Table of Contents
Advertisement
Quick Links
Advertisement
Table of Contents
Related Manuals for Agilent Technologies 54657A
Summary of Contents for Agilent Technologies 54657A
- Page 1 User’s Guide Publication Number 54657-97019 August 2000 For Safety information, Warranties, and Regulatory information, see the pages behind the index © Copyright Agilent Technologies 1991-1996, 2000 All Rights Reserved Agilent 54657A, 54658A, and 54659B Measurement/Storage Modules...
- Page 2 The Agilent 54657A, 54658A, and 54659B Measurement/Storage Modules provide additional measurement and storage capabilities to the Agilent 54600–Series oscilloscopes. The 54657A has a GPIB interface and the 54658A has a RS-232 interface. The 54659B has a RS-232 interface plus an additional parallel output connector which allows the module to be connected to both an RS-232 controller and a parallel printer at the same time.
- Page 3 Accessories available • 34810B BenchLink/Scope software package. • 10833A 1 meter (3.3 feet) GPIB cable. • 10833B 2 meter (6.6 feet) GPIB cable. • 10833C 4 meter (13.2 feet) GPIB cable. • 10833D 0.5 meter (1.6 feet) GPIB cable. • 13242G 5 meter (16.7 feet) RS-232 cable for printer/plotter and HP Vectra 25-pin serial port.
- Page 4 In This Book This book is the user’s guide for the Agilent 54657A, 54658A, and 54659B Measurement/Storage Modules, and contains three chapters. Installation Chapter 1 contains information concerning installation and interconnection of the Measurement/ Storage Modules. Operating the Measurement/Storage Module Chapter 2 contains a series of exercises that guide you through the operation of the Measurement/Storage Modules.
- Page 5 Installation Operating the Measurement/ Storage Module Reference Information Index...
-
Page 7: Table Of Contents
Contents 1 Installation Oscilloscope Compatibility 1–2 To install the Measurement/Storage Module 1–3 To configure the interface 1–4 2 Operating the Measurement/Storage Module Math Functions 2–3 Function 1 2–4 Function 2 2–5 FFT Measurement 2–8 Automatic Measurements 2–14 Setting Thresholds 2–15 To make delay measurements automatically 2–19 To make phase measurements automatically 2–21 To make additional voltage measurements automatically 2–23... - Page 8 Contents 3 Reference Information Operating Characteristics 3–3 Index Contents–2...
-
Page 9: Installation
Installation... -
Page 10: Oscilloscope Compatibility
Interface Modules for Agilent 54600-Series Instruments I/O Function Guide shipped with your module. Oscilloscope Compatibility 54657A and 54658A These modules are compatible with all Agilent 54600-series oscilloscopes except 54600A, 54601A, and 54602A oscilloscopes with an operating system version lower than 2.2. If your 54600A, 54601A, or 54602A oscilloscope has an earlier operating system, it can be updated using upgrade kit HP part number 54601-68702. -
Page 11: To Install The Measurement/Storage Module
Installation To install the Measurement/Storage Module To install the Measurement/Storage Module Turn off the oscilloscope. Install the module as shown below. The oscilloscope is reset after installation. The installed module is reflected in the message displayed when you turn on the oscilloscope. Figure 1–1 Installing the Measurement/Storage Module 1–3... -
Page 12: To Configure The Interface
To configure the interface The Measurement/Storage Module can be connected to a printer, a plotter, or a computer through the interface. The 54657A has an GPIB interface and the 54658A has an RS-232 interface. The 54659B has an RS-232 interface... - Page 13 Installation To configure the interface 54658A Serial Connections The signals for the RS-232 port on the 54658A are listed below. Pin Number Signal Transmit Data Receive Data Request to Send Clear to Send Data Set Ready Signal Ground Data Carrier Detect Data Terminal Ready SHELL Protective Ground...
- Page 14 Installation To configure the interface Printer/plotter/ 13242G/17255M 54658A Figure 1– 3 controller Cable Module 25-pin 25-pin 25-pin 25-pin female male male female 54645b09.cdr Pin out of 13242G/17255M RS-232 cable 54658A 24542G Figure 1– 4 Controller Module Cable 9-pin 9-pin 25-pin 25-pin male female...
