Page 1 Agilent Technologies E8285A CDMA Mobile Station Test Set Assembly Level Repair Firmware Version: A.01.29 to A.02.04 (100-1000, 1700-2000 MHz) Firmware Version: A.04.53 and above (800-1000, 1700-2000 MHz) CALL CONTROL UTILITIES Answer Print Printer I/O config Help Call/ End/ Register Tests...
Page 2 This material may be reproduced by or for the U.S. Government pursuant to the Copyright License under the clause at DFARS 52.227-7013 (APR 1988). © Copyright 2000 Agilent Technologies S:\agilent\e8285\ALR\Book\chapters\front.fm...
Page 3 Manufacturer’s Declaration This statement is provided to comply with the requirements of the German Sound Emission Directive, from 18 January 1991. This product has a sound pressure emission (at the operator position) < 70 dB(A). • Sound Pressure Lp < 70 dB(A). •...
Page 4 Safety Considerations GENERAL This product and related documentation must be reviewed for familiarization with safety markings and instructions before operation. This product has been designed and tested in accordance with IEC Publication 1010, “Safety Requirements for Electronic Measuring Apparatus,” and has been supplied in a safe condition. This instruction documentation contains information and warnings which must be followed by the user to ensure safe operation and to maintain the product in a safe condition.
Page 5 Safety Considerations for this Instrument This product is a Safety Class I instrument (provided with a WARNING protective earthing ground incorporated in the power cord). The mains plug shall only be inserted in a socket outlet provided with a protective earth contact. Any interruption of the protective conductor inside or outside of the product is likely to make the product dangerous.
Page 6 Always use the three-prong ac power cord supplied with this product. CAUTION Failure to ensure adequate earth grounding by not using this cord may cause product damage. This product is designed for use in Installation Category II and Pollution Degree 2 per IEC 1010 and IEC 664 respectively. For indoor use only.
Page 7 Product Markings CE - the CE mark is a registered trademark of the European Community. A CE mark accompanied by a year indicated the year the design was proven. CSA - the CSA mark is a registered trademark of the Canadian Standards Association.
Page 8 Agilent Technologies Warranty Statement for Commercial Products E8285A CDMA Mobile Station Test Set Duration of Warranty: One Year 1. Agilent warrants Agilent hardware, accessories and supplies against defects in materials and workmanship for the period specified above. If Agilent receives notice of such defects during the warranty period, Agilent will, at its option, either repair or replace products which prove to be defective.
Page 9 8. Agilent will be liable for damage to tangible property per incident up to the greater of $300,000 or the actual amount paid for the product that is the subject of the claim, and for damages for bodily injury or death, to the extent that all such damages are determined by a court of competent jurisdiction to have been directly caused by a defective Agilent product.
Page 10 Directive 89/336/EEC and carries the CE-marking accordingly. Vince Roland Spokane, Washington USA November 20, 1998 Reliability & Regulatory Engineering Manager European Contact: Your local Agilent Technologies and Service Office or Agilent Technologies GmbH Department ZQ/Standards Europe, Herrenberger Strasse 130, D-71034 Böblinger, Germany (FAX+49-7031-14-3143) S:\agilent\e8285\ALR\Book\chapters\front.fm...
Page 11 The Netherlands (tel) 1 800 452 4844 (tel) 1 877 894 4414 (tel) (3120) 547 9999 Japan: Latin America: Australia/New Zealand: Agilent Technologies Japan Ltd. Agilent Technologies Agilent Technologies Measurement Assistance Center Latin America Region Australia Pty Ltd 9-1 Takakura-Cho, Hachioji-Shi,...
Page 12 If you have used the manuals and still have application questions, contact your local Agilent Technologies Sales Representative. Repair assistance is available for the Agilent E8285A CDMA Mobile Station Test Set from the factory by phone and e-mail. External and internal Agilent users can contact the factory via email.
Page 13 Power Cables Table 3 Plug Descriptions Agilent Part # Plug type Cable Descriptions male/female (cable & plug) Straight/Straight 8120-1689 79 inches, mint gray Straight/90 ° 8120-1692 79 inches, mint gray Earth Ground Line Neutral Used in the following locations: Bangladesh, Belgium, Benin, Bolivia, Boznia-Herzegovina, Bulgaria, Burkina Faso, Burma, Burundi,Byelarus Cameroon, Canary Islands, Central African Republic, Chad, Chile, Comoros, Congo, Croatia, Czech Republic, Czechoslovakia...
Page 14 Plug Descriptions Agilent Part # Plug type Cable Descriptions male/female (cable & plug) Sweden, Syria Tajikistan, Thailand, Togo, Tunisa, Turkey, Turkmenistan USSR, Ukraine, Uzbekistan Western Africa, Western Sahara Yugoslavia Zaire Table 4 Plug Descriptions Agilent Part # Plug Type Cable Descriptions male/female (cable &...
Page 15 Table 6 Plug Descriptions Agilent Part # Plug Type Cable Descriptions male/female (cable & plug) Straight/Straight 8120-1378 90 inches, jade gray Straight/90° 8120-1521 90 inches, jade gray 125V Straight/Straight 8120-1751 90 inches, jade gray Earth Ground Neutral Line Used in the following locations: American Samoa Bahamas, Barbados, Belize, Bermuda, Brazil Caicos, Cambodia, Canada, Cayman Islands, Columbia, Costa Rica, Cuba...
Page 16 Table 7 Plug Descriptions Agilent Part # Plug Type Cable Descriptions male/female (cable & plug) Straight/Straight 8120-4753 90 inches, dark gray JIS C 8303, 100 V Straight/90° 8120-4754 90 inches, dark gray Earth Ground Neutral Line Used in the following locations: Japan Table 8 Plug Descriptions...
Page 17 Table 9 Plug Descriptions Agilent Part # Plug Type Cable Description male/female (cable & plug) Straight/Straight 8120-4211 79 inches, mint gray Straight/90° 8120-4600 79 inches, mint gray Earth Ground Line Neutral Used in the following locations: Botswana India Lesotho Malawi South-West Africa (Namibia), Switzerland Zambia, Zimbabwe Table 10...
Page 18 Table 11 Plug Descriptions Agilent Part # Plug Type (Male) Cable Descriptions male/female (cable and plug) 90°/Straight 8120-1351 90 inches, mint gray 90°/90° 8120-1703 90 inches, mint gray Earth Ground Line Neutral Used in the following locations: Bahrain, British Indian Ocean Terr., Brunei Canton, Cyprus Enderbury Island, Equatorial Guinea Falkland Islands, French Pacific Islands...
Page 19 Table 12 Plug Descriptions Agilent Part # Plug Type Cable Descriptions male/female (cable & plug) Straight/Straight 8120-1369 79 inches, gray Straight/90° 8120-0696 80 inches, gray Earth Ground Line Neutral Used in the following locations: Argentina, Australia China (People’s Republic) New Zealand Papua New Guinea Urugray Western Samoa...
Page 20 ATTENTION Static Sensitive Devices This instrument was constructed in an ESD (electro-static discharge) protected environment. This is because most of the semi conductor devices used in this instrument are susceptible to damage by static discharge. Depending on the magnitude of the charge, device substrates can be punctured or destroyed by contact or mere proximity of a static charge.
Page 21: Table Of Contents
Test Equipment Needed for the System Power Calibration Program 40 E8285A Support Contacts ........41 Hardware and Firmware Enhancements .
Page 22 Contents Performance Test 5 ........158 RF Generator Harmonics Spectral Purity Performance Test 6 .
Page 23 Contents 7. Performance Test Records RF Generator FM Distortion Performance Test 1 Record ....... . . 202 RF Generator FM Accuracy Performance Test 2 Record .
Page 24 Contents CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25 Record ....... . 243 CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 .
Page 25 Introduction This manual explains how to repair and calibrate the Agilent Technologies E8285A CDMA/PCS Mobile Station Test Set; called the “Test Set” throughout this manual. Throughout this manual you will see this note: Test Sets with firmware revision A.04.5X and above operate only at RF NOTE frequencies from 800 to 1000 MHz and 1700 to 2000 MHz.
Page 26: Introduction
Test Set Description Several analog and digital test instruments are integrated into the E8285A CDMA Mobile Station Test Set to test Code Division Multiple Access (CDMA) digital cellular, PCS, and several types of analog mobile phones, such as AMPS, NAMPS, and TACS.
Page 27 Introduction Test Set Description Some of these functions are directly replaceable assemblies (such as the spectrum analyzer); some functions are digitally derived from other assemblies (such as the oscilloscope). Most of the replaceable assemblies are plug-in components. Most instrument functions can be controlled by front-panel (local) controls and by remote commands (using a connected controller).
Page 28: Product Description
Introduction Product Description Product Description The E8285A CDMA Mobile Test Set is designed to meet the needs of Cellular Provider Point of Sale Retailers, manufacturing customers, and other customers who require CDMA Mobile Phone test capability. The Test Set is very similar to it’s predecessor, the Agilent Technologies 8924C with the addition of newly designed RF I/O module, upconverter and downconverter assemblies.
Page 29 Introduction Product Description Figure 1-2 Reference Signal Generation Rear Panel External To internal analog assemblies. Reference In See block diagrams for more O CXO H igh Stability 1, 2, 5, 10 MHz information. Reference Assembly 10 MHz In To internal digital assemblies. Rear Panel External CDMA Reference See block diagrams for more...
Page 30 Introduction Product Description RF Analysis RF signals connected to the front panel RF IN/OUT connector or ANTENNA IN connector go to the RF I/O module. The signal level and RF frequency are measured, and the level is adjusted using fixed step and variable attenuators in the separate downconverter module.
Page 31 Introduction Product Description AM, FM, or SSB Modulation Analysis For AM, FM, or SSB signals, the 114.3 MHz signal is downconverted to 10.7 MHz and routed through a user-selected IF bandpass filter (15 kHz or 230 kHz) that is centered around the 10.7 MHz IF. AM and SSB signals are demodulated at this point;...
Page 32 Introduction Product Description CDMA Signal Analysis The 114.3 MHz IF also goes to the CDMA LO/IF Demodulation assembly. This assembly provides a through path to the spectrum analyzer (Option 102) for all RF signals, and also provides down conversion for CDMA signals, measurements and call processing. To downconvert the CDMA signal, the 114.3 MHz IF is mixed with a 117.9864 MHz local oscillator (LO) signal to produce a 3.6864 MHz IF.
Page 33 Introduction Product Description RF Signal Generation The Signal Generator Synthesizer assembly creates a 500 to 1000 MHz signal. The reference signal for the synthesizer is supplied by the High Stability Reference assembly. The synthesizer’s frequency is varied using a divider network in the feedback circuit of the phase locked loop. Any FM modulation signal (from the Modulation Distribution assembly), and the frequency sweep signal for the spectrum analyzer and tracking generator, are integrated into this feedback loop.
