1. Manuals
  2. Brands
  3. Albedo Telecom Manuals
  4. Test Equipment
  5. AT-2048 Ether.Genius
  6. User manual

Albedo Telecom AT-2048 Ether.Genius User Manual

E1 / datacom testing guide
Hide thumbs
Table of Contents

Advertisement

Quick Links

Download this manual
User's Manual
AT-2048
Ether.Genius
E1 / Datacom Testing Guide

Advertisement

Table of Contents
loading
Need help?

Need help?

Do you have a question about the AT-2048 Ether.Genius and is the answer not in the manual?

Questions and answers

Summary of Contents for Albedo Telecom AT-2048 Ether.Genius

  • Page 1 User’s Manual AT-2048 Ether.Genius E1 / Datacom Testing Guide...
  • Page 3 Copyright The information contained in this document is the property of ALBEDO Telecom S.L. and is supplied without liability for errors and omissions. No part of this document may be reproduced or used except as authorised by contract or other written permission from ALBEDO Telecom S.L. The copyright and all restrictions on reproduction and use apply to all media in which this information may be placed.
  • Page 4 User Guide...

  • Page 5: Table Of Contents

    Table Of Contents Chapter 1: Introduction ..................... 1 Important Notice ....................2 Warranty....................2 Battery Safety..................3 WEEE Notice ..................3 The Tester ......................3 Test Connectors..................4 Platform Connectors ................5 The Graphical User Interface ................6 Running Tests ....................9 Upgrading the Unit....................
  • Page 6 User Guide TDEV ....................50 Measuring Output Wander................52 Wander Generation..................55 Measuring MTIE/TDEV ...................56 Chapter 6: Tests over G.703 Signals ..............61 The E1 Frame ....................61 Frame Alignment .................62 NFAS ....................62 Multiframe CRC-4 ................62 Signalling Channel................64 Generation and Analysis of Framed Signals...........64 Using the Multiplexer and the Demultiplexer ........68 FAS / NFAS Generation and Analysis ............69 CAS Generation and Analysis ................70 Event Insertion and Analysis................72...
  • Page 7 Using the Embedded Web Server............. 110 Programming Tests ..................111 Using the System Menu ................113 Using the Network................114 Installing Software Options ............... 117 Using the Remote Control ................118 Appendix A: Technical Specification..............121 E1 Generation / Analysis ................121 Connectors..................
  • Page 8 User Guide Printer / Console Connector (RJ-45).............134 Balanced TX / RX Ports (RJ-45) ..............134 Appendix D: Datacom Cable Pinouts ..............135 V.24 / V.28 Adaptor Cables ................135 X.21 / V.11 Adaptor Cables ................136 V.35 Adaptor Cables..................136 V.36 Adaptor Cables..................137 EIA-530 Adaptor Cables ................137 EIA-530A Adaptor Cables................138...
  • Page 9 Chapter 1 Introduction The ALBEDO Telecom AT-2048 / Ether.Genius is a handheld tester for generation and analysis of 2048 kb/s TDM (E1) and data communications (V.11 / X.24, V.24, V.35, V.36, EIA-530, EIA-530A) interfaces. The AT-2048 / Ether.Genius has an external DC input but it also has internal batteries.

  • Page 10: Important Notice

    Operation, manipulation and disposal warnings for your AT-2048 /Ether.Genius unit are listed below. 1.1.1. Warranty The ALBEDO Telecom AT-2048 /Ether.Genius is supplied with a warranty that includes replacement of damaged or faulty components in the terms and period described in the ordering information. This Warranty does not apply to: 1.

  • Page 11: Battery Safety

    Introduction 1.1.2. Battery Safety The ALBEDO Telecom AT-2048 /Ether.Genius tester contains a built-in battery, improper use of which may result in explosion. Do not heat, open, puncture, mutilate, or dispose of the product in fire. Do not leave the device in direct sunlight for an extended period of time, which could cause melting or battery damage.

  • Page 12: Test Connectors

    User Guide • On/Off key: If the tester is in off status, push to switch it on. If the tester is on, use this key to switch it off (long push). There are four LEDs (PWR, DC, Port A summary, Port B summary). Their description is given below: •...

  • Page 13: Platform Connectors

    Introduction BNC Port A TX: Unbalanced (BNC) 75  output. This output is used to generate • 2048 kb/s signals. RJ-45 Port A TX/RX: Balanced (RJ-45) 120  input / output. This interface is used • to generate and analyse 2048 kb/s signals. RJ-45 Port B TX/RX: Balanced (RJ-45) 120 ...

  • Page 14: The Graphical User Interface

    User Guide • RJ-45 printer or console: Console connector. This interface is prepared for con- necting a serial printer. • USB Slave: Use a USB cable with Slave type connector (Type B, Device) for this port. Currently this port enables connection of a PC to the tester and access to the internal tester file system.
  • Page 15 Introduction signal through the Softleds shown on the left. The Softleds are always displayed and they work even when there is no test running. On the top side of the screen there is a header zone which contains information about the current tester status (date, time, tests running, event insertion active) and an identifier for the currently displayed panel.
  • Page 16 User Guide Menus and submenus are organized in a tree. The root of the tree is the Home panel and the leaves are configuration or result panels. Results are usually presented in a list or a table. If all results cannot be simultaneously displayed, then the user is allowed to use the cursors up and down to browse the list.

  • Page 17: Running Tests

    Introduction Configuration panels are usually selection lists. Sometimes you can select only one simultaneous item in the list and sometimes selection of several items at the same time is possible. Keyboards are available if selection through lists is not possible. There is one keyboard for numeric settings and one for alphanumeric settings.
  • Page 18 User Guide 1. Switch the unit off 2. Press HOME and ENTER simultaneously and, without releasing the keys, press the On / Off button. 3. Now, keeping all three the keys pressed, wait until you hear a beep. Then release the keys.