- Page 15 Installation To configure the interface 54659B Serial Connections The signals for the 9-pin RS-232 port on the 54659B are listed below. Pin Number Signal Data Carrier Detect Receive Data Transmit Data Data Terminal Ready Signal Ground Data Set Ready Request to Send Clear to Send Ring SHELL...
- Page 16 1–8...
-
Page 17: Operating The Measurement/Storage Module
Operating the Measurement/Storage Module... - Page 18 Operating the Measurement/Storage Module This chapter provides you with the information necessary to use the additional, or enhanced features that the Measurement/Storage Module provides. Basic operation for the oscilloscope is covered in the User and Service Guide for your oscilloscope. This chapter provides you with practical exercises and detailed information designed to guide you through operation of the following functions:...
-
Page 19: Math Functions
Operating the Measurement/Storage Module Math Functions Math Functions Without the Measurement/Storage module installed, addition and subtraction are the only math operations provided. In addition to the limited selections, the single function is performed on the pixel position of the data on the screen. -
Page 20: Function 1
Operating the Measurement/Storage Module Function 1 Function 1 Press ± Toggle the softkey to enable math function number 1. Function 1 On Off Press the softkey Function 1 Menu A softkey menu with four softkey choices appears. Three of them are related to the math functions. -
Page 21: Function 2
Operating the Measurement/Storage Module Function 2 Function 2 Function 2 will plot differential or integral waveforms, or perform an FFT using the input signals connected to the vertical inputs (1 and 2), or using the function 1 waveform. Press ± Toggle the softkey to enable math function number 2. - Page 22 Operating the Measurement/Storage Module Function 2 The integrate calculation is relative to the currently selected source’s input offset. The following examples illustrate any changes in offset level. Figure 2– 1 Integrate and Offset • FFT (Fast Fourier Transform) inputs the digitized time record of the source and transforms it to the frequency domain.
- Page 23 Operating the Measurement/Storage Module Function 2 Press the (differentiate and integrate) or (FFT) softkey Offset Ref Levl and rotate the knob closest to the key to set the offset Cursors (from the center graticule) or reference level (top graticule) of the resulting waveform.
-
Page 24: Fft Measurement
Operating the Measurement/Storage Module FFT Measurement FFT Measurement Operating System Requirements Refer to "Oscilloscope Compatibility" on page 1-2 for operating system requirements for FFT operation. FFT (Function 2) is used to compute the fast Fourier transform using vertical inputs (1 and 2), or the Function 1 waveform. This function takes the digitized time record of the specified source and transforms it to the frequency domain. - Page 25 Operating the Measurement/Storage Module FFT Measurement Aliasing When using FFT’s, it is important to be aware of aliasing. This requires that the operator have some knowledge as to what the frequency domain should contain, and also consider the effective sampling rate, frequency span, and oscilloscope vertical bandwidth when making FFT measurements.
- Page 26 Operating the Measurement/Storage Module FFT Measurement Spectral Leakage The FFT operation assumes that the time record repeats. Unless there is an integral number of cycles of the sampled waveform in the record, a discontinuity is created at the end of the record.
- Page 27 Operating the Measurement/Storage Module FFT Measurement • Cent Freq Allows centering of the FFT spectrum to the desired frequency. Select and rotate the knob closest to the key to set the Cursors center frequency to the desired value. • Freq Span Sets the overall width of the FFT spectrum (left graticule to right graticule).
- Page 28 Operating the Measurement/Storage Module FFT Measurement The following FFT spectrum was obtained by connecting the front panel probe adjustment signal to input 1. Set Time/Div to 500 s/div, Volts/Div to 100 mV/div, Units/div to 10.00 dB, Ref Level to –10.00 dBV, Center Freq to 6.055 kHz, Freq Span to 12.21 kHz, and window to Hanning.
- Page 29 Operating the Measurement/Storage Module FFT Measurement FFT Measurement Hints – Continued While the FFT spectrum is displayed, use the and Cursor keys to switch between measurement functions and frequency domain controls in FFT menu. See the end of the manual for display menus. Decreasing the effective sampling rate by selecting a slower sweep speed will increase the low frequency resolution of the FFT display and also increase the chance that an alias will be displayed.