Page 34 Introduction Product Description RF and Duplex Outputs NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 35 Introduction Product Description Figure 1-6 RF Generation Path Overview IQ Modulator Assembly Signal Generator Synthesizer 500-1000 MHz 1 MHz from Reference I/Q Modulator Assembly div/n FM Mod. from Mod. Dist. AWGN (Noise) from Spec. Analyzer CDMA Reference Sweep Cell Site 4 channels of Digital 1 I&Q data...
Page 36: Troubleshooting Strategy
Introduction Troubleshooting Strategy Troubleshooting Strategy You can repair the Test Set yourself or send it to your local Agilent Technologies Instrument Support Center. Before starting a repair, you should become familiar with basic Test Set operation using the user’s guide. Troubleshooting relies on built-in diagnostics.
Page 37: Repair Process
Introduction Repair Process Repair Process Repairing the Test Set consists of: • Identifying the faulty assembly – see chapter 2, "Troubleshooting" • Ordering a replacement assembly – see chapter 3, "Disassembly and Replaceable Parts" • Replacing the faulty assembly – see chapter 3, "Disassembly and Replaceable Parts"...
Page 38: Calibration And Performance Verification
Introduction Calibration and Performance Verification Calibration and Performance Verification The Test Set periodically requires some maintenance to verify that it meets its published specifications. See “Periodic Adjustments” on page 126. Periodic Adjustments (calibration) consists of running several built-in calibration programs. The recommended interval for periodic adjustments is 12 months.
Page 39: System Power Calibration Program
Introduction System Power Calibration Program System Power Calibration Program This adjustment program is not found in ROM of the Test Set. This program resides on a PCMCIA Memory Card, part-number E6380-61811. It has to be downloaded from the memory card. This program generates system power calibration factors for the Test Set.
Page 40: Test Equipment Needed For The System Power Calibration Program
1-1. Because this calibration program is written specifically for this equipment, no substitutions are possible. Table 1-1 Equipment List for System Power Calibration Program Agilent Technologies Equipment Type Model Number Signal Generator 8648B Option 1EA Power Meter...
Page 41: E8285A Support Contacts
• Application information is located in the E8285 Application Guide (p/n E8285-90019) and the GPIB Condensed Programming Reference Guide (p/n E8285-90020). • Operation and reference information are included in the E8285A CDMA Mobile Station Test Set User’s Guide (p/n E8285-90018). • Calibration and repair information in this manual.
Page 42: Hardware And Firmware Enhancements
Introduction Hardware and Firmware Enhancements Hardware and Firmware Enhancements Test Sets with firmware revision A.04.5X and above operate only at RF NOTE frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 43: Ordering New Manuals
Introduction Ordering New Manuals Ordering New Manuals The Test Set is designed to allow future upgrades to hardware and firmware which may obsolete some of the material in this manual. For the latest document revisions and information, call the Direct Parts Ordering office (U.S.
Page 44 Introduction Ordering New Manuals S:\agilent\e8285\ALR\Book\chapters\intro.fm...
Page 45: Troubleshooting
Troubleshooting This chapter explains how to isolate a problem to the defective assembly. Troubleshooting uses the Test Set’s built-in diagnostics. If diagnostics can’t identify the faulty assembly, supplementary information in the form of manual troubleshooting procedures is provided.
Page 46: How To Troubleshoot The Test Set
Troubleshooting How to Troubleshoot the Test Set How to Troubleshoot the Test Set Document the result of each step in case you need to contact Agilent Technologies for service assistance. General troubleshooting steps are illustrated in figure 2-2 on page...
Page 47 Troubleshooting How to Troubleshoot the Test Set Figure 2-2 Agilent E8285A Test Set Troubleshooting Flowchart BEGIN Power-up the Test Set to run self diagnostics. 1. Check for a faulty fan. Fan is not running or 2. Check for a faulty power supply.
Page 48: Self-Test Diagnostics
Troubleshooting Self-Test Diagnostics Self-Test Diagnostics On power-up the Test Set runs a diagnostic self-test. Most of the Test Set’s digital functions are tested. The outcome of the test appears on the display (if operating) and on four LEDs viewable and the digital controller board (you must remove the external and top-internal covers to view the LEDs).
Page 49 Troubleshooting Self-Test Diagnostics o A SAVE/RECALL register named POWERON was saved to automatically power-up the Test Set in a different state. Press the Preset key before proceeding; this will restore the Test Set to the factory power-up condition. o The Autostart Test Procedure on Power-Up: field (of the “TESTS [Execution Conditions]”...
Page 50 Troubleshooting Self-Test Diagnostics 4. If the Test Set does not power-up properly, but the fan operates and the power supply voltages are correct on the Power Supply Regulator outputs, the Controller may be failing. Check TP2 on the Controller for +5V. If +5V is present, the Controller assembly is faulty.
Page 51 Troubleshooting Self-Test Diagnostics Figure 2-5 Diagnostic and Power Supply LEDs Digital Controller Board DIAG LEDs DIAG LEDs 0 1 2 3 MODULE controller5.eps DS3 DS4 Power Supply LEDs DS1: +5D DS2: +12STBY DS3: –12V DS4: +12A Reading Front Panel or GPIB Codes Failure codes are listed in the table below.
Page 52 Troubleshooting Self-Test Diagnostics Table 2-1 Return Values for Self-Test Diagnostic Failures Returned Error Code Detected Failure Hexadecimal Decimal Failed Assembly (displayed) (GPIB) Microprocessor Digital Controller 0002 Digital Controller 0004 Memory/SBRC 0008 Memory/SBRC 0010 Timer Controller 0020 Real-Time Clock Memory 0040 Keyboard (stuck key) 0080 Keypad...
Page 53 Troubleshooting Self-Test Diagnostics Reading LED Codes When the self-test diagnostic reports a failure, more information about the failure may be available inside the Test Set. This additional information is output to the four LEDs on the top of the digital controller assembly. The failure codes are sent out as code sequences.
Page 54 Troubleshooting Self-Test Diagnostics Figure 2-6 Reading the Self-Test Diagnostic. The Internal LEDs 1. Remove the Test Set’s external cover. 2. Turn power on. LED Legend 3. Read the LED sequence on the digital = off controller board (see below) and compare with = rapid blink the patterns below.
Page 55 Troubleshooting Self-Test Diagnostics Figure 2-7 First LED Patterns If the first LED pattern Then the failure is... displayed is... LED Legend Microprocessor = off ROM Checksum (See note 1.) = rapid blink = steady on or slow blink RAM (See note 2.) RAM (See note 3.) Timer Real-Time Clock...
Page 56 Troubleshooting Self-Test Diagnostics Figure 2-8 Non-blinking LED Codes For Serial Bus Communication Failure If the second and third LED Then the failure is... patterns displayed are..Modulation Distribution Output Section Audio Analyzer 1 Audio Analyzer 2 Reference RF Input/Output Downconverter Receiver Spectrum Analyzer Signal Generator Synthesizer...
Page 57 Troubleshooting Self-Test Diagnostics Figure 2-9 Non-Blinking LED Codes for Miscellaneous Hardware Failure If the second and third LED Then the failure is... patterns displayed are..Reference Audio Filter 1 - C-Message Filter Audio Filter 2 - 6 kHz BPF Receive DSP Digital Cellsite 1 and 2 LED Legend = off...
Page 58: Functional Diagnostics
Troubleshooting Functional Diagnostics Functional Diagnostics The Diagnostics (of the SERVICE7 MENU, shown in figure 2-13 on page check whether or not major portions of the Test Set are functioning. They may pinpoint faults in the circuitry to the faulty assembly, or they may direct the use of any or all of the AF, RF, CDMA diagnostics to more extensively test the circuitry.
Page 59 Troubleshooting Functional Diagnostics As some of the tests run, you may be offered the options to alter test execution conditions by selecting: • Loop to run the test continuously • Pause to pause the tests • Stp Fail (stop-failure) to stop on a failure •...
Page 60 Troubleshooting Functional Diagnostics 5. Set up the Test Procedure Run Mode: field. • Select Continuous to run the tests continuously. • Select Single Step to pause after each measurement. 6. Verify that the Autostart Test Procedure on Power-Up: setting is Off. Configuring a Printer Only perform the following steps if you want to print test results to a printer.
Page 61 Troubleshooting Functional Diagnostics Figure 2-13 SERVICE7 Program Screens TESTS (Mani Menu) RF Diagnostics SERVICE MENU Audio Diagnostics CDMA Diagnostics RF Diagnostics...
Page 62 Troubleshooting Functional Diagnostics Functional Diagnostics Menu To run the Functional Diagnostics, see "Accessing the Diagnostic Tests" on page NOTE The diagnostics are intended to help in locating the source of catastrophic failures. Occasionally, a test will fail with the test results being only slightly out of limits. Such failures do not necessarily indicate that the Test Set is operating outside of its published specifications or that it is otherwise faulty.
Page 63 Troubleshooting Functional Diagnostics RF Modules The Average and TX power meters, Channel Power Meter, RF analyzer, IF analyzer and spectrum analyzer are used to test the signal generator. Both the internal and external paths of the RF/IO assembly are used in the tests. Analog Modulation The demodulator in the RF analyzer, and the spectrum analyzer are used to check the accuracy, distortion, and residuals of the FM and AM frequencies.
Page 64: Af, Rf, And Cdma Diagnostics
Troubleshooting AF, RF, and CDMA Diagnostics AF, RF, and CDMA Diagnostics The diagnostics are intended to help in locating the source of catastrophic failures. NOTE Occasionally, a test will fail with the test results being only slightly out of limits. Such failures do not necessarily indicate that the Test Set is operating outside of its published specifications or that it is otherwise faulty.
Page 65 Troubleshooting AF, RF, and CDMA Diagnostics Figure 2-15 AF Diagnostics Screen Audio Diagnostics When a test fails, a diagnosis is given in three parts: • A diagnostic code. • The name of the assembly or assemblies most likely to have failed. •...
Page 66 Troubleshooting AF, RF, and CDMA Diagnostics A fifteen minute warm up is required. The measurement limits of the SERVICE4 NOTE diagnostic tests are valid only at room temperature; that is, 20º to 25ºC (65º to 75ºF). Test Sets with firmware revision A.04.5X and above operate only at RF NOTE frequencies from 800 to 1000 MHz and 1700 to 2000 MHz.
Page 67 Troubleshooting AF, RF, and CDMA Diagnostics CDMA Diagnostics The Digital Diagnostics test the assemblies required for CDMA-formatted IQ modulation. These assemblies include: • CDMA Reference • LO/IF Demod • I/Q Modulator • Cell Site Analog The CDMA Reference, LO/IF Demod, and I/Q Modulator are also used when generating or analyzing analog signals.
Page 68: Frequently Encountered Diagnostic Messages
Troubleshooting Frequently Encountered Diagnostic Messages Frequently Encountered Diagnostic Messages Warning/Error Messages NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 69 Troubleshooting Frequently Encountered Diagnostic Messages Time-outs Certain failures may cause a frequency or voltage reading to time out, that is, the time required for the measurement will be unreasonably long. If a timeout occurs, measurement execution will stop and an error message will be displayed. •...
