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Seenewennanenreronnenerinnnns
Note 3: Mirror Transition Time
The time it takes for a mirror to make an opposite side transition (i.e., off to on, or on to off)
impacts the optical efficiency of the total system. Bit resolution, bit splitting, maximum optical output,
and contrast ratio are all impacted by the flight time of the mirror during reset. The specified level is
intended to measure the dynamics of the superstructure independent of load or cycle time. It is
computed by measuring the optical output during a transition from the off state to the on state
beginning with the initiation of reset and concluding when the light output first reaches 80% of the
output of the on state. Mirror dynamics require that address data not be changed for a settling time
following the mirror transition time.
Note 4 : Active Area Reflectivity
The DMD specular reflectivity is defined as the ratio of the light incident upon the mirror array
to the light specularly reflected from it. The measurement is made with all mirrors in the full on state
without electronic duty cycle effects (i.e. measure using 100% duty cycle). The specified specular
reflectivity applies to any arbitrary point on the DMD active area. See Table 2 for the applicable
illumination conditions.
Note 5: Contrast Ratio
The DMD contrast is defined as the ratio of the light reflected from the DMD in the full on state
to the light reflected in the full off state. See Table 1 for the applicable illumination conditions. Note
that the dynamic reflection conditions caused by mirror switching will degrade the effective contrast
of the DMD in projector systems.
Note 6 : Non-Functional Mirrors
Mirrors which cannot be controlled electronically result in saturated light (stuck on), saturated
dark (stuck off) or non-saturated (stuck flat) pixels during normal operation. depending on use
conditions and final system requirements, a limited number of pixel defects may be tolerable within
the warranty period. The required state (light, dark, or non-saturated), restrictions on location within
the array, and maximum count of non-functional mirrors are defined only for particular systems, and
may be found in the applicable image quality specification. The non-functional mirror defect growth
rate shall not exceed 1 per year. The degree of saturation of non-saturated non-functional mirror
defects depend both on the particular defect and the system configuration.
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