IST 878 Quick Start Manual

DRIVING CONDITION IN FUNCTIONAL TEST
Ic ≤ 10 ma
LOW DRIVE
Ib ≤ 0.9 ma
Ic ≤ 350 ma
HIGH DRIVE
Ib ≤ 75 ma
DRIVING PULSE ≤ 300 us
CONSTANT CURRENT SOURCE
RANGE LOW HIGH
1 3 ma 50 ma
2 10 ma 150 ma
3 30 ma 400 ma
4 35 ma 500 ma
5 40 ma 650 ma
6 50 ma 750 ma
7 70 ma 1000 ma
DUT OUTPUT LEVEL THRESHOLD LEVEL
LOGIC OUT-CIRCUIT IN-CIRCUIT
HIGH 11.0 V 6.80 V
LOW 1.18 V 2.20 V

DIODE FORWARD VOLTAGE (Vf) MEASUREMENT

MIN. Vf > 0.1 V WITH FORWARD CURRENT FROM 50 ma
to 1,000 ma

ZENER DIODE BREAKDOWN VOLTAGE (Vz)

FROM 0.1V TO 30V WITH BIAS CURRENT FROM 3 ma TO 80 ma
VOLTAGE REGULATOR OUTPUT VOLTAGE (+/- Vo)
FROM 0.2 V to 26.0 V WITH OUTPUT LOADING CURRENT FROM
50 ma to 1.0 AMP

ACCESSORIES FURNISHED:

• 120 V or 220 V AC POWER ADAPTOR
• INSTRUCTION MANUAL
• THREE POINT PROBING DEVICE FOR IN-CIRCUIT TESTING
• TEST SOCKET ADAPTOR FOR TESTING SMD PACKAGES

OPTIONAL ACCESSORIES:

• THREE COLOR CODED TEST LEADS w/MINI PLUGS & TEST CLIPS
• TEST SOCKET ADAPTOR FOR TESTING OPTOISOLATORS
• HEAVY DUTY TEST SOCKET ADAPTOR FOR HIGH VOLUME
PRODUCTION TEST
Information Scan Technology, Inc.
IST
487 Gianni St., Santa Clara, California 95054
Phone: 408.988.1908
Fax: 408.980.1794
Web: www.infoscantech.com
IST MODEL 878

TECHNICAL SPECIFICATIONS

PARAMETERS FOR LEAKAGE CURRENT MEASUREMENT

BIPOLAR / MOSFET TRANSISTORS: Ices, Iceo, Icbo, & Idss
DIODE: Ir THYRISTOR (SCR/TRIAC): Idrm
TEST RANGE RESOLUTION ACCURACY GIVEN VOLTAGE
*
0-400 uA 0.1 nA +/- 2% 0-1,099 V Programmable
0-4 uA 1 nA +/- 1% 0-1,099 V Programmable
0-40 uA 10 nA +/- 1% 0-1,099 V Programmable
0-400 uA 100 nA +/- 1% 0-1,099 V Programmable
0-4 mA 1 uA +/- 1% 0-1,099 V Programmable
0-40 mA 10 uA +/- 1% Not Available

MOSFET AND J-FET LEAKAGE CURRENT MEASUREMENTS

MOSFET: Igss J-FET: Idss, Igss
TEST RANGE RESOLUTION ACCURACY GIVEN VOLTAGE
*
0-400 uA 0.1 nA +/- 2% 0-30 V Programmable
0-4 uA 1 nA +/- 1% 0-30 V Programmable
0-40 uA 10 nA +/- 1% 0-30 V Programmable
0-400 uA 100 nA +/- 1% 0-30 V Programmable
0-4 mA 1 uA +/- 1% 0-30 V Programmable
0-40 mA 10 uA +/- 1% 0-30 V Programmable

PARAMETERS FOR BREAKDOWN VOLTAGE MEASUREMENT

BIPOLAR / MOSFET TRANSISTORS: BVceo, BVces, BVcbo, & VBdss
DIODE: BVr THYRISTOR: BVdrm
TEST RANGE RESOLUTION ACCURACY GIVEN CURRENT
0-30 V 0.03 V +/- 1% 0-40 mA auto-ranging
30-1,099 V 1.05 V +/- 1% 0-4 mA auto-ranging

HIGH VOLTAGE SUPPLY

Max Output Voltage: 1,099 V
Max Output Wattage: 3 W
* - Autoranging

DIMENSIONS:

9.2" WIDE x 6.3" DEEP x 2.8" HIGH (23.3 cm x 16 cm x 7.1 cm)

SHIPPING WEIGHT:

7.5 lbs (3.4kg)

AC/AC POWER ADAPTOR:

INPUT: 120 VAC or 220 VAC +/- 5% 50/60 Hz
OUTPUT: 36 VAC with C.T. 800mA Max.
MODEL 878
IST
PROGRAMMABLE PARAMETRIC TESTER
FOR SEMICONDUCTOR DEVICES
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit
testing for a wide range of discrete semiconductors including:
• Bipolar Transistors • Zener Diodes
• MOSFETs • Junction FETs
• IGBTs • SCRs
• Diodes • TRIAC
• Optoisolators
• Voltage Regulators
• TVS (Varistors,
SIDACs)