Page 70: Manual Troubleshooting Procedures
Troubleshooting Manual Troubleshooting Procedures Manual Troubleshooting Procedures Test Sets with firmware revision A.04.5X and above operate only at RF NOTE frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 71 Troubleshooting Manual Troubleshooting Procedures SERVICE7 Program Diagnostic Performance Cal.-Data Periodic Calibration Assembly Name Test: Test to Perform Program Needed Sub-Test Display Drive Functional Diagnostics: Self Test Power Functional Diagnostics: Self Test Supply Signal RF Diagnostics: RF Generator: Harmonic and Generator Signal Generator Synthesizer Spurious Spectral Purity Synthesizer...
Page 72 Troubleshooting Manual Troubleshooting Procedures Verify Test Set’s Reference Path Out-of-Lock (OOL) LEDs Out-of-lock (OOL) LEDs light when a phase-locked loop inside an assembly is failing. The signal generator synthesizer and the receiver synthesizer assemblies have these LEDs mounted close to the top of the modules. The location of each LED is labeled on the assembly.
Page 73 Troubleshooting Manual Troubleshooting Procedures If the 10 MHz signal is not present at all, then the CDMA Generator Reference assembly is faulty. If the signal is present on pin 20 but not pin 19, then the Motherboard assembly is faulty (open or short). Reference Verification 1.
Page 74 Troubleshooting Manual Troubleshooting Procedures Swapping Known-Good Assemblies Most swapped assemblies which use calibration data will operate well enough with the original assembly’s calibration data to troubleshoot and to run the diagnostics; do not expect the Test Set to meet its specifications. Some assemblies may appear to fail because of incorrect calibration data.
Page 75 Troubleshooting Manual Troubleshooting Procedures Further Isolating RF Failures NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 76 Troubleshooting Manual Troubleshooting Procedures To isolate an RF analyzer problem: 1. On the Test Set: a. Press Preset b. Press the to access the CONFIGURE screen. Config • Set the RF Display field to Freq . • Set the RF Offset field to Off . c.
Page 77 Troubleshooting Manual Troubleshooting Procedures Isolating the RF Source The RF generator function uses the following assemblies. Refer to figure 2-20 the block diagrams in chapter 8, "Block Diagrams". • LO IF/IQ Modulator • Signal Generator Synthesizer • Output Section • Upconverter Figure 2-20 Isolating the RF Source Input...
Page 78 Troubleshooting Manual Troubleshooting Procedures To isolate the RF Source: 1. On the Test Set: a. Press Preset b. Press the key to access the CONFIGURE screen. Config • Set the RF Display field to Freq . • Set the RF Offset field to Off . c.
Page 79: Service Screen
Troubleshooting Service Screen Service Screen A large number of latch and DAC settings used throughout the Test Set can also be read and/or set to alter standard operation. The SERVICE screen uses the internal voltmeter and frequency counter functions to monitor specific nodes in most assemblies.
Page 80 Troubleshooting Service Screen To change the counter connection, use the knob to select the Counter Connection field. A Choices menu will appear. Select the desired circuit node. Figure 2-21 Service Screen Gate Time This field is used to adjust the Test Set’s internal frequency counter’s gate time. A shorter gate time may enable you to see frequency fluctuations that might not be seen using a longer gate time.
Page 81 Troubleshooting Service Screen Module This field is used to manually select the module that contains the circuit latches to be selected. Latch This field is used to manually select the circuit latches in the module selected in the Module field above. The latches control switch, DAC, and gain settings within the Test Set.
Page 82 Troubleshooting Service Screen S:\agilent\e8285\ALR\Book\chapters\trouble.fm...
Page 83: Disassembly And Replaceable Parts
Disassembly and Replaceable Parts This chapter contains information for the removal and replacement of the assemblies in the Test Set. Illustrations and a parts list are provided for parts identification.
Page 84: Before You Start
Disassembly and Replaceable Parts Before You Start Before You Start Perform the procedures in this chapter only at a static-safe work CAUTION station. The printed circuit assemblies in this instrument are sensitive to static electricity damage. Wear an anti-static wrist strap that is connected to earth ground.
Page 85 • 1-800-922-8920 Agilent Technologies Call Center • 1-800-827-3848 (Spokane Division Service Assistance, U.S. only) • 1-509-921-3848 (Spokane Division Service Assistance, International) • 1-800-227-8164 (Agilent Technologies Direct Parts Ordering, U.S. only) • 1-916-783-0804 (Agilent Technologies Service Parts Identification, U.S. & International) •...
Page 86 Disassembly and Replaceable Parts Before You Start Calibration Data Download Procedure 1. Switch the Test Set’s power off. 2. Remove the faulty assembly. 3. Install the replacement assembly. 4. Switch the Test Set’s power on. 5. Insert the memory card. 6.
Page 87: Disassembly Procedures
Disassembly and Replaceable Parts Disassembly Procedures Disassembly Procedures This section provides instructions for disassembling the Test Set. The procedures provided in this chapter are mainly organized in sequential order of Test Set disassembly. For component and assembly part numbers refer to the "Parts List"...
Page 88 Disassembly and Replaceable Parts Disassembly Procedures Figure 3-2 Top and Bottom Internal Covers SMM4.0_10SEMPNTX (Qty. 20) DIGITAL_CVR RF_COVER SMM4.0_10SEMPNTX (Qty. 20) HOLDDOWN_PCB SMM4.0_10SEMPNTX FOOT,_BOTTOM (Qty. 5) COVER_BOTTOM SMM4.0_10SEMPNTX SMM4.0_10SEMPNTX S:\agilent\e8285\ALR\Book\chapters\disassembly.fm...
Page 89 Disassembly and Replaceable Parts Disassembly Procedures Top-Side Assemblies 1. Remove the external and internal covers, see "External and Internal Covers" on page 2. Using Figure 3-3, identify the module or board assembly you want to remove and lift the module or board assembly from the mother board.
Page 90 Disassembly and Replaceable Parts Disassembly Procedures Audio Analyzer and Filter Assemblies Figure 3-4 Audio Analyzer and Filter Assemblies AUDIO_ANALYZER_1_KIT 1/4 turn to remove or secure board. Opt. Description CCITT_FLTR C_MESS_FLTR 6KHZ_BPF_#014 S:\agilent\e8285\ALR\Book\chapters\disassembly.fm...
Page 91 Disassembly and Replaceable Parts Disassembly Procedures Replacing the Controller Restoring Calibration Data in Controller Assembly NOTE Calibration data for the entire Test Set is stored in EEPROM on the controller (CONTROLLER_-KIT) assembly, see Figure 3-5. When replacing the controller assembly, you must remove the “CAL MODULE”...
Page 92 Disassembly and Replaceable Parts Disassembly Procedures Batteries (Memory and Regulator Assemblies) Figure 3-6 MEMORY_(SRBC)_KIT Assembly MEMORY_(SRBC)_KIT BTRY_3.0V_1AH Figure 3-7 REGULATOR_-KIT Assembly BTRY_3.0V_1.2AH REGULATOR_-KIT S:\agilent\e8285\ALR\Book\chapters\disassembly.fm...
Page 93 Disassembly and Replaceable Parts Disassembly Procedures Bottom-Side Assemblies 1. Remove the external and internal cover, see "External and Internal Covers" on page 2. Use Figure 3-8 through Figure 3-13 to identify and remove the assembly desired. Figure 3-8 Bottom-Side Assemblies RBN-20CNDCT_28AWG-26 SR_3.58_SMA-SMA-25 BRACKET_RFIO...
Page 94 Disassembly and Replaceable Parts Disassembly Procedures Figure 3-9 Bottom-side Subassemblies DNCONV_KIT RF/IO_KIT UPCONV_-KIT COAXIAL_SPDT_SW PCMCIA_CARD_READER_KIT CHASSIS_AY_BOX BRACKET_RELAY MOTHERBOARD CHASSIS NOTE: There is a combined MOTHERBOARD/CHASSIS KIT. S:\agilent\e8285\ALR\Book\chapters\disassembly.fm...
Page 95 Disassembly and Replaceable Parts Disassembly Procedures Downconverter Assembly To remove this assembly disconnect the cables, connectors, and 4 screws shown in Figure 3-10. Figure 3-10 Downconverter Removal RBN_20CNDCT_28AWG-26 CX_F_SMB-SMB-170 CX_F_SMB-SMB-530 DNCONV_KIT SR_3.58_SMA-SMA-25 downcnvrtr_disassembly.eps Upconverter Assembly To remove this assembly disconnect the cables, connectors, and 4 screws shown in Figure 3-11.
Page 96 Disassembly and Replaceable Parts Disassembly Procedures RF I/O and Coaxial Switch Assemblies To remove the RF I/O or coaxial switch assembly, or other associated components, see Figure 3-12. Figure 3-12 RF I/O and Coaxial Switch Assemblies Removal CX_F_SMB-SMB-530 SMM4.0_10SEMPNTX (Qty. 4) RBN_20CNDCT_28AWG-26 SR_3.58_SMA-SMA-25 BRACKET_RFI/O...
Page 97 Disassembly and Replaceable Parts Disassembly Procedures PCMCIA Assembly To remove this assembly, disconnect the ribbon cable and 2 screws securing the assembly. Figure 3-13 PCMCIA Assembly Removal SMM4.0_10SEMPNTX PCMCIA_CARD_READER_KIT RBN_68CNDC30AWG pcmcia2.eps...
Page 98 Disassembly and Replaceable Parts Disassembly Procedures Motherboard Assembly 1. Remove the external and internal covers, see "External and Internal Covers" on page 2. Remove all top and bottom side subassemblies from the Test Set (see previous disassembly procedures). 3. Remove the bracket relay from the chassis, see Figure 3-14.
Page 99 Disassembly and Replaceable Parts Disassembly Procedures Front Panel Assembly The front-panel assembly must be removed from the Test Set’s chassis before any of the front panel subassemblies can be removed. 1. Remove the external and internal covers, see "External and Internal Covers"...
Page 100 Disassembly and Replaceable Parts Disassembly Procedures Figure 3-16 Front Panel Subassemblies DISPLAY_CVR_AY RBN_10CNDCT28AWG DISPLAY_-KIT WINDOW-DISPLY RBN_50CNDCT28AWG CA_-ASSY_SPEAKER CBL_AY_VOL_CONT CX_F_BNC-SMB KNOB_ASSY_3/8 KNOB-31_DIA S:\agilent\e8285\ALR\Book\chapters\disassembly.fm...
Page 101 Disassembly and Replaceable Parts Disassembly Procedures 1. Remove the external and internal-top covers. See "External and Internal Covers" on page 2. To remove either fan (see Figure 3-17) disconnect its power connector to the motherboard, and remove the 4 screws securing the fan to the Test Set chassis.
Page 102 Disassembly and Replaceable Parts Disassembly Procedures Power Supply 1. Remove the external and internal top and bottom cover, see Figure 3-2 on page 2. Remove the 6 screws securing the power supply assembly to the Test Set’s chassis, see Figure 3-18.