-
Page 30: Automatic Measurements
Operating the Measurement/Storage Module Automatic Measurements Automatic Measurements With the Measurement/Storage Module installed, the oscilloscope is capable of making five additional automatic voltage and time measurements. • Delay Measurements • Phase Measurements • Voltage Amplitude • Voltage Overshoot • Voltage Preshoot In addition to the measurements, the thresholds used for automatic time measurements are user-selectable. -
Page 31: Setting Thresholds
Operating the Measurement/Storage Module Setting Thresholds Setting Thresholds Without the Measurement/Storage module installed, rise time and fall time measurements are performed at the 10%/90% threshold levels. The remaining five time measurements (frequency, period, duty cycle, positive pulse width, and negative pulse width) are all performed at the 50% transition point. - Page 32 Operating the Measurement/Storage Module Setting Thresholds Figure 2– 5 User Thresholds Press Time Press the softkey until the softkey is Next Menu Define Thresholds displayed on the far left side. Press the softkey. Define Thresholds Press the desired Thresholds softkey. A softkey menu with six softkey choices appears.
- Page 33 Operating the Measurement/Storage Module Setting Thresholds • Voltage Rise time/fall time measurements performed at the lower and upper levels specified by you. Frequency, period, duty cycle, positive pulse width, and negative pulse width measurements will be performed at the center of both entered levels. •...
- Page 34 Operating the Measurement/Storage Module Setting Thresholds Figure 2– 6 User Threshold Rise Time Measurement 2–18...
-
Page 35: To Make Delay Measurements Automatically
Operating the Measurement/Storage Module To make delay measurements automatically To make delay measurements automatically You can measure the delay of signals connected to the oscilloscope’s input 1 and input 2 connectors when the Measurement/Storage Module is connected to the oscilloscope. Delay is measured from the user-defined slope and edge count of the signal connected to input 1, to the defined slope and edge count of the signal connected to input 2. - Page 36 Operating the Measurement/Storage Module To make delay measurements automatically Press the Measure Delay softkey. Delay is measured and displayed on the screen. Negative delay values indicate the defined edge on channel 1 occurred after the defined edge on channel 2. Automatic Delay Measurement Hints If an edge is selected that is not displayed on the screen, delay will not be measured.
-
Page 37: To Make Phase Measurements Automatically
Operating the Measurement/Storage Module To make phase measurements automatically To make phase measurements automatically Phase shift between two signals can be measured using the Lissajous method. Refer to the User and Service Guide for your oscilloscope for more information. With the Measurement/Storage Module installed, phase is automatically measured and displayed. - Page 38 Operating the Measurement/Storage Module To make phase measurements automatically Figure 2– 8 Automatic Phase Measurement 2–22...
-
Page 39: To Make Additional Voltage Measurements Automatically
Operating the Measurement/Storage Module To make additional voltage measurements automatically To make additional voltage measurements automatically With the Measurement/Storage Module is installed, the following additional automatic voltage measurements can be performed. • Vamplitude Amplitude Voltage measurement is made using the entire waveform. - Page 40 Operating the Measurement/Storage Module To make additional voltage measurements automatically Adjust controls until the desired signal is displayed. Press Voltage Press the Source softkey until the desired source is selected. Press the softkey until the softkey is displayed on the Next Menu Vamp far left side.
-
Page 41: To Make Additional Cursor Measurements
Operating the Measurement/Storage Module To make additional cursor measurements To make additional cursor measurements Without the Measurement/Storage Module installed, cursor measurements can be performed on channels 1 through 4, and are displayed in volts (V1/V2) and time (t1/t2). Refer to the User and Service Guide for your oscilloscope for more information. - Page 42 Operating the Measurement/Storage Module To make additional cursor measurements • V2 reads the percentage the V2 marker has moved from the established 100% position. Negative readings indicate marker has moved through the established V1 marker position. • ∆V reads the percentage difference between the V1 and V2 marker repetitive to the established positions.
- Page 43 Operating the Measurement/Storage Module To make additional cursor measurements Press the Set 100% softkey to set the t1 marker to 0° and the t2 marker to 360°. All readings (except second ∆t display in seconds) are now relative to the established t1/t2 marker positions. •...
- Page 44 Operating the Measurement/Storage Module To make additional cursor measurements Cursor Measurement Hints If cursors are positioned too closely together, an error will be displayed when the SET softkey is selected. Displayed marker readings in percent (%) and degrees (°) are always relative measurements, with the current reading dependent on the previously established 100% or 360 reference setting.
