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4.4 Charging Trouble
TEST POINT
CIRCUIT
CUR_MON
CHG_EN
CHG_EN_IO
Figure 4-4
VUSBIN
C717
R712
R713
NA
0
10K
R749
0
(GPIO_0)
R748
R714
R715
C718
10K
39K
10K
1u
4. TROUBLESHOOTING
R714
U401
U701
D401
VCHARGE
Charging IC
VBAT
D700
CUS02
U701
ISL6299
1
10
CRDL
BAT
2
USB
6
3
IMIN
_PPR
4
_CHG
9
ICDL
7
8
USBON
GND
5
11
_EN
PGND
C719
R716
1u
100K
- 67 -
2V8_VEXT
R711
10K
CHG_STAT
(GPIO_1)
C720
1u
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