  • Page 19: Chapter 2: Connection To The Network

    Chapter 2 Connection to the Network The AT-2048 is equipped with two 2048 kb/s ports. Port A is full featured 2048 kb/s interface. On the other hand, Port B usage is configurable (2048 kb/s TX/RX, codirectional, clock input). Ether.Genius is equipped with one full featured 2048 kb/s port (Port C).
  • Page 20 User Guide 3. Choose between: E1 monitor, E1 endpoint, E1 through, E1 MUX test, E1 DEMUX test, Datacom endpoint, Datacom monitor, G.703 / E0 or Analog. Confirm by pressing ENTER. Note: Some other operation modes may be available depending on the hardware / software options available in your test unit.
  • Page 21 Connection to the Network Table 2.1: E1 Operation Modes Setting Description E1 DEMUX test The E1 demux mode is similar to the E1 mux mode but in this case the DUT / SUT is equivalent to an E1 demultiplexer. The transmitted test signal is a G.704 framed E1 signal and the received signal is an analogue voice band, a 64 kb/s codirectional signal or a compatible datacom 64 kb/s signal.

  • Page 22: Connecting The Tester To The Dut / Sut

    User Guide Table 2.1: E1 Operation Modes Setting Description G.703 / E0 This is the mode to be used to generate and analyse variable bit rate codirectional signals compliant with ITU-T G.703. Note: This mode sets the Port B usage to Codirectional. No other usage for Port B is accepted in this mode.
  • Page 23 Connection to the Network been transmitted through the DUT / SUT. Any difference between the transmitted and received pattern is accounted. The G.703 / E0 mode is used in the same way than the E1 endpoint mode. Testing capabilities over the G.703 / E0 interface are the same that for E1 signals but in this case over variable bit rate ITU-T G.703 / E0 signals.
  • Page 24 User Guide When E1 monitor is configured Port A and Port B transmitters are disabled (they are not needed for passive monitoring). Port A and Port B can still be used at the same time. This feature enables bidirectional monitoring of E1 signals. Port A Port A AT-2048...

  • Page 25: Configuring The Port A And Port B

    Connection to the Network 2.3.Configuring the Port A and Port B Before receiving any valid signal or being able to perform any test, the Port A / Port B line settings must be configured. The procedure to do that is the following: Table 2.2: Port Setup Menu Setting Description...
  • Page 26 User Guide Table 2.2: Port Setup Menu Setting Description Line The Line item contains lower level menus used to configure the line signals transmitted and received through the test interfaces. The Line submenus enable configuration of the port input impedance, line code, transmission clock source and trans- mission frequency offset.
  • Page 27 Connection to the Network Table 2.2: Port Setup Menu Setting Description Wander generator This control contains lower level menus to enable and config- ure the wander generator. Wander is a phase modulation added to the normal output signal. This control is available only if a wander Generation &...

  • Page 28: Entering The Line Settings

    User Guide 2.3.1. Entering the Line Settings Line settings include some of the most basic configuration parameters for 2048 kb/s transmission and reception. Some of these include the line code, and the clock source. Follow these steps to configure the line parameters in the AT-2048 / Ether.Genius: Table 2.3: Line Settings Setting Description...
  • Page 29 Connection to the Network Table 2.3: Line Settings Setting Description TX code Transmitted line code. The line code provides correct levels, pulse shapes and bit encoding rules for baseband transmis- sion over an electrical interface. The possible configurations for this field are: •...

  • Page 30: Testing With An External Timing Reference

    User Guide ing applications before connecting the tester to the DUT / SUT to avoid disturbing the line. 4. Set the RX code to HDB3 or AMI and do the same (if necessary) with the TX code. The value to set in TX code and RX code depends on the line code used by the DUT / SUT in the network interface where the AT-2048 / Ether.Genius is con- nected.

  • Page 31: Configuring The Tone Generator

    Connection to the Network • Port A time slots: The signal from a selected time slot in Port A is sent to the ana- logue output. The signal from the analogue input is sent to one or various time slots in the Port A if the port is configured to do so. This configuration option is available only for the A-2048.

  • Page 32: Using The Auto-Configuration

    User Guide Port A or Port B Multiplexer block must (or Port C Multiplexer block, if you are using Ether.Genius) have one or various time slots set to Tone. The steps to follow to configure the tone generator are the following: 1.
  • Page 33 Connection to the Network The Summary panel contains a block diagram that indicates how the different tester blocks are connected and which is their current configuration. Connection between blocks depends on the current operation mode. Content of each block depends on the port specific configuration (Port A, Port B, Port C).

  • Page 34: Global Pass / Fail Indication

    User Guide If the mode is set to E1 monitor, the pattern generator is disconnected, there is no frame structure for the transmitter and the transmitter line signal is switched off. On the other hand, the receiver blocks are the same in E1 monitor and in E1 endpoint modes. If E1 through is selected as the operation mode, then the Demux and Mux blocks are connected to allow the time slots content to go from the receiver to the transmitter.

  • Page 35: Chapter 3: Testing Physical Properties

    Chapter 3 Testing Physical Properties The AT-2048 / Ether.Genius performs some basic testing that does not depend on the particular frame structure. These analogue tests include frequency, attenuation and round trip delay (RTD). Other family of related tests are performed not over the whole signal but on a specific time slot.
  • Page 36 User Guide You can configure a threshold for the analogue measurements. The received signal will be considered to be invalid if the line objectives are not met. To configure the line objectives, follow these steps: 1. From the Home panel, go to Test, The test configuration panel is displayed.

