3 graphs at different adjustments (voltage, frequency and current) can be screened simultaneously. Picture 27: 3G Graph Display Picture 28: 3G Graph Display...
Page 33: Oscilloscope - Program Features
OSCILLOSCOPE – PROGRAM FEATURES Picture 29: Oscilloscope Screen Osc. Active/Passive: Activates oscilloscope or shows latest screen display. Channel: Selects channel. Channel1, Channel2 and both channels are selected in an order. Manual/Auto: When automatic, catches the latest signal if the signal is off. Save: Saves oscilloscope data or opens recorded data.
Page 34: Recommendations
Frequency: Output frequency. Voltage: Voltage of square wave or analogue output. Voltage Adjustment: (Voltage/Division) Adjusts screen sensitivity of voltage. Data received from device is 12 Bit, 2.5mV sensitive. Zero Adjustment: Moves position of ‘0V’ point up or down. Numbers indicate voltage values.
Page 35: Warranty And Conditions
5. Depending of intensive use probes, copper which is in the cable may be damaged. Therefore, failure of the probe is not covered by warranty. 6. If device is faulty, send us or an authorized repair service or send Prot Ar-Ge Company.