Page 103 Disassembly and Replaceable Parts Disassembly Procedures Figure 3-19 Power Supply Subassemblies SMM3.0_8SEMPNTX HEATSINK PLATE RBN_16CNDCT_28AWG SMM4.0_10SEMPNTX (Qty. 6) HRN-20CNDCT_18AWG POWER_SUPPLY REAR_PANEL_CONNECTOR_ASSY E8285-61013 NOTE: When reassembling power supply assembly to chassis, ensure guide pins are aligned properly into chassis...
Page 104 Disassembly and Replaceable Parts Disassembly Procedures Figure 3-20 Power Supply Assembly Rear Panel SA TRIG OUT CELLSITE/TRIGGERS WSHR_LK_.1941D (Qty2) STDF_.327l_6-32 (Qty. 2) CONN_SCREWLOCK_F (Qty. 14) LINE_MODULE CA_CX_BNC-DSUB_2 NUT-HEX-DBL-CHAM (Qty. 9) S:\agilent\e8285\ALR\Book\chapters\disassembly.fm...
Page 105: Parts List
Disassembly and Replaceable Parts Parts List Parts List Table 3-1 Replaceable Parts Description Part Number 6KHZ_BPF_#014_AY 08920-60268 ANALOG_C-SITE_KIT (FW Rev A.04.54 and below) 08924-61807 ANALOG_C-SITE_KIT (FW Rev A.05.03 and above) E8285-61845 APPLICATN_GUIDE E8285-90019 AUDIO_ANALYZER_#1_KIT 08920-61811 AUDIO_ANALYZER_2_KIT 08920-61853 AY, _STRAP_HANDLE E8285-61012 BTRY_3.0V_1AH [on MEMORY_(SRBC)_KIT] 1420-0394 BTRY_3.0V_1.2AH [on REGULATOR_-KIT]...
Page 106 Disassembly and Replaceable Parts Parts List Description Part Number CORE_SHIELD_BEAD_AY E8285-61058 COVER_BOTTOM E8285-00012 COVER_EXTERNAL E8285-00070 CX_A06A06_120 8120-5846 CX_F_BNC-SMB E8285-61018 CX_F_SMB-SMB_170 E8285-61049 CX_F_SMB-SMB_530 E8285-61051 DIG_CELLSITE_-KIT E8285-61832 DIGITAL_CVR_AY E8285-61009 DISPLAY_-KIT E8285-61823 DISPLAY_DRIVER_KIT E6380-61816 DNCONV_KIT (FW Rev A.02.XX and below) E6380-61808 DNCONV_KIT (FW Rev A.04.5X and above) E8285-61861 DSP_-KIT E8285-61812...
Page 107 Disassembly and Replaceable Parts Parts List Description Part Number I/Q_MOD_KIT 08924-61806 KEY_MAT E8285-40001 KEYBOARD_-ASSY E8285-60141 KNOB-31_DIA E5515-21052 KNOB_ASSY_3/8 0370-3409 MANUAL_CD_ROM E8285-10004 MEASUREMENT_KIT 08920-61836 MEMORY_(SBRC)_KIT E6380-61801 MOD_DISTRIBUTION_KIT 08920-61809 MOTHER_BD_AY E8285-60101 MOTHERBOARD/CHASSIS_-KIT E8285-61801 NUT-HEX-DBL-CHAM 0590-2332 PCMCIA_CARD_READER_KIT E6380-61803 POWER_SUPPLY 0950-2665 PROTOCOL_PROC_-KIT E8285-61813 RBN_10CNDCT28AWG 1253-0851 RBN_16CNDCT_28AWG E8285-61032...
Page 108 Disassembly and Replaceable Parts Parts List Description Part Number RF_COVER_AY E8285-61008 RF_OUTPUT_KIT (FW Rev A.02.XX and below) E6380-61832 RF_OUTPUT_KIT (FW Rev A.04.5X and above) E8285-61859 SCR-MACH_MS10.8 0515-2694 SHIELD_DISPLAY E8285-00054 SIGGEN_SYNTH_KIT 08921-61819 SIGNAL_SOURCE_KIT 08920-61850 SMM3.0_12SEMPNTX 0515-0664 SMM3.0_18_PN_TX 0515-0682 SMM3.0_6_FL_TX 0515-1227 SMM3.0_6SEMPNTX 0515-2126 SMM3.0_8_FL_TX 0515-1102...
Page 109 Disassembly and Replaceable Parts Parts List Description Part Number TRIM_STRIP_1 5041-9173 TRIM_STRIP_2 5041-9176 UPCONV_-KIT (FW Rev A.02.XX and below) E8285-61811 UPCONV_-KIT (FW Rev A.04.5X and above) E8285-61862 USERS_GUIDE E8285-90018 WINDOW-DISPLY E6380-21010 WSHR_LK_.1941D 2190-0577...
Page 110 Disassembly and Replaceable Parts Parts List S:\agilent\e8285\ALR\Book\chapters\disassembly.fm...
Page 111: Functional Verification
Functional Verification The purpose of this chapter is to provide loopback self-tests and mobile phone test procedures that quickly verify the functional performance of the Test Set.
Page 112 • To minimize unnecessary Test Set swapping • To identify the root cause of poor test system yields if related to the Test Set • To improve user test system quality confidence level • To educate current and new production technicians on Agilent Technologies products S:\agilent\e8285\ALR\Book\chapters\verif.fm...
Page 113 Functional Verification Process Efficiency Recommendations Process Efficiency Recommendations A. Identify a test-standard “Golden Mobile” phone for each production line. This phone will be used to verify your test system and Test Set performance B. Characterize components of each test system: Generate baseline performance data for each Test Set Generate baseline performance data for each fixture Generate baseline normalization data for external path losses...
Page 114 Functional Verification Analog Loopback Analog Loopback NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set. Analog loopback configures the Test Set to test all of its major functions.
Page 115 Functional Verification Analog Loopback 4. Turn up the VOLUME knob to hear the 1 kHz tone. 5. SINAD meter should read >35 dB. 6. Change the Amplitude setting to –100 dBm., the SINAD meter should read >12 dB. 7. Record results in Table 4-1 on page 123.
Page 116 Functional Verification Wideband Sweep Wideband Sweep NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set. NOTE This functional performance test requires the spectrum analyzer option in the Test Set.
Page 117 Functional Verification Channel Power Loopback Verification Test Channel Power Loopback Verification Test Channel power is extremely important in the ability of the Test Set to maintain a link with and properly control power output levels of the mobile phone under test. Channel power loopback verification is a quick way to ensure that both the average and channel power measurements are working properly.
Page 118 Functional Verification ROM-Based Diagnostics and Calibration ROM-Based Diagnostics and Calibration Comprehensive internal IBASIC diagnostics are provided to aid in troubleshooting the Test Set. These diagnostic programs use external cabling and the internal measurement and path setting capabilities of the Test Set to diagnose itself for RF and audio hardware problems.
Page 119 Functional Verification ROM-Based Diagnostics and Calibration Figure 4-1 SERVICE MENU Chapter 4...
Page 120 Functional Verification Channel Power Calibration Channel Power Calibration To ensure the accuracy of the Test Set power measurement, channel power calibration should be run before the mobile phone functional test portion of the performance verification test plan. 1. Press the Preset key to configure instrument to default settings. 2.
Page 121 Functional Verification CDMA Mobile Phone Functional Test CDMA Mobile Phone Functional Test 1. Connect the mobile phone to the Test Set. 2. Setup for call processing: Knowledge of the mobile’s System ID, RF Channel, and RF Channel capability NOTE are essential to call processing. Therefore, the mobile phone functional test may not be successful if this information is not known.
Page 122 Functional Verification CDMA Mobile Phone Functional Test • Press the Call/Page key on the Test. • Test Set should page the mobile. • Mobile should automatically connect to Test Set. 6. Mobile phone measurements (record all test results in Table 4-1 on page 123.
Page 123 Functional Verification Functional Verification Test Record Functional Verification Test Record Tested By______________Date_________ Test Set Serial #_____________ Cell Phone ESN #________________Cell Phone MIN #_________________ Table 4-1 Functional Verification Test Record Power Up Self-Test Pass / Fail All self tests passed Channel Power Loopback Verification Test Pass / Fail Channel Power Accuracy Analog Loopback...
Page 124 Functional Verification Functional Verification Test Record Table 4-1 Functional Verification Test Record Page to Mobile Origination from Mobile Functional Tests Procedures (see “CDMA Mobile Phone Pass / Fail Functional Test” on page 121) Receiver FER Transmitter Rho Mobile Channel Power S:\agilent\e8285\ALR\Book\chapters\verif.fm...
Page 125 Periodic Adjustments/Calibration This chapter contains the periodic adjustment procedures for the Test Set.
Page 126: Periodic Adjustments/Calibration Periodic Adjustments
Periodic Adjustments/Calibration Periodic Adjustments Periodic Adjustments Some assemblies or combinations of assemblies require periodic adjustments to compensate for variations in circuit performance due to age or environment. There are two types of calibration data: • Factory-generated digital data either on memory cards, or on-board ROMs (which are on the assemblies themselves) •...
Page 127 Periodic Adjustments/Calibration Periodic Adjustments Table 5-1 Assembly Calibration Information Calibration Data Location Calibration Program: Assembly Sub Program Memory on Assembly Card Audio Analyzer 1 Periodic Calibration: Audio Analyzer 1 Offset Modulation Distribution Periodic Calibration: External Modulation Path Gain, and, AF GEN Gain Upconverter Output Section Signal Generator...
Page 128 Periodic Adjustments/Calibration Periodic Adjustments Test Equipment Test Equipment for the Periodic Adjustments Programs • For the Timebase Reference Using a Counter calibration you will need to connect a frequency counter to the rear-panel 10 MHz REF OUTPUT connector. The accuracy of the counter will determine the accuracy of the Test Set’s internal reference.
Page 129: Storing Calibration Factors
Periodic Adjustments/Calibration Storing Calibration Factors Storing Calibration Factors You should understand the calibration-factor-storage process before running any of the following programs: Periodic Calibration, IQ Calibration, IQ Demod Path Calibration, or System Power Calibration. As a program runs, calibration factors are computed and applied. When all the calibration factors have been acquired, the program stops and asks if the user wants the calibration factors to be stored.
Page 130: Running The Periodic Iq, Or Iq Demod Path Calibration Programs
Periodic Adjustments/Calibration Running the Periodic IQ, or IQ Demod Path Calibration Programs Running the Periodic IQ, or IQ Demod Path Calibration Programs 1. Press Tests key to access the TESTS (Main Menu) screen, see Figure 5-2. 2. Select the field under Select Procedure Location:. 3.
Page 131: Periodic Calibration Menu Descriptions
Periodic Adjustments/Calibration Periodic Calibration Menu Descriptions Periodic Calibration Menu Descriptions This section describes the adjustment programs listed under the Periodic Calibration menu. Figure 5-3 Periodic Calibration Periodic Calibration Menu Screen...
Page 132 Periodic Adjustments/Calibration Periodic Calibration Menu Descriptions Timebase Reference Using a Counter This program is used to manually tune the timebase reference using a frequency counter as the time standard. This procedure has two basic steps: 1. Coarse and fine manual adjustment of the two timebase tuning DACs. 2.