  • Page 37: Measuring Round-Trip Delay

    Testing Physical Properties Compliance status of the line resuits as per the configured line objectives is available in the summary screen (SUM key). Line results are compared with their thresholds and aggregated to the global Pass / Fail indication. Table 3.2: Line Results Result Description Attenuation...
  • Page 38 User Guide 2048 / Ether.Genius operation modes that support the delay measurement are the E1 endpoint, E1 through, Datacom endpoint and G.703 / E0 (AT-2048 only). Once the right operation mode has been chosen, to carry out the delay measurement test with your AT-2048 / Ether.Genius unit follow these steps.
  • Page 39 Testing Physical Properties Table 3.3: Delay settings and results Setting Description Enable Enables or disables the delay measurement. The delay measurement uses special test pattern bit marks that are detected as bit errors. If a measurement is started while the delay measurement is active, these errors will be recorded as normal bit errors.

  • Page 40: Itu-T G.711 Statistics

    User Guide Table 3.3: Delay settings and results Setting Description Minimum delay Minimum delay computed from the beginning of the test. This field stores the minimum value displayed in the Current delay field along a measurement started with RUN. If there is no test running, then this field shows the minimum delay of the last test.
  • Page 41 Testing Physical Properties 4. Modify the currently selected time slot with the help of the cursors and press enter to confirm your selection. Figure 3.3: Occupancy Grid panel G.711 results for the current time slot are displayed. Note: To read the frame occupancy grid and the G.711 results you don't have to start a measurement first.

  • Page 42: Voice Frequency Measurements

    User Guide Table 3.4: G.711 results Setting Description Avg. code Decimal number that represents the minimum code found in the current time slot in a time interval of one second. This number is referred to the 8-bit PCM code that repre- sents a G.711 A-law compressed voice sample.
  • Page 43 Testing Physical Properties want to display the pulse shape and assess compliance with ITU-T G.703 you have to follow these steps: Figure 3.4: AT-2048 / Ether.Genius pulse shape analysis panel 1. From the Home panel, go to Test The Test configuration panel is displayed. 2.
  • Page 44 User Guide screen and, if report generation is enabled, it will be stored in the corresponding report. Table 3.5: Pulse mask results Setting Description Level (V) This result is the pulse amplitude measured in Volt after a transition from 0 V and once this tension is considered to be stable.

  • Page 45: Chapter 4: Jitter Generation And Analysis

    Chapter 4 Jitter Generation and Analysis Jitter is defined as short-term variations of the significant instants of a digital signal from their reference positions in time. In other words, it is a phase oscillation with a frequency higher than 10 Hz. Jitter causes sampling errors and provokes slips in the phase-locked loops (PLL) buffers.

  • Page 46: Unitary Interval

    User Guide If we look at the amplitude of phase fluctuation with time as a periodic signal, when its frequency is higher than 10 Hz, the fluctuation is said to be fast, and this is jitter. Phase fluctuation is not usually a periodic signal in real cases, and for this reason we analyse the presence of frequency components in its spectrum above or below 10 Hz, to determine if what we have is jitter or wander.

  • Page 47: Measurement Interval

    Jitter Generation and Analysis In short, weighting the measurement using filters serves to determine the spectral content of jitter in each frequency band (pass bands of the programmed filters). These weightings allow conclusions to be drawn when problems appear, or even enable us to predict them.

  • Page 48: Jitter Analysis

    User Guide 4.2. Jitter Analysis This measurement attempts to obtain the jitter amplitude (expressed in UIs) present in the output port of a specific network equipment. The ITU-T specifies and limits the maximum amount of jitter allowed in a network. In particular, ITU-T G.825 (SDH) and G.823 (PDH), and Telcordia GR-253 (SONET) and GR-499 (T-carrier), limit the maximum amount of jitter in network equipment output ports.
  • Page 49 Jitter Generation and Analysis in an specific result panel but before obtaining valid results, the jitter analyser has to be configured form the Port A (or Port C, if you are using Ether.Genius) settings panel. The procedure for configuring the jitter analyser is as follows: Table 4.1: Phase measurement LEDs Event Description...
  • Page 50 User Guide 7. If you want to detect hits, enter the Hit threshold in UIpp. Table 4.2: Jitter analyzer settings Event Description Integration period This setting accounts for how much time is the jitter observed before displaying its value. The jitter measurement has a sliding window mechanism that is used to compute jitter peak-to-peak and rms values.
  • Page 51 Jitter Generation and Analysis Table 4.2: Jitter analyzer settings Event Description • None: It applies no filters to the output of the jitter meas- urement PLL. The whole band is taken into account by the tester. • LP: Applies the LP filter defined in ITU-T O.172 for jitter measurements.
  • Page 52 User Guide 4. Make sure that the PLL is tracking the phase of the incoming signal with the help of the PLL locked field. 5. Check the Current (pp) and RMS jitter amplitude values. 6. If you want to analyse the maximum jitter amplitude, the hit count and the hit sec- onds start a measurement with RUN or program a test.

  • Page 53: Jitter Generation

    Jitter Generation and Analysis Table 4.3: Jitter results Event Description Hit count Total number of hit events detected from the beginning of a test. A hit happens every time the jitter amplitude surpasses the user configurable hit threshold. The hit count measurement is controlled with the RUN but- ton.
  • Page 54 User Guide 3. Go to the Jitter generator menu. 4. Enable the jitter generator with the Enable control. 5. Set the Modulation waveform to Sinusoidal Note: Sinusoidal is the only waveform currently available for the jitter modulating signal. 6. Configure the frequency and amplitude of the jitter modulating signal. Note: Maximum amplitude depends on the frequency.

