Built-In Test; Cbit (Continuous Built-In Test); Ibit (Initiated Built-In Test) - Curtiss-Wright CNS4 CSfC User Manual

User Guide
[health]
SYSTEM: Date=04/01/2018 Time=00:00:01 Firmware Ver=1.1 CNS
Ver=2.42-car
Power Supply Temp 1 = 46 C Temp 2 = 38 C
Main Board Temp Bot 1 = 38 C Temp Bot 2 = 39 C
Main Board Temp Top 1 = 36 C Temp Top 2 = 40 C
flash=rw Boot Flash=rw FSM EEPROM=rw pbit_status=OK
|----------------------- FSM Status ----------------------|
| | Temp |
|--------|------|-------|-------|---------- |-------------|
| FSM0 | 35 C | 4.87V | 3.29V |
| FSM1 | 34 C | 4.87V | 3.31V |
| FSM2 | 35 C | 4.89V | 3.29V |
| FSM3 | 35 C | 4.87V | 3.30V |
|---------------------------------------------------------|
ETH_0: ip=192.168.0.1 link=1000Mb/s status=OK
ETH_1: ip=192.168.1.1 link=1000Mb/s status=OK
ETH_2: ip=192.168.2.1 link=1000Mb/s status=OK
ETH_3: ip=192.168.3.1 link=1000Mb/s status=OK
|----------------------- ILE Status-----------------------|
| Voltages
|------|--------------------|-----------------------------|
|Temps | 5V | 3.3V | 1.8V | Zero | Key | Tamper | Alarm |
|------|------|------|------|------|-----|--------|-------|
|38,40 | 4.94V| 3.31V| 1.81V|
|---------------------------------------------------------|
[!health] OK
The ILE status is shown at the bottom of the text box above. The value for each of the ILE status
items will have a value of 1 or 0.
• Zero = 1, the ILE is currently zeroizing. Will get reset back to 0 when zeroization is complete.
• Key = 1, the key is present on the ILE. Key= 0, key is absent.
• Tamper = 1, the ILE has lost the key. Tamper=0, all is well.
• Alarm = 1, the ILE is in an error state, run the cm_log command to determine the problem.
While the ILE is in the error state, the user will be locked out of the ILE account. Depending on the
reason of the hard error state, the only way to overcome the lockout is to power cycle or zeroize
the ILE.
6.2.6

Built-In Test

The built-in tests monitor CNS4 health. If any of the monitored items listed below fails, a
description of the failure is written to a log file. See paragraph 11.2.19 log for additional
information.
6.2.6.1

CBIT (Continuous Built-In Test)

The following items are monitored by the CBIT. The CBIT runs in the background and cannot be
initiated by the user. If any item is outside of tolerance range, the CNS4 S0 LED will illuminate.
See log paragraph 11.2.19 log for information on how to determine the error.
• Main Carrier Temperature.
• Power Supply Temperature.
• FSM-C Voltage Levels (5V & 3.3V rails).
• Super I/O Voltage (3.3V & 12V rails, plus two Marvell controller voltage levels).
• Processor (CPU Voltage, 12V & 5V rails, plus the AA sized battery voltage).
6.2.6.2

IBIT (Initiated Built-In Test)

The following items are monitored by the IBIT. The IBIT must be initiated by the user using the ibit
command. If any item is outside of tolerance range, the CNS4 S0 LED will illuminate. In addition,
the ibit report will show the error. Refer to paragraph 11.2.19 log and paragraph 11.2.15 ibit for
more information.
CNS4 CSfC
5V | 3.3V | Fault LED | Status LED |
OFF
OFF
OFF
OFF
|
0 | 1
| OFF |
| OFF |
| OFF |
| OFF |
Status |
| 0 | 0 |
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DDOC0108-000-A2
Operation
Revision 1.0