Page 133 Periodic Adjustments/Calibration Periodic Calibration Menu Descriptions Voltmeter References When you select the Voltmeter Reference calibration, instructions are displayed explaining how to measure the negative and positive references with an external voltmeter. The user is required to key in the readings. If the readings are within range, the two values are automatically downloaded.
Page 134 Periodic Adjustments/Calibration Periodic Calibration Menu Descriptions External Modulation Path Gain The Audio Frequency Generator Gain program should be performed before running the External Modulation Path Gain program. The “path” in this program runs from the external MODULATION IN connector through the Modulation Distribution assembly, through the Monitor Select Switch, and then through Audio Analyzer 1 to the Test Set’s internal DVM.
Page 135: Setting The Timebase Latches
Periodic Adjustments/Calibration Setting the Timebase Latches Setting the Timebase Latches The refs_DAC_coarse and ref_DAC_fine values adjust the frequency of the Test Set’s internal 10 MHz reference. They are stored in memory. The controller reads the values and sends the appropriate adjustment to the Reference assembly.
Page 136 Periodic Adjustments/Calibration Setting the Timebase Latches 10. Select the Value field. 11. Rotate the knob until the counter reads as close to 10 MHz as possible. 12. Store the new DAC values (timebase calibration data) in non-volatile memory by selecting and running the Timebase Reference Using a Counter routine from the Periodic Calibration Menu.
Page 137: Iq Calibration Program Description
Periodic Adjustments/Calibration IQ Calibration Program Description IQ Calibration Program Description The goal of IQ Calibration (see Figure 5-6 on page 138) is to minimize the carrier feedthrough while maximizing the Rho of the IQ signal. There are four DACs involved in this adjustment: •...
Page 138 Periodic Adjustments/Calibration IQ Calibration Program Description Figure 5-6 IQ Calibration S:\agilent\e8285\ALR\Book\chapters\period_adj.fm...
Page 139: Iq Demod Path Calibration Program Description
Periodic Adjustments/Calibration IQ Demod Path Calibration Program Description IQ Demod Path Calibration Program Description Figure 5-7 IQ Modulation Path Calibration...
Page 140 Periodic Adjustments/Calibration IQ Demod Path Calibration Program Description S:\agilent\e8285\ALR\Book\chapters\period_adj.fm...
Page 141: Performance Tests
Performance Tests This chapter contains the performance test procedures for the Test Set. The tests in this chapter verify that the Test Set performs to its published specifications.
Page 142: Procedure And Equipment
To find alternatives to the equipment listed in table 6-1, look up their specifications in the Agilent Technologies Test and Measurement Catalog and use the specifications to find equivalent instruments. The test procedures give critical instrument settings and connections, but they don’t tell how to operate the instruments.
Page 143 Performance Tests Procedure and Equipment Table 6-1 Required Test Equipment by Model Agilent Model Number Model Name Test Number Mini-Circuits ZFL-2000 Amplifier 1 or equivalent GTC RF Products GRF Amplifier 2 27, 28 5016 or equivalent 3458A Multimeter 8-9, 12, 15, 18 5316A Counter 11, 16...
Page 144 Performance Tests Procedure and Equipment Table 6-2 Performance Tests & Records Location Test Record in Performance Tests Chapter 7, (in this chapter) “Performance Test Records.” “RF Generator FM Distortion Performance Test 1” on page 146 page 202 “RF Generator FM Accuracy Performance Test 2” on page 149 page 204 “RF Generator FM Flatness Performance Test 3”...
Page 145 Performance Tests Procedure and Equipment Test Record in Performance Tests Chapter 7, (in this chapter) “Performance Test Records.” “CDMA Generator Modulation Accuracy Performance Test 27” on page 194 page 245 “CDMA Analyzer Average Power Level Accuracy Performance Test 28” on page 196 page 246 “CDMA Analyzer Channel Power Level Accuracy Performance Test 29”...
Page 146: Rf Generator Fm Distortion
Performance Tests RF Generator FM Distortion Performance Test 1 RF Generator FM Distortion Performance Test 1 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-1, "RF Generator FM Distortion Test 1 Record"...
Page 147 Performance Tests RF Generator FM Distortion Performance Test 1 Procedure NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 148 Performance Tests RF Generator FM Distortion Performance Test 1 5. On the measuring receiver: a. Set the frequency offset mode to enter and enable the LO frequency (27.3 Special). b. Key in the LO frequency (in MHz) which is 1500. 6.
Page 149: Rf Generator Fm Accuracy
Performance Tests RF Generator FM Accuracy Performance Test 2 RF Generator FM Accuracy Performance Test 2 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-2, "RF Generator FM Accuracy Test 2 Record"...
Page 150 Performance Tests RF Generator FM Accuracy Performance Test 2 Procedure NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 151 Performance Tests RF Generator FM Accuracy Performance Test 2 5. On the measuring receiver: a. Set the frequency offset mode to enter and enable the LO frequency (27.3 Special). b. Key in the LO frequency (in MHz) which is 1500. 6.
Page 152: Rf Generator Fm Flatness
Performance Tests RF Generator FM Flatness Performance Test 3 RF Generator FM Flatness Performance Test 3 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-3, "RF Generator FM Flatness Test 3 Record"...
Page 153 Performance Tests RF Generator FM Flatness Performance Test 3 Procedure NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 154 Performance Tests RF Generator FM Flatness Performance Test 3 5. On the measuring receiver: a. Set the frequency offset mode to enter and enable the LO frequency (27.3 Special). b. Key in the LO frequency (in MHz) which is 1500. 6.
Page 155: Rf Generator Residual Fm
Performance Tests RF Generator Residual FM Performance Test 4 RF Generator Residual FM Performance Test 4 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-4, "RF Generator Residual FM Test 4 Record"...
Page 156 Performance Tests RF Generator Residual FM Performance Test 4 Figure 6-8 Setup for Measurements to 2 GHz Using a Microwave Converter CALL CONTROL UTILITIES Answer Print Printer I/O config Help Call/ End/ Register Tests Config Previous Message Preset Page Release Hold Meas USER...
Page 157 Performance Tests RF Generator Residual FM Performance Test 4 b. Set the measurement mode to AC level. c. Select the CCITT Weighting filter. d. Set the low-pass filter to 30 kHz. 4. On the Test Set: a. Press Preset b. Select the CONFIGURE screen. c.
Page 158: Rf Generator Level Accuracy
Performance Tests RF Generator Level Accuracy Performance Test 5 RF Generator Level Accuracy Performance Test 5 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-5, "RF Generator Level Accuracy Test 5 Record"...
Page 159 Performance Tests RF Generator Level Accuracy Performance Test 5 Make sure the sensor module’s calibration data is entered into the measuring NOTE receiver. 2. Connect the equipment as shown in Setup 1 whether intending to measure frequencies to 1 GHz or 2 GHz. 3.
Page 160 Performance Tests RF Generator Level Accuracy Performance Test 5 Setup 2 Figure 6-10 Setup 2 for Measurements of 1700 and 2000 MHz CALL CONTROL UTILITIES Answer Print Printer I/O config Help Call/ End/ Register Tests Config Previous Message Preset Page Release Hold Meas...
Page 161 Performance Tests RF Generator Level Accuracy Performance Test 5 6. On the signal generator set the level to +8 dBm or whatever level is suitable for the microwave converter’s LO input. 7. For frequencies of 1700 and 2000 MHz perform the following: a.
Page 162 Performance Tests RF Generator Level Accuracy Performance Test 5 For example, if: RF power measured at −11 dBm in step 3b or 5b = −10.2 dBm RF level measured at −83 dBm in step 7i = −70.1 dB RF level measured at −83 dBm in step 7j = −52.6 dB RF level measured at −101 dBm in step 7k = −73.2 dB the corrected level at −101 dBm is −10.2 + (−70.1) −...
Page 163: Rf Generator Harmonics Spectral Purity
Performance Tests RF Generator Harmonics Spectral Purity Performance Test 6 RF Generator Harmonics Spectral Purity Performance Test 6 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-6, "RF Generator Harmonics Spectral Purity Test 6 Record"...
Page 164 Performance Tests RF Generator Harmonics Spectral Purity Performance Test 6 3. Set the Test Set’s RF generator to the frequencies and levels shown in the Performance Test Record (PTR) and measure the second and third harmonics. For each measurement convert the harmonic level to dB below the fundamental (dBc) and compare the computed levels to the limits.
Page 165: Rf Generator Spurious Spectral Purity
Performance Tests RF Generator Spurious Spectral Purity Performance Test 7 RF Generator Spurious Spectral Purity Performance Test 7 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-7, "RF Generator Spurious Spectral Purity Test 7 Record"...
Page 166 Performance Tests RF Generator Spurious Spectral Purity Performance Test 7 3. Set the Test Set’s RF generator to the frequencies shown in the Performance Test Record (PTR) and measure the level of the spurious signals at the frequencies shown. For each measurement convert the harmonic level to dB below the fundamental (dBc) and compare the computed levels to the limits.
Page 167: Af Generator Ac Level Accuracy
Performance Tests AF Generator AC Level Accuracy Performance Test 8 AF Generator AC Level Accuracy Performance Test 8 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-8, "AF Generator AC Level Accuracy Test 8 Record"...
Page 168: Af Generator Dc Level Accuracy
Performance Tests AF Generator DC Level Accuracy Performance Test 9 AF Generator DC Level Accuracy Performance Test 9 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-9, "AF Generator DC Level Accuracy Test 9 Record"...
Page 169: Af Generator Residual Distortion
Performance Tests AF Generator Residual Distortion Performance Test 10 AF Generator Residual Distortion Performance Test 10 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-10, "AF Generator Residual Distortion Test 10 Record"...
Page 170: Af Generator Frequency Accuracy
Performance Tests AF Generator Frequency Accuracy Performance Test 11 AF Generator Frequency Accuracy Performance Test 11 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-11, "AF Generator Frequency Accuracy Test 11 Record"...
Page 171: Af Analyzer Ac Level Accuracy
Performance Tests AF Analyzer AC Level Accuracy Performance Test 12 AF Analyzer AC Level Accuracy Performance Test 12 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-12, "AF Analyzer AC Voltage Accuracy Test 12 Record"...
Page 172: Af Analyzer Residual Noise
Performance Tests AF Analyzer Residual Noise Performance Test 13 AF Analyzer Residual Noise Performance Test 13 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-13, "AF Analyzer Residual Noise Test 13 Record"...
Page 173: Af Analyzer Distortion And Sinad Accuracy
Performance Tests AF Analyzer Distortion and SINAD Accuracy Performance Test 14 AF Analyzer Distortion and SINAD Accuracy Performance Test 14 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-14, "AF Analyzer Distortion and SINAD Accuracy Test 14 Record"...
Page 174: Af Analyzer Dc Level Accuracy
Performance Tests AF Analyzer DC Level Accuracy Performance Test 15 AF Analyzer DC Level Accuracy Performance Test 15 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-15, "AF Analyzer DC Level Accuracy Test 15 Record"...