  • Page 55: Chapter 5: Wander Generation And Analysis

    Chapter 5 Wander Generation and Analysis When the phase fluctuation, presented by the signal received is fast enough, the circuits may not be able to track these fluctuations (absorb them). It is in such cases that the sampling instants of the clock obtained from the signal may not coincide with the correct instants, producing bit anomalies.

  • Page 56: Tdev

    User Guide peak value of the TIE. This can be repeated for different values of , thus obtaining a graph of MTIE (). TIE (ns) MTIE  Clock  MTIE (ns) MTIE  Figure 5.1: MTIE (): maximum peak-to-peak amplitude of the slow phase fluctuation or TIE in an observation window ...
  • Page 57 Wander Generation and Analysis phase fluctuation (ETSI specifications on the transfer of wander between the ports of a synchronization source - clock - specify this transfer in terms of TDEV). TIE (t) TDEV ( H (f) r.m.s.  Energy evaluation Band (0, 1/ ...

  • Page 58: Measuring Output Wander

    User Guide 5.2.Measuring Output Wander The AT-2048 computes the amount of wander present in the Port A input (Ether.Genius uses Port C for the same purpose) using the internal clock or an external 2048 kHz or 2028 kb/s reference signal. Measurements with external reference require connecting the DUT / SUT to the AT-2048 Port A and the reference one of the available reference inputs .
  • Page 59 Wander Generation and Analysis 7. Configure the Port A (or Port C), Connector, Line frame and Test pattern to the right values (See section 2.3). Table 5.2: Phase measurement LEDs Event Description This led indicates the presence or absence of a reference input signal.
  • Page 60 User Guide Table 5.3: Wander analysis results Event Description Offset Difference between the frequency of the received signal and the reference signal frequency measured in parts per million (ppm). Measurement of the frequency offset does not require to run a measurement. It is a permanent result that is available even if there is not an ongoing test.

  • Page 61: Wander Generation

    Wander Generation and Analysis 8. Check the final Max. offset and Max. drift results 5.3.Wander Generation Wander generation can be used to stress network elements and see how phase modulation is accumulated as it is propagated through the network. The ALBEDO AT- 2048 generates wander in the Port A only (Ether.Genius uses Port C for E1 wander generation).

  • Page 62: Measuring Mtie/Tdev

    User Guide Table 5.4: Wander generation settings Event Description Amplitude (pp) Sets the peak-to-peak amplitude of the modulating signal in time units. The maximum allowed value for this field depends on the Frequency. You can configure higher amplitude values if the frequency is smaller. Max.
  • Page 63 Wander Generation and Analysis Table 5.5: MTIE / TDEV settings Event Description Standard mask Selects the MTIE and TDEV mask to be used in the next measurement when Mask source is set to Standard. Masks belong to one of four different groups: •...
  • Page 64 User Guide Once the MTIE / TDEV measurement has been configured, it can be started at any time. To carry out and get the result follow these steps: Table 5.6: MTIE / TDEV results Event Description Time Observation time expressed in time units. Both for the MTIE and TDEV, this field represents the length of a time window.
  • Page 65 Wander Generation and Analysis 5. RUN or program a test start time. Note: Usually you will not need to program the test duration because MTIE / TDEV test have their own timing. If you set an stop time, the measurement the measurement may stop before it has really finished.
  • Page 66 User Guide...

  • Page 67: Chapter 6: Tests Over G.703 Signals

    Chapter 6 Tests over G.703 Signals 6.1.The E1 Frame The E1 frame defines a cyclical set of 32 time slots of 8 bits. The time slot 0 is devoted to transmission management and time slot 16 for signalling; the rest were assigned originally for voice/data transport.

  • Page 68: Frame Alignment

    User Guide 6.1.1. Frame Alignment In an E1 channel, communication consists of sending consecutive frames from the transmitter to the receiver. The receiver must receive an indication showing when the first interval of each frame begins, so that, since it knows to which channel the information in each time slot corresponds, it can demultiplex correctly.
  • Page 69 Tests over G.703 Signals 4) is put in the positions C (bits #1, frames with FAS) of the next submultiframe. At the receiving end, the CRC of each submultiframe is calculated locally and compared to the CRC value received in the next submultiframe. If these do not coincide, one or more bit errors is determined to have been found in the block, and an alarm is sent back to the transmitter, indicating that the block received at the far end contains errors.

  • Page 70: Signalling Channel

    User Guide the multiframe from 0 to 15, the E-bit of frame 13 refers to the submultiframe I (block I) received at the far end, and the E-bit of frame 15 refers to the submultiframe II (block II). 6.1.4. Signalling Channel As well as transmitting information generated by the users of a telephone network, it is also necessary to transmit signalling information.
  • Page 71 Tests over G.703 Signals 2. Select either Port A or Port B (or Port C, if you are using Ether.Genius) to enter in the port specific configuration menu. 3. Go tho Frame, to display the frame configuration menu. 4. Select RX Structure and configure the appropriate frame structure: unframed or framed, with or without CRC-4 parity check, with or without CAS multiframe.
  • Page 72 User Guide Table 6.1: Frame Settings Setting Description RX structure Sets the E1 frame structure for Port A, Port B (only if it port usage is set to E1) and Port C (Ether.Genius only) receivers. The available options are: • G.704: 2048 kb/s TDM frame made up of 32 time slots (TS0, TS1,..., TS31) of 64 kb/s each.
  • Page 73 Tests over G.703 Signals Table 6.1: Frame Settings Setting Description Multiplexer Configures the content of the E1 time slots for the transmitter. Signals and patterns are generated internally (pattern gener- ator, tone generator) or externally (codirectional, analogue, datacom or E1 interface). The Multiplexer is not available if the TX structure is set to Unframed.

