Samsung SP0211N Service Manual page 14

Palo(p80)series
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SAMSUNG HARD DISK DRIVE
③ Maintenance Cylinder Check(M/C): Read Maintenance cylinder from the number of 0 to the last.
→ In case of "MC", remark "failure" when error happened in one time.
④ Media Check
: Read from OD to ID region same as the existing read test function and progress "D/F"
whenever defect occurred.
ⓐ Auto Defect Free: Reading along OD to ID region, progress "D/F" promptly if defect occurred.
Read the next sector if no defect occurred and progress D/F if defect occurred.
When we don't have any more cylinder space for D/F, stop progressing D/F and then remark
defect status for the next 30 defects occurred from the D/F stopping location.
ⓑ Remark failure:
- If the number of defects are same in OD,MD,ID region
→ remark failure in order of OD > MD > ID.
- If the number of defects are different in OD,MD,ID region
→ remark failure in region have the most defects among OD,MD,ID region
□□ continuousness: Continuous scratch more than 15 cylinders
□□ divergence: Divergent scratch less than 15 cylinders
⑤ Test OK: Remark "Test OK" if no problem occurred when test done.
If it passed due to D/F, remark "Defect free by pass~" and show the corresponding
failure region in the below. At this time, input the code of failure region shown
and the control code 'is a "Defect controlled".
※ Display Read time with checking during Read test,
(Stop reading if expecting read time exceeded +10 when 50 % tested.)
4) HUTIL Error message
① Error messages
- ECC ERROR: Where the data was written (data writing dimension in sector, data zone)
occur physical damage (hard related error: disk ding by head caused by impact
and vibration) or logical damage. (soft related error: error is occurred during
writing) Logical error(damage) could be cured by re-writing.
- DATA AM NOT FOUND ERROR: Damaged address mark(AM:current address information of data)
- ABORTED COMMAND: Message when HDD can't recognize the fixed order in program.
PALO
among the structure of sectors, containing the logical and physical
defect.
(PCBA failure or HDA failure.)
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