Page 175: Af Analyzer Frequency Accuracy To 100 Khz
Performance Tests AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-16, "AF Analyzer Frequency Accuracy to 100 kHz Test 16 Record"...
Page 176: Af Analyzer Frequency Accuracy At 400 Khz
Performance Tests AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-17, "AF Analyzer Frequency Accuracy at 400 kHz Test 17 Record"...
Page 177: Oscilloscope Amplitude Accuracy
Performance Tests Oscilloscope Amplitude Accuracy Performance Test 18 Oscilloscope Amplitude Accuracy Performance Test 18 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-18, "Oscilloscope Amplitude Accuracy Test 18 Record"...
Page 178 Performance Tests Oscilloscope Amplitude Accuracy Performance Test 18 4. Set the frequency as shown in the Performance Test Record (PTR). For each setting, perform the following: a. Adjust the level until the digital multimeter reads 5 V. b. Set Controls to Main and adjust the Time/Div on the Test Set to display 2 to 3 cycles of the waveform.
Page 179: Rf Analyzer Level Accuracy
Performance Tests RF Analyzer Level Accuracy Performance Test 19 RF Analyzer Level Accuracy Performance Test 19 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-19, "RF Analyzer Level Accuracy Test 19 Record"...
Page 180: Rf Analyzer Fm Accuracy
Performance Tests RF Analyzer FM Accuracy Performance Test 20 RF Analyzer FM Accuracy Performance Test 20 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-20, "RF Analyzer FM Accuracy Test 20 Record"...
Page 181 Performance Tests RF Analyzer FM Accuracy Performance Test 20 c. Set the amplitude to 1.42 V. 3. On the signal generator: a. Set the output frequency to 840 MHz. b. Set the amplitude to 0.0 dBm. c. Set the function to FM with EXT AC Modulation. 4.
Page 182: Rf Analyzer Fm Distortion
Performance Tests RF Analyzer FM Distortion Performance Test 21 RF Analyzer FM Distortion Performance Test 21 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-21, "RF Analyzer FM Distortion Test 21 Record"...
Page 183 Performance Tests RF Analyzer FM Distortion Performance Test 21 a. Reset the instrument. b. Set the output frequency to 1 kHz. c. Set the output amplitude to 1.4 V. d. Set the measurement mode to distortion. 3. On the signal generator: a.
Page 184: Rf Analyzer Fm Bandwidth
Performance Tests RF Analyzer FM Bandwidth Performance Test 22 RF Analyzer FM Bandwidth Performance Test 22 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-22, "RF Analyzer FM Bandwidth Test 22 Record"...
Page 185 Performance Tests RF Analyzer FM Bandwidth Performance Test 22 2. On the audio analyzer: a. Reset the instrument. b. Set the output frequency to 1 kHz. c. Set the output amplitude to 1.4 V. 3. On the signal generator: a. Set the output frequency to 840 MHz. b.
Page 186: Rf Analyzer Residual Fm
Performance Tests RF Analyzer Residual FM Performance Test 23 RF Analyzer Residual FM Performance Test 23 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-23, "RF Analyzer Residual FM Test 23 Record"...
Page 187 Performance Tests RF Analyzer Residual FM Performance Test 23 3. Read the FM deviation (residual FM) for each both RF frequencies (840 and 1800 MHz) and record the deviation read on the Test Set in the Performance Test Record and compare it to the limits.
Page 188: Spectrum Analyzer Image Rejection
Performance Tests Spectrum Analyzer Image Rejection Performance Test 24 Spectrum Analyzer Image Rejection Performance Test 24 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-24, "Spectrum Analyzer Image Rejection (Image) Test 24 Record"...
Page 189 Performance Tests Spectrum Analyzer Image Rejection Performance Test 24 e. Set the RF In/Ant field to Ant. f. Set the Ref Level field to -25 dBm. g. Set the Span field to 5 kHz. h. Set the Controls field to Marker. i.
Page 190: Cdma Generator Rf In/Out Amplitude Level Accuracy
Performance Tests CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25 CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-25, "CDMA Generator RF In/Out Test 25 Record"...
Page 191 Performance Tests CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25 3. On the Test Set: a. Press Preset b. Select the CONFIGURE screen and set RF display to freq. c. Select the CDMA CALL CONTROL screen. d. Set the RF Gen Freq field to 836.52 MHz. e.
Page 192: Cdma Generator Duplex Out Amplitude Level Accuracy
Performance Tests CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 The purpose of this test is to verify the amplitude level accuracy of the CDMA generator at the DUPLEX OUT port by using the CDMA analyzer to verify it meets the specification limits in PTR (Performance Test Record) table 7-26, "CDMA Generator DUPLEX OUT Sector B Power Level Accuracy Test 26...
Page 193 Performance Tests CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 13. Set the AWGN Power field to the values listed in the PTR for AWGN power. table 7-27, "CDMA Generator DUPLEX OUT AWGN Power Level Accuracy Test 26 Record" on page 244.
Page 194: Cdma Generator Modulation Accuracy
Performance Tests CDMA Generator Modulation Accuracy Performance Test 27 CDMA Generator Modulation Accuracy Performance Test 27 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-28, "CDMA Generator Modulation Accuracy Test 27 Record"...
Page 195 Performance Tests CDMA Generator Modulation Accuracy Performance Test 27 2. On the Vector Signal Analyzer: a. Press the key. Frequency b. Set center frequency to 881.52 MHz. c. Set the span to 2.6 MHz. d. Press the Instrument Mode e. Press the (F4) key Digital Demodulation f.
Page 196: Cdma Analyzer Average Power Level Accuracy
Performance Tests CDMA Analyzer Average Power Level Accuracy Performance Test 28 CDMA Analyzer Average Power Level Accuracy Performance Test 28 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-29, "CDMA Analyzer Average Power Level Accuracy Test 28 Record"...
Page 197 Performance Tests CDMA Analyzer Average Power Level Accuracy Performance Test 28 2. On the Test Set: a. Press Preset b. Select the CONFIGURE screen. c. Set the RF Display field to Freq. d. Set the (Gen)-(Anl) field to 0 MHz. e.
Page 198: Cdma Analyzer Channel Power Level Accuracy
Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 29 CDMA Analyzer Channel Power Level Accuracy Performance Test 29 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) table 7-30, "CDMA Analyzer Channel Power Level Accuracy Test 29 Record"...
Page 199 Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 29 3. On the Test Set: a. Press Preset b. Change the Avg Pwr field to Chan Pwr. c. Verify the RF Channel is set at 384. d. Select Calibrate under Chn Pwr Cal. 4.
Page 200 Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 29 S:\agilent\e8285\ALR\Book\chapters\perf_test.fm...
Page 201 Performance Test Records Use this chapter to record the results of the performance tests in Chapter 6, “Performance Tests,” on page 141. Test Sets with firmware revision A.04.5X and above operate only at RF NOTE frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range”...
Page 202: Performance Test Records Rf Generator Fm Distortion Performance Test 1 Record
Performance Test Records RF Generator FM Distortion Performance Test 1 Record RF Generator FM Distortion Performance Test 1 Record For test procedure, see “RF Generator FM Distortion Performance Test 1” on page 146. Table 7-1 RF Generator FM Distortion Test 1 Record Applicable FM Distortion Limits (%) Deviation...
Page 203 Performance Test Records RF Generator FM Distortion Performance Test 1 Record Applicable FM Distortion Limits (%) Deviation Rate Firmware (MHz) (kHz) (kHz) Revision Upper Actual 1000 0.50 1000 0.50 1000 0.50 1000 0.50 998.401 0.50 <A.02.XX 768.001 0.50 <A.02.XX 512.001 0.50 <A.02.XX 511.601...
Page 204: Rf Generator Fm Accuracy Performance Test 2 Record
Performance Test Records RF Generator FM Accuracy Performance Test 2 Record RF Generator FM Accuracy Performance Test 2 Record For test procedure, see “RF Generator FM Accuracy Performance Test 2” on page 149. Table 7-2 RF Generator FM Accuracy Test 2 Record Applicable FM Deviation Limits (kHz) Deviation...
Page 205 Performance Test Records RF Generator FM Accuracy Performance Test 2 Record Applicable FM Deviation Limits (kHz) Deviation Rate Firmware (MHz) (kHz) (kHz) Revision Lower Upper Actual 1000 2.845 3.155 The following entries are for the 2 GHz setup. 1700 95.035 102.965 1700 47.750...
Page 206: Rf Generator Fm Flatness Performance Test 3 Record
Performance Test Records RF Generator FM Flatness Performance Test 3 Record RF Generator FM Flatness Performance Test 3 Record For test procedure, see “RF Generator FM Flatness Performance Test 3” on page 152. Table 7-3 RF Generator FM Flatness Test 3 Record Computed FM Measured Computed...
Page 207 Performance Test Records RF Generator FM Flatness Performance Test 3 Record Computed FM Measured Computed Applicable Flatness Limits Reading Results AFGEN1 Level Deviation Firmware Freq. Rate (dB) (kHz) (dB) (dBm) (MHz) (kHz) Revision (kHz) Lower Upper Reading Computed −10 −1 2000 −10 −1...
Page 208: Rf Generator Residual Fm Performance Test 4 Record
Performance Test Records RF Generator Residual FM Performance Test 4 Record RF Generator Residual FM Performance Test 4 Record For test procedure, see “RF Generator Residual FM Performance Test 4” on page 155. Table 7-4 RF Generator Residual FM Test 4 Record Applicable Residual FM Limits (Hz) Firmware...
Page 209 Performance Test Records RF Generator Residual FM Performance Test 4 Record Applicable Residual FM Limits (Hz) Firmware (MHz) (MHz) Revision Upper Actual 1001.5 1000 The following entries are for the 2 GHz setup. 201.5 1700 501.5 2000...
Page 210: Rf Generator Level Accuracy Performance Test 5 Record
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record RF Generator Level Accuracy Performance Test 5 Record For test procedure, see “RF Generator Level Accuracy Performance Test 5” on page 158. Table 7-5 RF Generator Level Accuracy Test 5 Record Applicable Level Limits (dBm) Level...
Page 211 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Applicable Level Limits (dBm) Level Firmware Port (MHz) (dBm) Revision Lower Upper Actual −22 −23 −21 <A.02.XX RF IN/OUT −27 −28 −26 <A.02.XX RF IN/OUT −32 −33 −31 <A.02.XX RF IN/OUT −37 −38...
Page 212 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Applicable Level Limits (dBm) Level Firmware Port (MHz) (dBm) Revision Lower Upper Actual −56 −57 −55 DUPLEX OUT −61 −62 −60 DUPLEX OUT −66 −67 −65 DUPLEX OUT −71 −72 −70 DUPLEX OUT...
Page 213 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Applicable Level Limits (dBm) Level Firmware Port (MHz) (dBm) Revision Lower Upper Actual −102 −103 −101 RF IN/OUT −107 −108 −106 RF IN/OUT −112 −113 −111 RF IN/OUT −117 −118 −116 RF IN/OUT...