  • Page 74: Using The Multiplexer And The Demultiplexer

    User Guide Table 6.1: Frame Settings Setting Description Demultiplexer Configures the content of the E1 time slots for the receiver. Signals and patterns either analysed internally (pattern ana- lyser) or forwarded to an external interface (codirectional, analogue or datacom). The Demultiplexer is not available if the RX structure is set to Unframed.

  • Page 75: Fas / Nfas Generation And Analysis

    Tests over G.703 Signals Note: Some content types are not allowed in more than one time slot simultane- ously. 3. Go to step 1 and continue until all the time slots have the desired value. Note: To configure the same content in all time slots you can use the Set all con- textual button (F1).

  • Page 76: Cas Generation And Analysis

    User Guide 2. Select either Port A or Port B (or Port C if you are using Ether.Genius) to enter in the port specific configuration menu. 3. Go tho Frame, to display the frame configuration menu. 4. Configure RX structure to either G.704+CRC or G.704+CAS+CRC. 5.
  • Page 77 Tests over G.703 Signals (G.704+CAS or G.704+CRC+CAS) in the transmitter. On the other hand, CAS analysis needs the previous configuration of a frame structure with CAS in the receiver. To display and set the CAS multiframe follow these steps: Figure 6.5: CAS generation and analysis panels: (a) CAS generation, signalling words for each are displayed in binary format, (b) CAS analysis with the 1010 value highlighted.

  • Page 78: Event Insertion And Analysis

    User Guide 8. Insert the configured ABCD value in the current time slot with ENTER. 9. Repeat the steps 6, 7, 8 until all the time slots have the correct ABCD values. Node: The Set all contextual button can be used to configure the current ABCD value for all the time slots at the same time.

  • Page 79: The Leds Panel

    Tests over G.703 Signals 6.5.1. The LEDs Panel The LEDs provide permanent information about the received signals for the test ports. They are permanent indicators. That means that no test has to be started to get the information from the LEDs. Figure 6.6: The AT-2048 / Ether.Genius LEDs panel.

  • Page 80: Defect And Anomaly Counters

    User Guide • : This is the colour displayed if anomalies are found in the signal. The particu- lar event corresponds with the LED label. • : This colour is displayed when a defect has been found in the signal. The particular event usually corresponds with the LED label.
  • Page 81 Tests over G.703 Signals Table 6.2: Anomaly Counters Event Description CRC Error. The CRC-4 code is computed by the receiver on each received CRC-4 multiframe block (eight regular E1 frames). If the computed code does not match the received one, an CRC is accounted. CRC is an indicator of transmission errors.
  • Page 82 User Guide Table 6.3: Defect Counters Event Description Alarm Indication Signal. It is defined as an all-1 line signal. All bits in the AIS, even the ones in the TS0, are set to ‘1’. The AIS indicates a failure in the transmission source that does not allow transmission of user data towards the destina- tion.

  • Page 83: The Event Logger

    Tests over G.703 Signals Table 6.3: Defect Counters Event Description MAIS Multiframe AIS. This alarm is raised in case that an all-1 line signal is detected within the TS16 when a frame structure with CAS multiframe is configured. The MAIS indicates a failure in the transmission source that does not allow transmission of CAS information toward the destination.
  • Page 84 User Guide Ether.Genius graphical representation tool or event logger. To enable the Event logger follow these steps. Figure 6.7: AT-2048 / Ether.Genius event looger panel. This panel traces 1. From the Home panel, go to Test, The Test configuration panel is displayed. 2.

  • Page 85: Event Insertion

    Tests over G.703 Signals (DAYS) with the help of the Zoom+ (F1 contextual key) and Zoom- (F2 contextual key). Use the F3 contextual key to switch between quick and slow event browsing. 6.5.4. Event Insertion Sometimes it is necessary to insert events (defects or anomalies) in the generated signal to stress the DUT/SUT.
  • Page 86 User Guide Table 6.4: Event Insertion Settings Event Description Pattern-level events Contains a lower level menu with insertion events classified as patter level. These events are: TSE, Slips, LSS, ALL 0, A LL1. To disable insertion of pattern-level events select none in this menu.

  • Page 87: Using The G.703 / E0 Port

    Tests over G.703 Signals Table 6.4: Event Insertion Settings Event Description Target port Sets the port where the event is going to be inserted. It is possible to insert events in the Port A, Port B or both at the same time.
  • Page 88 User Guide Tests available for codirectional drop / insert are the ones allowed in their operation modes. Tests for Codirectional endpoint emulation are similar that for E1 endpoint emulation (line results, anomaly and defect counts, BER and performance tests). The occupancy grid results doesn’t make sense for unframed signals and therefore these results are not available for codirectional endpoint emulation.

  • Page 89: Chapter 7: Ber And Performance Tests

    Chapter 7 BER and Performance Tests The bit error ratio (BER) is the most basic performance figure for TDM circuits. This chapter explains how to check the BER in the DUT / SUT. Despite being useful, the BER is not the only performance metric for TDM links. The ITU-T has defined several standards to assess the performance of TDM links.
  • Page 90 User Guide 4. If you have selected Word in step 3, enter the user-defined 32-bit pattern in RX Word in hexadecimal format. 5. Configure the TX Pattern block (test pattern generator) in the same way that the RX Pattern block just configured. 6.
  • Page 91 BER and Performance Tests added / dropped to / from the frame until Secondary is set in one or more slots within the Multiplexer / Demultiplexer block. Table 7.1: Test Patterns Setting Description TX Pattern Sets the transmitted test pattern. Patterns are either pseudo- random bit sequences (PRBSs) or fixed words.

  • Page 92: Computing The Ber

    User Guide 7.2.Computing the BER The most useful results for computing or at least estimating the BER are the TSE (only out-of-service measurements) and the ECRC. • Test Sequence Error (TSE) is a single bit difference between the transmitted and the received pattern.