-
Page 45: Unattended Waveform Monitoring
Operating the Measurement/Storage Module Unattended Waveform Monitoring Unattended Waveform Monitoring The Measurement/Storage Module simplifies circuit debugging by comparing an active channel (not functions) trace on the display to one of two test templates. When a failure is detected, the oscilloscope can be instructed to take one of several actions. -
Page 46: To Create A Mask Template Using Automask
Operating the Measurement/Storage Module To create a mask template using Automask To create a mask template using Automask A mask template contains two limit lines: minimum and maximum. Automask allows you to easily generate a mask with tolerances from a displayed waveform on the screen. -
Page 47: To Create A Mask Template Using Autostore
Operating the Measurement/Storage Module To create a mask template using Autostore To create a mask template using Autostore An envelope of the passing region can be generated using the Autostore function. Then the Automask function can read the Autostore screen information and take the maximum and minimum limits of it as the limit lines of the mask template. - Page 48 Operating the Measurement/Storage Module To create a mask template using Autostore Press the Tolerance softkey, then turn the knob closest to the key to set the tolerance to ±0.0%. Cursors If additional tolerance is desired, set the tolerance to the appropriate level. This will be the amount "added on"...
-
Page 49: To Create Or Edit A Mask Using Line Segments
Operating the Measurement/Storage Module To create or edit a mask using line segments To create or edit a mask using line segments The Measurement/Storage Module has a built-in Mask Editor for creating or editing masks. It provides two editing tools: pixel editing and line drawing editing. - Page 50 Operating the Measurement/Storage Module To create or edit a mask using line segments Toggle the Edit Line softkey to select the limit line you want to edit. Turn the Delay knob to move the X-coordinate of the cursor to the time corresponding to the first point.
-
Page 51: To Edit An Individual Pixel Of A Mask
Operating the Measurement/Storage Module To edit an individual pixel of a mask To edit an individual pixel of a mask Previously created masks can be edited pixel-by-pixel using the line drawing editing tool. The Delay knob selects the column to be edited, and the Cursors knob moves the mask vertically. -
Page 52: To Edit The Mask To Test Only A Portion Of A Waveform
Operating the Measurement/Storage Module To edit the mask to test only a portion of a waveform To edit the mask to test only a portion of a waveform In certain circumstances, not all the points on the waveform need to be tested. - Page 53 Operating the Measurement/Storage Module To edit the mask to test only a portion of a waveform Mask Editing Operating Hint Each limit line can have its own selectable test region. The figure below shows a mask that tests the overshoot of the waveform. Note that only the part you are interested in is tested.
-
Page 54: To Start Waveform Monitoring
Operating the Measurement/Storage Module To start waveform monitoring To start waveform monitoring Before using a testing mask to monitor a waveform, the mask must be created. Once created, the mask is automatically stored in one of the two nonvolatile mask memories. Procedures for creating a mask template are provided in this chapter. - Page 55 Operating the Measurement/Storage Module To start waveform monitoring • Increment This softkey is displayed only when Save To Trace is selected. When On, all test violations are saved by incrementing the trace number. The starting trace number is the one that is currently selected.
-
Page 56: To Automatically Save Test Violations
Operating the Measurement/Storage Module To automatically save test violations To automatically save test violations The signals that fail the waveform monitoring test can be saved, then viewed/measured at a later time. Provisions are provided to save the violations in trace memory, or print a hardcopy of the data. When trace is selected, the option of saving only the last violation, or saving all violations are provided. - Page 57 Operating the Measurement/Storage Module To automatically save test violations Saving Test Violation Data Operating Hint When Increment On is selected, traces ≥3 to 100 are stored in the compressed state. During the compression and storage of data, new signals are not acquired or tested.
-
Page 58: Creating A Delay Testing Mask
Operating the Measurement/Storage Module Creating a delay testing mask Creating a delay testing mask A mask can be used to test the channel to channel delay of two input signals. The shape of the mask varies depending on the channel 2 edge selected (stop edge). - Page 59 Operating the Measurement/Storage Module Creating a delay testing mask The following procedure can be used to setup a mask template for testing channel to channel delay. In the oscilloscope setup, the controls should be selected to display the start edge (channel 1) as the first edge on the display, and the stop edge (channel 2) as the last edge on the display.