Page 214 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Applicable Level Limits (dBm) Level Firmware Port (MHz) (dBm) Revision Lower Upper Actual −37 −38 −36 RF IN/OUT 1000 −42 −43 −41 RF IN/OUT 1000 −47 −48 −46 RF IN/OUT 1000 −52 −53...
Page 215 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Applicable Level Limits (dBm) Level Firmware Port (MHz) (dBm) Revision Lower Upper Actual −68 −69 −67 DUPLEX OUT 1700 −73 −74 −72 DUPLEX OUT 1700 −78 −79 −77 DUPLEX OUT 1700 −83 −84...
Page 216 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Applicable Level Limits (dBm) Level Firmware Port (MHz) (dBm) Revision Lower Upper Actual −113 −114.25 −111.75 RF IN/OUT 1700 −118 −119.25 −116.75 RF IN/OUT 1700 −13 −14 −12 DUPLEX OUT 2000 −18 −19...
Page 217 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Applicable Level Limits (dBm) Level Firmware Port (MHz) (dBm) Revision Lower Upper Actual −48 −49.25 −46.75 RF IN/OUT 2000 −53 −54.25 −51.75 RF IN/OUT 2000 −58 −59.25 −56.75 RF IN/OUT 2000 −63 −64.25...
Page 218: Rf Generator Harmonics Spectral Purity Performance Test 6 Record
Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record RF Generator Harmonics Spectral Purity Performance Test 6 Record For test procedure, see “RF Generator Harmonics Spectral Purity Performance Test 6” on page 163. Table 7-6 RF Generator Harmonics Spectral Purity Test 6 Record Applicable Harmonic Limits (dBc) Level...
Page 219 Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record Applicable Harmonic Limits (dBc) Level RF Freq Harmonic Firmware (dBm) (MHz) Number Revision Upper Actual −18.000 1000 −18.000 1700 −18.000 1700 −18.000 1800 −18.000 1800 −18.000 1900 −18.000 1900 −18.000 2000...
Page 220 Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record Applicable Harmonic Limits (dBc) Level RF Freq Harmonic Firmware (dBm) (MHz) Number Revision Upper Actual −11 −18.000 −11 −18.000 −11 −18.000 1000 −11 −18.000 1000 −12 −18.000 1700 −12 −18.000 1700...
Page 221: Rf Generator Spurious Spectral Purity Performance Test 7 Record
Performance Test Records RF Generator Spurious Spectral Purity Performance Test 7 Record RF Generator Spurious Spectral Purity Performance Test 7 Record For test procedure, see “RF Generator Spurious Spectral Purity Performance Test 7” on page 165. Table 7-7 RF Generator Spurious Spectral Purity Test 7 Record Spurious Signal Limits RF Freq Spur Freq...
Page 222 Performance Test Records RF Generator Spurious Spectral Purity Performance Test 7 Record Spurious Signal Limits RF Freq Spur Freq (dBc) Spurious Source (MHz) (MHz) Upper Actual −55.00 MX -REF5 1700 1695 −55.00 MX +REF5 1850 1855 −55.00 MX -REF5 1850 1845 S:\agilent\e8285\ALR\Book\chapters\perf_record.fm...
Page 223: Af Generator Ac Level Accuracy Performance Test 8 Record
Performance Test Records AF Generator AC Level Accuracy Performance Test 8 Record AF Generator AC Level Accuracy Performance Test 8 Record For test procedure, see “AF Analyzer AC Level Accuracy Performance Test 12” on page 171. Table 7-8 AF Generator AC Level Accuracy Test 8 Record AC Level Limits (mV) Frequency Level...
Page 224 Performance Test Records AF Generator AC Level Accuracy Performance Test 8 Record AC Level Limits (mV) Frequency Level AF Generator (Hz) (mV) Lower Upper Actual 4000 3885.000 4115.000 682.500 717.500 70.000 80.000 S:\agilent\e8285\ALR\Book\chapters\perf_record.fm...
Page 225: Af Generator Dc Level Accuracy Performance Test 9 Record
Performance Test Records AF Generator DC Level Accuracy Performance Test 9 Record AF Generator DC Level Accuracy Performance Test 9 Record For test procedure, see “AF Generator DC Level Accuracy Performance Test 9” on page 168. Table 7-9 AF Generator DC Level Accuracy Test 9 Record DC Level Limits (mV) Level AF Generator...
Page 226: Af Generator Residual Distortion Performance Test 10 Record
Performance Test Records AF Generator Residual Distortion Performance Test 10 Record AF Generator Residual Distortion Performance Test 10 Record For test procedure, see “AF Generator Residual Distortion Performance Test 10” on page 169. Table 7-10 AF Generator Residual Distortion Test 10 Record Distortion Limits (%) Frequency Level...
Page 227 Performance Test Records AF Generator Residual Distortion Performance Test 10 Record Distortion Limits (%) Frequency Level AF Generator (Hz) (mV) Upper Actual 4000 0.125 2000 0.125 0.125...
Page 228: Af Generator Frequency Accuracy Performance Test 11 Record
Performance Test Records AF Generator Frequency Accuracy Performance Test 11 Record AF Generator Frequency Accuracy Performance Test 11 Record For test procedure, see “AF Generator Frequency Accuracy Performance Test 11” on page 170. Table 7-11 AF Generator Frequency Accuracy Test 11 Record Frequency Limits (Hz) Frequency AF Generator...
Page 229: Af Analyzer Ac Level Accuracy Performance Test 12 Record
Performance Test Records AF Analyzer AC Level Accuracy Performance Test 12 Record AF Analyzer AC Level Accuracy Performance Test 12 Record For test procedure, see “AF Analyzer AC Level Accuracy Performance Test 12” on page 171. Table 7-12 AF Analyzer AC Voltage Accuracy Test 12 Record AC Voltage Limits (mV) Frequency Level...
Page 230: Af Analyzer Residual Noise Performance Test 13 Record
Performance Test Records AF Analyzer Residual Noise Performance Test 13 Record AF Analyzer Residual Noise Performance Test 13 Record For test procedure, see “AF Analyzer Residual Noise Performance Test 13” on page 172. Table 7-13 AF Analyzer Residual Noise Test 13 Record Residual Noise Limits ( µ...
Page 231: Af Analyzer Distortion And Sinad Accuracy Performance Test 14 Record
Performance Test Records AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record For test procedure, see “AF Analyzer Distortion and SINAD Accuracy Performance Test 14” on page 173. Table 7-14 AF Analyzer Distortion and SINAD Accuracy Test 14 Record AF Generator 2 Distortion and SINAD Limits...
Page 232: Af Analyzer Dc Level Accuracy Performance Test 15 Record
Performance Test Records AF Analyzer DC Level Accuracy Performance Test 15 Record AF Analyzer DC Level Accuracy Performance Test 15 Record For test procedure, see “AF Analyzer DC Level Accuracy Performance Test 15” on page 174. Table 7-15 AF Analyzer DC Level Accuracy Test 15 Record AF Generator DC Voltage Limits (mV) 1 Level...
Page 233: Af Analyzer Frequency Accuracy To 100 Khz Performance Test 16 Record
Performance Test Records AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record For test procedure, see “AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16” on page 175.
Page 234: Af Analyzer Frequency Accuracy At 400 Khz Performance Test 17 Record
Performance Test Records AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record For test procedure, see “AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17” on page 176.
Page 235: Oscilloscope Amplitude Accuracy Performance Test 18 Record
Performance Test Records Oscilloscope Amplitude Accuracy Performance Test 18 Record Oscilloscope Amplitude Accuracy Performance Test 18 Record For test procedure, see “Oscilloscope Amplitude Accuracy Performance Test 18” on page 177. Table 7-18 Oscilloscope Amplitude Accuracy Test 18 Record Amplitude Limits (V) Frequency (kHz) Lower...
Page 236: Rf Analyzer Level Accuracy Performance Test 19 Record
Performance Test Records RF Analyzer Level Accuracy Performance Test 19 Record RF Analyzer Level Accuracy Performance Test 19 Record For test procedure, see “RF Analyzer Level Accuracy Performance Test 19” on page 179. Table 7-19 RF Analyzer Level Accuracy Test 19 Record Applicable Level Difference Limits (dB) Frequency...
Page 237 Performance Test Records RF Analyzer Level Accuracy Performance Test 19 Record Applicable Level Difference Limits (dB) Frequency Firmware (MHz) Revision Lower Upper Actual −0.334 1750 0.334 −0.334 1775 0.334 −0.334 1800 0.334 −0.334 1825 0.334 −0.334 1850 0.334 −0.334 1875 0.334 −0.334 1900...
Page 238: Rf Analyzer Fm Accuracy Performance Test 20 Record
Performance Test Records RF Analyzer FM Accuracy Performance Test 20 Record RF Analyzer FM Accuracy Performance Test 20 Record For test procedure, see “RF Analyzer FM Accuracy Performance Test 20” on page 180. Table 7-20 RF Analyzer FM Accuracy Test 20 Record FM Deviation Limits (kHz) Deviation Rate...
Page 239: Rf Analyzer Fm Distortion Performance Test 21 Record
Performance Test Records RF Analyzer FM Distortion Performance Test 21 Record RF Analyzer FM Distortion Performance Test 21 Record For test procedure, see “RF Analyzer FM Distortion Performance Test 21” on page 182. Table 7-21 RF Analyzer FM Distortion Test 21 Record FM Distortion Limits (%) FM Deviation (kHz)
Page 240: Rf Analyzer Fm Bandwidth Performance Test 22 Record
Performance Test Records RF Analyzer FM Bandwidth Performance Test 22 Record RF Analyzer FM Bandwidth Performance Test 22 Record For test procedure, see “RF Analyzer FM Bandwidth Performance Test 22” on page 184. Table 7-22 RF Analyzer FM Bandwidth Test 22 Record FM Deviation Difference Limits (dB) Upper...
Page 241: Rf Analyzer Residual Fm Performance Test 23 Record
Performance Test Records RF Analyzer Residual FM Performance Test 23 Record RF Analyzer Residual FM Performance Test 23 Record For test procedure, see “RF Analyzer Residual FM Performance Test 23” on page 186. Table 7-23 RF Analyzer Residual FM Test 23 Record FM Deviation Limits (Hz) RF (MHz) Upper...
Page 242: Spectrum Analyzer Image Rejection Performance Test 24 Record
Performance Test Records Spectrum Analyzer Image Rejection Performance Test 24 Record Spectrum Analyzer Image Rejection Performance Test 24 Record For test procedure, see “Spectrum Analyzer Image Rejection Performance Test 24” on page 188. Table 7-24 Spectrum Analyzer Image Rejection (Image) Test 24 Record Image Response Applicable RF Generator...
Page 243: Cdma Generator Rf In/Out Amplitude Level Accuracy Performance Test 25 Record
Performance Test Records CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25 Record CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25 Record For test procedure, see “CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25” on page 190.