  • Page 93: Testing Performance

    BER and Performance Tests 3. Enable the line objectives with the help of the Enable control 4. Enter the value for the TSE rate. Note: Port A and Port B share the same pattern objectives in the AT-2048. 7.3.Testing Performance The performance tests are useful to check how good is the performance of a TDM path in terms of bit errors and other defects and anomalies.
  • Page 94 User Guide 5. Configure the performance thresholds for the standard you have set in the previ- ous step by means the G.821, G.826 or M.2100 menu items (ES, SES, DM and UAS for ITU-T G.821, ES, SES, BBE and UAS for G.826 / M.2100). Table 7.2: ITU-T G.821, G.826 and M.2100 Objectives Setting Description...

  • Page 95: Running The Performance Test

    BER and Performance Tests If a performance test is configured and their objectives set, the result will be compared with these objectives and aggregated to the global Pass / Fail indication available in the summary screen (SUM key). 7.3.2. Running the Performance Test 1.
  • Page 96 User Guide Table 7.3: ITU-T G.821, G.826 and M.2100 Objectives Setting Description Severely Errored Second. A SES is defined as a second with a BER worse than 10 (ITU-T G.821, M.2100) or a second with 30% or more of errored blocks or at least a defect (ITU-T G.826).

  • Page 97: Chapter 8: Data Communications Testing

    Chapter 8 Data Communications Testing The AT-2048 / Ether.Genius defines two data communications operation modes. The Datacom endpoint is used for DTE and DCE emulation. Some capabilities of the Datacom endpoint mode are BER / Performance tests over datacom interfaces and logic analysis of datacom signals.
  • Page 98 User Guide 1. From the Home panel, go to Test, The Test configuration panel is displayed. 2. Select Mode and choose Datacom endpoint in the menu. 3. From the Home panel, go to Setup, The Setup configuration panel is displayed. Table 8.1: Datacom Line Settings Setting Description...
  • Page 99 Data Communications Testing Table 8.1: Datacom Line Settings Setting Description • G.703 / E0: Configures the ITU-T G.703 co-directional interface. This interface is available through an special adaptor for the DTE port. The G.703 / E0 datacom inter- face is available only for Ether.Genius. Operation of the G.703 / E0 in different in the AT-2048 (See section 2.3).
  • Page 100 User Guide Table 8.1: Datacom Line Settings Setting Description Nx64/56 factor If you have set Nx64 or Nx56 as the Bitrate, this field config- ures the value of N. N must be a positive integer value. The maximum allowed value of N depends on the current interface. User rate Data transmission rate in b/s.
  • Page 101 Data Communications Testing be raised. Isolated bit errors are displayed as TSE anomalies. Repeated or miss- ing bits in the test pattern are accounted as slips. 4. If you have selected Word in step 3, enter the user-defined 32-bit pattern in RX Word in hexadecimal format.

  • Page 102: Using The Circuit Map

    User Guide Tests for Datacom endpoint emulation are similar that for E1 endpoint emulation (line results, round trip delay, anomaly and defect counts, BER and performance tests). The occupancy grid results doesn’t make sense for unframed signals and therefore these results are not available for datacom endpoint emulation.
  • Page 103 Data Communications Testing Table 8.4: Datacom Defects Column Description Circuit Shows the circuit number assigned to the datacom circuit by the standards. Signal This is an alphanumeric identifier given to the circuit: It pro- vides a short description of the circuit assigned functionality. Activity Reports circuit activity.

  • Page 104: Dte And Dce Monitoring

    User Guide 6. Use the right / left cursor keys to switch the currently selected circuit status between the ON and OFF values. Figure 8.3: Circuit map analysis for the Datacom endpoint emulation and monitor modes. 8.2.DTE and DCE Monitoring The Datacom monitor mode can be used when it is wanted to monitor the datacom circuits between the DTE and DCE without disturbing them.

  • Page 105: Add / Drop Of E1 Tributaries To Datacom Interfaces

    Data Communications Testing datacom BER or performance require a test pattern. In monitor mode, the transmitter is disabled but the analysis test pattern still has to be configured. To do that, follow the same procedure that for the Datacom endpoint mode (See section 8.1). Once the mode has been set to Datacom monitor, the datacom interface has been configured and the test pattern is ready, the test can be started by pressing the RUN key.

  • Page 106: Ieee C37.94 Testing

    User Guide within the Demultiplexer menu. However, it is possible to configure several time slots under the Multiplexer menu. If the number of Multiplexer time slots is larger than one, the same datacom signal will be replicated in each of the selected time intervals.

  • Page 107: Connection To The Network And Configuration

    Data Communications Testing Emulation and testing of IEEE C37.94 interfaces is available through the ALBEDO Ether.Genius unit with the help of the AT-89 adaptor. The AT-89 is not compatible with the AT-2048 model. Power distribution Power distribution network network Relay Relay Digital IEEE C37.94...

  • Page 108: Measuring Frequency And Bit Rate

    User Guide 1. From the Home panel, go to Test, The Test configuration panel is displayed. 2. Select Mode and choose Datacom endpoint in the menu. 3. From the Home panel, go to Setup, The Setup configuration panel is displayed. 4.

  • Page 109: Event Generation And Analysis

    Data Communications Testing for IEEE C37.94 (See section 8.4.1), it is necessary to configure test pattern (See section 8.1). Loopback AT-2048 E1 / Datacom Tester BACK Digital IEEE C37.94 ENTER transmission HOME network EVENT LEDS Ether.Genius Digital multiplexer Teleprotection Digital multiplexer equipment Figure 8.8: This illustration explains how to connect the Ether.Genius to carry out a BER test.

