Sony AIT-SDX470 Product Specifications Manual page 162

5.25" model
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8. Drive Diagnostics
WRT
RD
0
0
1
1
At the completion of the test, the tape will be positioned after the last group written or read and before EOD.
NLR:
0 - Drive Log will be initialized before the test
1 - Drive Log will not be initialized
Group Count: This defines the number of groups to be written to or read from the tape.
0 - Write until EOT or Read until EOD/EOM
>0 - Write until count is exhausted or EOM, Read until count is exhausted or EOD/EOM.
If EOM is encountered during Write, EOD will not be written.
In all cases, encountering EOM will be recorded as a hard error. The Diagnostic result for the Error Rate Test will
be as shown in the table below.
Bit
7
Byte
0
Reset Error
1
2
(MSB)
3
4
This test will result in a loss of logical tape position and therefore a load should be sent before the drive is used for
any normal reads or writes.
Read Data Exerciser (43h) Diagnostic Parameters
The purpose of this test is to read AIT Format data for error rate testing.
8-8
Table 8-6: WRT & RD control bits
0
Command rejected – invalid parameters
1
Read
Fast Search to initial position (conditional on Loop Count)
Repeat until loop count = 0
0
Write Set-mark
Write test pattern
Write EOD at end of first pass
Fast search to initial position (conditional on loop count)
Repeat until loop count = 0
1
Write Set-mark
Write test pattern
Write EOD at end of first pass
Fast search to initial position
Read
Fast Search to initial position (conditional on loop count)
Repeat until loop count = 0
Table 8-7: Error Rate Test Results
6
5
Tine Re-
Reserved
Sync
Diagnostic Test Number (02h)
Action
4
3
Error Code
Actual Group Count
SONY AIT-1 Turbo drive SDX-470V series Ver. 1.0
2
1
0
Error Set
(LSB)

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