-
Page 60: Creating A Frequency Testing Mask
Operating the Measurement/Storage Module Creating a frequency testing mask Creating a frequency testing mask A mask can be used to test the frequency of the input signal. The shape of the mask varies depending on the shape of the signal to be tested. A mask designed for testing a sine wave cannot be used to test a square wave. - Page 61 Operating the Measurement/Storage Module Creating a frequency testing mask The following procedure can be used to setup a mask template for testing the frequency of a sine wave or a square wave. Similar methods can be used to generate masks for testing the frequency of signals of other shapes. In the oscilloscope setup, the vertical sensitivity and position should be adjusted so that the amplitude is almost full scale.
-
Page 62: Creating An Overshoot Testing Mask
Operating the Measurement/Storage Module Creating an overshoot testing mask Creating an overshoot testing mask There are two parameters associated with the overshoot of a signal: the percentage of overshoot and the settling time of the overshoot. A mask template can be created to test the upper limit of these two parameters at the same time. - Page 63 Operating the Measurement/Storage Module Creating an overshoot testing mask The critical factors for creating the mask template are: • The vertical window of the middle region of the mask template determines the upper limit of the overshoot. • The horizontal window of the middle region determines the upper limit of the settling time.
-
Page 64: Creating A Rise Time Testing Mask
Operating the Measurement/Storage Module Creating a rise time testing mask Creating a rise time testing mask Mask template testing can be used to test the rise time of a signal, including specifying an upper limit for rise time. For example, you can specify that the rise time must be 15 ns or faster to pass the test. - Page 65 Operating the Measurement/Storage Module Creating a rise time testing mask Determine the top and base of the signal. Use the automatic measurement Vtop and Vbase of the oscilloscope to determine these values. Calculate the 10% and 90% points. Determine the upper limit for the rise time. Draw the mask template using the mask editor.
-
Page 66: Testing The Eye Opening Of An Eye-Pattern Signal
Operating the Measurement/Storage Module Testing the eye opening of an eye-pattern signal Testing the eye opening of an eye-pattern signal There are generally two tests that you want to perform on an eye-pattern signal: an eye boundary test and an eye opening test. Since the eye boundary can be easily tested by using the normal mask template testing, this section mainly focuses on how to create the mask for testing the eye opening. - Page 67 Operating the Measurement/Storage Module Testing the eye opening of an eye-pattern signal Set up the oscilloscope for proper viewing of the eye-pattern signal. Determine the fail region. Create the mask using the line drawing capabilities of the mask editor. The voltage and time readouts in the mask editor can be used to ensure the correct shape and position of the mask.
-
Page 68: To Save Or Recall Traces
Operating the Measurement/Storage Module To save or recall traces To save or recall traces With the Measurement/Storage Module installed, the two volatile pixel memories are replaced with four high-speed non-volatile memories. In addition, 64 Kbytes of nonvolatile trace memory with data compression is also provided. - Page 69 Operating the Measurement/Storage Module To save or recall traces • Recall Setup Recalls the previously stored front-panel setup that was saved with the waveform for the trace selected. • Edit Label Used to enter a 20 character label that identifies the stored waveform.
-
Page 70: To Create A Label For A Trace Memory
Operating the Measurement/Storage Module To create a label for a trace memory To create a label for a trace memory Each trace stored in Measurement/Storage Module can have a label up to 20 characters long to identify the stored waveform. Press Trace Press the... -
Page 71: To Set Real-Time Clock
Operating the Measurement/Storage Module To set real-time clock To set real-time clock Time (24-hour format) and date tagging of hard copy and nonvolatile trace memories is provided using a built in, battery backed up real-time clock. To set time and date, or view current contents: Press Print/Utility Press the... - Page 72 Operating the Measurement/Storage Module To set real-time clock Press the Set Date softkey. A softkey menu with six choices appears. Five of them are related to setting the real-time clock date. • Day Selects the day. Current selection can be changed using the knob closest to the key, or by repeatedly pressing the softkey.
- Page 73 Reference Information...
-
Page 74: Reference Information
Reference Information This chapter contains reference information for the Measurement/Storage Modules including its operating characteristics. 3–2... - Page 75 Reference Information Operating Characteristics Operating Characteristics Operating Characteristics are specified with the Measurement/Storage Module installed on an Agilent 54600–Series Oscilloscope. Measurements Voltage Vamp, Vavg, Vrms, Vpp, Vpre, Vovr, Vtop, Vbase, Vmin & Vmax Time Delay, Duty Cycle, Frequency, Period, Phase Angle, Rise Time, Fall Time, +Width, &...