  • Page 110: Measuring Round Trip Delay

    User Guide synchronization (LSS), all zeroes (ALL0), all ones (ALL1), slips and test sequence errors (TSE). Again, event analysis is similar to datacom event analysis. Event information is available through software LEDs (See section 6.5.1) or result tables (See section 6.5.2).

  • Page 111: Chapter 9: Test Management

    Chapter 9 Test Management This chapter describes all those features available in your test unit that are not directly related with configuring your tester or reading measurement results but they are important for proper test management. Specifically, configuration and result management, report generation and test platform settings are covered in the following sections.
  • Page 112 User Guide If report generation is enabled, a new report is generated each time a test finishes either by pressing the run button or automatically. Reports are available as standard text or PDF files from the USB slave connector. Table 9.1: Report Files Panel Setting Description Internal memory...

  • Page 113: File Management

    Test Management Table 9.1: Report Files Panel Setting Description Report header This menu item enables you to configure report data that will be stored with the test result. These data identify the report, customer, and also includes some other relevant information. •...

  • Page 114: Saving Configurations

    User Guide 9.2.1. Saving Configurations To store the current configuration follow these steps: 1. From the Home panel, go to File, The tester file manager base menu is displayed. 2. Select Configuration files to go to the configuration file settings. 3.

  • Page 115: Exporting Files To External Devices

    Test Management 3. Select the location of the file you want to delete: Internal memory, or External devices. Note: If you select External devices, you will be asked to choose the specific stor- age device (USB device or SD card). Note: If there is no external device connected to the AT-2048 / Ether.Genius unit, a No devices present popup panel is displayed.

  • Page 116: Using The Embedded Web Server

    User Guide Note: If there is no external device connected to the AT-2048 / Ether.Genius unit, a No devices present popup panel is displayed. 4. Select the configuration files you want to import with the help of the cursors and the ENTER button.

  • Page 117: Programming Tests

    Test Management To use the web interface you need to connect the platform network connector to the management network and configure the management Ethernet interface (See section 9.4.1). Once you have done this, follow this procedure: 1. Open a browser in a computer with network connection. 2.
  • Page 118 User Guide Table 9.2: System Settings Panel Setting Description Duration Sets the duration of the next measurement. The available test durations are: 15 minutes, 1 hour, 1 day, 7 days, 30 days or user configurable duration. Setting up Duration requires previous configuration of Stop Mode to Auto.

  • Page 119: Using The System Menu

    Test Management 9.4.Using the System Menu The System menu includes platform wide settings organized in four different submenus: Table 9.3: System Settings Panel Setting Description Brightness (%) Sets the screen brightness from 10% to 100%. Within the Brightness panel, the left and right cursors are used to set the correct value and a contextual key (Done) is used to con- firm selection.

  • Page 120: Using The Network

    Model Name Shows the test unit model name. It must be AT-2048 for the ALBEDO Telecom AT-2048 E1/Datacom Tester and Ether.Genius for the ALBEDO Telecom Ether.Genius GbE / E1 / Datacom / Jitter & Wander Tester. Serial number Displays the test unit serial number. It is a 8 character alpha-...
  • Page 121 • Maintenance and factory configuration: The ALBEDO Telecom staff use the Ether- net interface to configure or verify the equipment in the factory. This feature is not available to ordinary users.
  • Page 122 User Guide 3. Go to the Ethernet interface. 4. Enable the platform network interface with the Enable interface control. 5. Enable DHCP with the Use DHCP control if you want to let DHCP to configure your IP settings automatically or disable it to configure an static IP profile. 6.

  • Page 123: Installing Software Options

    The system configuration panel is displayed. 2. Select Licensing to enter in the software upgrade menu. 3. Enter the number and key supplied by your ALBEDO Telecom representative in License number and License key. 4. Enable the new software options with the Activate control.

  • Page 124: Using The Remote Control

    OS in the market. Some of them are free. The remote control is an optional feature for AT-2048 / Ether.Genius that is supplied by ALBEDO Telecom with an special license. Before using the remote control you need to configure the platform Ethernet interface and connect the equipment to the management network (See section 9.4.1).
  • Page 125 Test Management Table 9.8: Remote Control Keys Description Home It is equivalent to the HOME key. It displays the Home panel. It is equivalent to the Esc key. It leaves the current panel and displays the previous one in the panel hierarchy. Enter It is equivalent to the ENTER key.
  • Page 126 User Guide...

  • Page 127: Appendix A Technical Specification

    Appendix A Technical Specification A.1. E1 Generation / Analysis A.1.1. Connectors Port A: Unbalanced (BNC) 75  and balanced (RJ-45) 120  (AT-2048 only). • Port B: Balanced (RJ-45) 120  (AT-2048 only). • Port C: Unbalanced (BNC) 75  and balanced (RJ-45) 120  (Ether.Genius only). •...

  • Page 128: Test Patterns And Signals

    User Guide A.1.4. Test Patterns and Signals • PRBS 9 (ITU-T O.150, O.153), PRBS 11 (ITU-T O.150, O.152, O.153), PRBS 15 (ITU-T O.150, O.151), PRBS 20 (ITU-T O.150, O.153), PRBS 23 (ITU-T O.150, O.151), PRBS 9 inverted, PRBS 11 inverted, PRBS 15 inverted, PRBS 20 inverted, PRBS 23 inverted, all 0, all 1.

  • Page 129: Jitter Analysis Function

    • Modulation amplitude: 0 – 1000 Uipp. Maximum depends on modulation fre- quency. • Modulation amplitude resolution: 1 mUIpp or 1/10 configured value. • Modulation amplitude accuracy: better than O.172. • Smooth amplitude changes in jitter range (10 Hz – 100 kHz). •...

