Test Circuit - Toshiba TA8266HQ Description And Application Manual

Test Circuit

0.22 µF
0.22 µF
0.22 µF
0.22 µF
PRE-GND
1
TAB V
IN1
11
C
1
IN2
12
C
1
0.22 µF
AUX IN
16
C
6
IN3
15
C
1
IN4
14
C
1
13
RIP STBY
10 4
20 6
V
CC1 CC2
OUT1 (+)
9
PW-GND1
8
OUT1 (−)
7
OUT2 (+)
5
PW-GND2 2
OUT2 (−)
3
OUT3 (+)
17
PW-GND3
18
OUT3 (−)
19
OUT4 (+)
21
PW-GND4
24
OUT4 (−)
23
DIAGNOSIS
OUT MUTE
25 22
9
TA8266HQ
R
L
R
L
R
L
R
L
: PRE-GND
: PW-GND
2006-04-28