- Page 76 400 dBV. The minimum setting is -196 dB at 1 dBV/div decreasing to 0 dBV at 50 dBV/div. The maximum setting is 400 dBV at 50 dB/div, decreasing to 204 dB at 1 dBV/div. Programmability All front-panel controls are fully programmable over GPIB (54657A) or RS-232 (54658A and 54659B) 3–4...
- Page 77 Reference Information Operating Characteristics Figure 3–1 Effective Sample Rate Frequency Span 5.E+10 5 GHz 5.E+09 5 GSa/s FFT operation limited by bandwidth of scope 500 MHz 5.E+08 500 MSa/s 50 MHz 5.E+07 50 MSa/s 5 MHz 5.E+06 5 MSa/s 500 kHz 500 kSa/s 5.E+05 50 kHz...
- Page 78 Reference Information Operating Characteristics Mask Template Testing Number of mask 2, nonvolatile templates Mask template Automask generates a mask from waveform data with variable generation tolerances. Mask editor allows pixel-by-pixel editing and line drawing editing. Smooth mask function performs a running average of 3 pixels. Test Region Each pixel is selectable to be tested or not Fail Region...
- Page 79 Reference Information Operating Characteristics RS-232 Configurations Connector Type With the adapter cable connected, at the end of the cable is a 9 pin/25 pin DTE port; a printer cable is required to connect it to hardcopy devices or a computer. Protocols XON/XOFF, hardware.
- Page 80 3–8...
- Page 81 Index ∫dt, 2–5 DB25 connector, 1–5 hanning window, 2–11 DB9 connector, 1–7 hardcopy output, operating dBm, 2–8 characteristics, 3–6 DC Value, 2–8 aliasing, 2–9 delay measurements, 2–19 Automask, 2–30 delay testing mask, 2–42 automatic measurements, 2–14 differentiate, 2–5 installation, 1–3 delay, 2–19 dV/dt, 2–5 integrate, 2–5...
- Page 82 Index Nyquist frequency, 2–9 test violations, saving, 2–40 testing mask, creating delay, 2–42 eye-pattern, 2–50 operating characteristics, 3–3 frequency, 2–44 FFT, 3–3 overshoot, 2–46 hardcopy output, 3–6 rise time, 2–48 mask template testing, 3–6 thresholds, 2–15 measurments, 3–3 time cursor measurements, 2–26 programmability, 3–7 trace memory label, 2–54 real-time clock, 3–6...
-
Page 83: Declaration Of Conformity
EMC Directive 89/336/EEC and carries the CE marking accordingly. This product was tested in a typical configuration with Agilent Technologies test systems. Colorado Springs, 01/12/95 John Strathman, Quality Manager For further information, please contact your local Agilent Technologies sales office, agent or distributor. - Page 84 Product Regulations Safety IEC 1010-1:1990+A1 / EN 61010-1:1993 UL 3111 CSA-C22.2 No.1010.1:1993 This Product meets the requirement of the European Communities (EC) EMC Directive 89/336/EEC. Emissions EN55011/CISPR 11 (ISM, Group 1, Class A equipment) Immunity EN50082-1 Code Notes IEC 555-2 IEC 555-3 IEC 801-2 (ESD) 4kV CD, 8kV AD IEC 801-3 (Rad.) 3 V/m...
- Page 85 Before turning on the secure it against any chassis. for a particular purpose. instrument, you must connect unintended operation. Agilent Technologies shall the protective earth terminal • Do not operate the not be liable for errors of the instrument to the...
-
Page 86: Publication Number
Product Warranty No other warranty is About this edition expressed or implied. This Agilent Technologies This is the Agilent 54657A, Agilent Technologies product has a warranty 54658A, and 54659B specifically disclaims the against defects in material Measurement/Storage implied warranties of and workmanship for a period Modules User’s Guide. - Page 87 . . . to obtain this menu Press this key . . . Voltage Time Cursors...
- Page 88 Press this key ..to obtain this menu Print Utility Trace Trace...
- Page 89 . . . to obtain this menu Press this key . . . ± Setup...