  • Page 130: Itu-T G.703 / E0 Interface

    User Guide A.2. ITU-T G.703 / E0 Interface • The ITU-T G.703 / E0 interface is available only for the AT-2048 A.2.1. Connector Balanced (RJ-45) 120 . • • Clock interface for ITU-T G.703 contradirectional and centralized interfaces is pro- vided through external adapter.

  • Page 131: Frame Relay Monitoring

    A.4. Frame Relay Monitoring A.4.1. Interfaces • X.21/V.11 from 50 b/s to 2048 kb/s. • V.35 from 50 b/s to 2048 kb/s. • V.36 (RS-449) from 50 b/s to 2048 kb/s. • EIA-530 / EIA-530A from 50 b/s to 2048 kb/s. A.4.2.

  • Page 132: Synchronization

    User Guide A.7. Synchronization • Internal clock reference. • External reference clock: 2,048 kb/s (ITU-T G.703), 2,048 kHz. • Configurable input gain: 0 dB, -20 dB. A.8. General • Operation time with batteries: 4.5 hours (AT-2048, minimum, one battery pack). •...

  • Page 133: Appendix B Accessory Specification

    Appendix B Accessory Specification B.1. AT-80 VF Adapter This adapter enables connection transmission of audio signals to / from the AT-2048 unit. Audio input is codified and sent either to the PCM analyser or added to one or several E1 time slots. The audio output can be connected to the AT-2048 tone generator or an audio signal dropped from an E1 time slot.

  • Page 134: Codirectional Adapter

    User Guide B.2. AT-81 Codirectional Adapter This adapter is suitable for conversion of the AT-2048 Port B RJ-48 connector to 4 mm banana connectors compatible with Siemens connector. This adapter does not perform any impedance or balanced / unbalanced conversion. It is just a connector adapter. Ether.Genius does not includes support for the ITU-T G.703 codirectional adapter and therefore, this accessory is not compatible with this equipment.

  • Page 135: Contradirectional Clock Adapter

    B.4. AT-82 Contradirectional Clock Adapter The AT-82 is connected to the Datacom port when Port B is configured in Contradirectional or Centralized modes. In this case, the adapter supplies an encoded clock to an external device or it accepts an external clock source.. Ether.Genius does not support the contradirectional and centralized interfaces and therefore, the AT-82 adapter is not compatible with this tester.

  • Page 136: Stereo Audio Adapter

    User Guide adapter does not perform any impedance or balanced / unbalanced conversion. It is just a connector adapter. B.6. AT-86 Stereo Audio Adapter 3.5 mm jack Stereo audio input 3.5 mm jack 2.5 mm jack Stereo audio Mono audio input output Figure B.5: AT-86 Stereo audio adapter for AT-2048 / Ether.Genius...
  • Page 137 no signal output is required. For example, it can be used for bidirectional monitoring or for connection of an unbalanced clock input. B.8. AT-91 Synchonization Adapter The AT-91 Syncronization adapter supplies the following clock reference inputs and outputs to Ether.Genius: •...
  • Page 138 The AT-89 adapter enables connection of an IEEE C37.94 interface to Ether.Genius. This accessory is connected to the Ether.Genius DTE port and it requires an special SPF transceiver to be supplied by ALBEDO Telecom. The AT-89 adapter is not compatible with the AT-2048 model...

  • Page 139: Appendix C Connector Pinouts

    Appendix C Connector Pinouts This appendix provides the AT-2048 connector pinouts. C.1. Smart Serial DTE / DCE Connectors Signal (DTE) Signal (DCE) DSR+ DTR+ CTS+ RTS+ CTS- RTS- RTS- CTS- RTS+ CTS+ SS26 Female DTR+ DSR+ DCD+ DCD+ TTC+ SS26 Female TTC+ TTC- TTC-...

  • Page 140: Audio Connector (2.5 Mm Jack)

    User Guide C.2. Audio Connector (2.5 mm Jack) Signal Speaker Microphone Audio Figure C.2: Audio connector (2.5 mm jack). C.3. Printer / Console Connector (RJ-45) Signal Printer/Console Figure C.3: Printer / Console connector (RJ-45) C.4. Balanced TX / RX Ports (RJ-45) Port A Port B Signal...

  • Page 141: Appendix D Datacom Cable Pinouts

    Appendix D Datacom Cable Pinouts This appendix provides cable pinouts of datacom cables compatible with AT-2048. These cables can be supplied by ALBEDO Telecom, by an external supplier or manufactured by the customer. D.1. V.24 / V.28 Adaptor Cables DB25...
  • Page 142 User Guide D.2. X.21 / V.11 Adaptor Cables DB15 DB15 Male Female Circuit Signal Description DB15 Data transmit (DTE to DCE) Data reception (DCE to DTE) Control Indication Clock Figure D.2: X.21 / V.11 Adaptor Cables D.3. V.35 Adaptor Cables M/34 M/34 Male...

  • Page 143: Adaptor Cables

    D.4. V.36 Adaptor Cables DB25 DB25 Circuit Signal Description DB37 Male Female Data transmit (DTE to DCE) Data reception (DCE to DTE) RTS+ Request to send RTS- CTS+ Ready for sending CTS- Data set ready Data terminal ready Data within limits TTC+ Timing for receiving in 103 TTC-...

  • Page 144: Eia-530A Adaptor Cables

    User Guide D.6. EIA-530A Adaptor Cables Circuit Signal Description DB25 Data transmit (DTE to DCE) DB25 DB25 Male Female Data reception (DCE to DTE) RTS+ Request to send RTS- CTS+ Ready for sending CTS- Data set ready Data terminal ready DCD+ Data within limits DCD-...

Table of Contents