Page 244: Cdma Generator Duplex Out Amplitude Level Accuracy
Performance Test Records CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 For test procedure, see “CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26” on page 192. Table 7-26 CDMA Generator DUPLEX OUT Sector B Power Level Accuracy Test 26 Record Measured Level Limits (dBm)
Page 245: Cdma Generator Modulation Accuracy Performance Test 27 Record
Performance Test Records CDMA Generator Modulation Accuracy Performance Test 27 Record CDMA Generator Modulation Accuracy Performance Test 27 Record For test procedure, see “CDMA Generator Modulation Accuracy Performance Test 27” on page 194. Table 7-28 CDMA Generator Modulation Accuracy Test 27 Record Calculated Rho Measured RF (MHz)
Page 246: Cdma Analyzer Average Power Level Accuracy Performance Test 28 Record
Performance Test Records CDMA Analyzer Average Power Level Accuracy Performance Test 28 Record CDMA Analyzer Average Power Level Accuracy Performance Test 28 Record For test procedure, see “CDMA Analyzer Average Power Level Accuracy Performance Test 28” on page 196. Table 7-29 CDMA Analyzer Average Power Level Accuracy Test 28 Record Measured Level Limits (mW) Level...
Page 247: Cdma Analyzer Channel Power Level Accuracy Performance Test 29 Record
Performance Test Records CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record For test procedure, see “CDMA Analyzer Channel Power Level Accuracy Performance Test 29” on page 198. Table 7-30 CDMA Analyzer Channel Power Level Accuracy Test 29 Record Measured Level Limits (dBm) Sig.
Page 248 Performance Test Records CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record S:\agilent\e8285\ALR\Book\chapters\perf_record.fm...
Page 249: Block Diagrams
Block Diagrams This chapter contains block diagrams and descriptions that focus on how the Test Set generates signal and performs measurements.
Page 250: Signal Flow And Interconnections
Block Diagrams Signal Flow and Interconnections Signal Flow and Interconnections Shown in Figure 8-1, “Signal Flow and Interconnections,” on page 252 is a block-diagram overview of the Test Set. For details on individual assemblies refer to Table 8-1 on page 251.
Page 251 Block Diagrams Signal Flow and Interconnections Table 8-1 Block Diagrams Figure Figure 8-1, “Signal Flow and Interconnections,” on page 252 Figure 8-2, “RF I/O,” on page 254 Figure 8-3, “Downconverter,” on page 257 Figure 8-4, “Receiver Synthesizer,” on page 258 Figure 8-5, “Receiver,”...
Page 252 ANTENNA DOWN SPECTRUM RF IN/OUT RECEIVER RF I/O LO/IF/DEMOD ANALYZER CONVERTER DUPLEX PROTO TRIG1 EXT MEAS TRIG IN I OUT Q OUT DB-25 DCS1 TRIG0 CDMA RCVR 10 MHz DCS1 TRIG1 DCS1 DCS2 PROTOCOL DSP1 SYNTH OUT (RP) DCS1 TRIG2 PSO2 TRIG OUT CONVERTER DSP TRIG IN...
Page 253: Rf Input/Output Section
Block Diagrams RF Input/Output Section RF Input/Output Section RF Power Measurement An RF power measurement can only be made by supplying a signal to the RF IN/OUT port of the Test Set. See Figure 8-2, “RF I/O,” on page 254. A power splitter then splits the signal between an RF analysis path and a power measurement path.
Page 254 Block Diagrams RF Input/Output Section Figure 8-2 RF I/O S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 255: Rf Analyzer Section
Block Diagrams RF Analyzer Section RF Analyzer Section Frequency Conversion NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 256 Block Diagrams RF Analyzer Section Filters are automatically switched in to remove image and other interfering signals. The frequency ranges of the filters are as follows: • 150 MHz low-pass • 150 MHz - 386 MHz bandpass • 350 MHz - 650 MHz tunable bandpass •...
Page 257 Block Diagrams RF Analyzer Section Figure 8-3 Downconverter...
Page 258 Block Diagrams RF Analyzer Section Figure 8-4 Receiver Synthesizer S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 259 Block Diagrams RF Analyzer Section Figure 8-5 Receiver...
Page 260 Block Diagrams RF Analyzer Section Figure 8-6 Digital Cellsite 1 & 2 from PROTOCOL PROCESSOR FIFO (pin 12) ANALOG CELL from LO/IF/DEMOD from PROTOCOL PROCESSOR PROTO RESET (pin 2) ANALOG CELL S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 261 Block Diagrams RF Analyzer Section Figure 8-7 Analog Cell Site (FW Rev A.04.54 and below) from DIGITAL CELLSITE 1 from DIGITAL CELLSITE 2...
Page 262 Block Diagrams RF Analyzer Section Figure 8-8 Analog Cell Site (FW Rev A.05.03 and above) ANALOG CELL SITE Data Address AWGN & SIN/COS I_OUTPUT IQ_SAS CS1M1IQ Chan 3 TO IQ_MOD CS1M2IQ Chan 2 ASSY FROM DIGITAL CELLSITE 1 CS1M3IQ Chan 1 CS1M4IQ Chan 0 Q_OUTPUT...
Page 263 Block Diagrams RF Analyzer Section Figure 8-9 Protocol Processor DIGITAL CELLSITE DIGITAL CELLSITE...
Page 264: Spectrum Analyzer
Block Diagrams Spectrum Analyzer Spectrum Analyzer Spectrum Analysis (option 102) The LO on the Spectrum Analyzer, see figure 8-10 on page 265, is swept across the span by the Controller. The LO starts sweeping when the oscilloscope circuits on the Measurement board trigger the display sweep to start.
Page 265 Block Diagrams Spectrum Analyzer Figure 8-10 Spectrum Analyzer...
Page 266: Audio Analyzer Section
Block Diagrams Audio Analyzer Section Audio Analyzer Section Input Level Control Switchable gain amplifiers on the Audio Analyzer 1 and Audio Analyzer 2 (figure 8-11 on page 267, and figure 8-12 on page 268) assemblies keep the audio input signal within a range suitable for the detectors.
Page 267 Block Diagrams Audio Analyzer Section Figure 8-11 Audio Analyzer 1...
Page 268 Block Diagrams Audio Analyzer Section Figure 8-12 Audio Analyzer 2 S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 269 Block Diagrams Audio Analyzer Section Figure 8-13 Measurement Board...
Page 270 Block Diagrams Audio Analyzer Section Figure 8-14 Signaling and Analyzer Assembly S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 271: Cdma Analyzer Section
Block Diagrams CDMA Analyzer Section CDMA Analyzer Section IF Conversion To downconvert the CDMA the signal, the 114.3 MHz IF is mixed with a 110.6136 MHz LO to produce a 3.6864 MHz IF in the IQ Modulator assembly, see figure 8-15 on page 272.
Page 272 Block Diagrams CDMA Analyzer Section Figure 8-15 IQ Modulator S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 273 Block Diagrams CDMA Analyzer Section Figure 8-16 LO/IF/Demodulator...
Page 274 Block Diagrams CDMA Analyzer Section Figure 8-17 Digital Signal Processor 1 (DSP1) S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 275: Cdma Generator Section
Block Diagrams CDMA Generator Section CDMA Generator Section Data Generation The Digital Cellsite assembly, see figure 8-6 on page 260, generates or buffers external data that emulates a CDMA traffic channel and outputs this data to the CDMA Reference, see figure 8-18 on page 276.
Page 276 Block Diagrams CDMA Generator Section Figure 8-18 CDMA Reference S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 277: Audio Generator Section
Block Diagrams Audio Generator Section Audio Generator Section Waveform Generation The Signal Source and Analyzer, see figure 8-19 on page 277, gets frequency and wave shape information from the Controller. Waveform values are calculated real-time by a digital waveform synthesis IC. The LFS1 output is always a sine-wave.
Page 278 Block Diagrams Audio Generator Section Figure 8-20 Modulation Distribution S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 279: Rf Generator Section
Block Diagrams RF Generator Section RF Generator Section Frequency Generation NOTE Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value out of range” , will be displayed if invalid frequencies are set.
Page 280 Block Diagrams RF Generator Section • RF Output Section Modulation Amplitude modulation (AM) is done on the RF Output Section assembly (figure 8-22 on page 282). The modulating signal from the Modulation Distribution assembly is applied to the ALC loop’s control voltage. IQ modulation is done on the IQ Modulator assembly (figure 8-15 on page 272...
Page 281 Block Diagrams RF Generator Section Figure 8-21 Signal Generator Synthesizer...
Page 282 Block Diagrams RF Generator Section Figure 8-22 RF Output Section S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 283 Block Diagrams RF Generator Section Figure 8-23 Upconverter...
Page 284: Reference/Regulator Section
Block Diagrams Reference/Regulator Section Reference/Regulator Section Reference All frequencies are derived from a 10 MHz reference which can come from an external reference or from a 10 MHz crystal oscillator on the Reference assembly (figure 8-24 on page 285). The High Stability Reference assembly develops the local oscillator (LO) and reference signals needed by the assemblies that make up the RF generator, RF analyzer, spectrum analyzer, and the Measurement assembly.
Page 285 Block Diagrams Reference/Regulator Section Figure 8-24 High Stability Reference...
Page 286 Block Diagrams Reference/Regulator Section Figure 8-25 Regulator S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 287: Instrument Control Section
Block Diagrams Instrument Control Section Instrument Control Section Digital Control The Test Set’s digital control is driven by two assemblies: • Memory/SBRC • Controller The controller receives user control information by either the control interface or by the front panel. Operating firmware on the Memory/SBRC (figure 8-26 on page 288) is then used by the Controller...
Page 288 Block Diagrams Instrument Control Section Figure 8-26 Memory SBRC S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 289 Block Diagrams Instrument Control Section Figure 8-27 Controller...
Page 290 Block Diagrams Instrument Control Section Figure 8-28 Display Driver S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 291: Gpib Serial
Block Diagrams GPIB Serial GPIB Serial Figure 8-29 GPIB/Serial GPIB/Serial GPIB/Serial...
Page 292 Block Diagrams GPIB Serial S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm...
Page 293: Service Screen
Service Screen This chapter describes the SERVICE screen as a diagnostic aid for the Test Set.
Page 294: Troubleshooting With The Service Screen
Test Set and, especially, understand how the assemblies in the Test Set work together. Detailed manual Test Set operation is provided in the Agilent Technologies E8285A User’s Guide. Refer to Chapter 8, “Block Diagrams,” on page 249 for information on how the overall instrument and each module work.
Page 295 Service Screen Troubleshooting with the SERVICE Screen When run, the diagnostic routines make the necessary circuit changes and measurements automatically, comparing the measurements to known limits for each node. Figure 9-1 CONFIGURE and SERVICE Screens Counter Connection This field selects the desired circuit node to connect to the Test Set’s internal frequency counter.
Page 296 Service Screen Troubleshooting with the SERVICE Screen To change the counter connection, move the cursor in front of the Counter Connection field and push the cursor control knob. A Choices menu will appear, then move the cursor to the desired circuit node and push the cursor control knob.
Page 297 Service Screen Troubleshooting with the SERVICE Screen • out: Output • rcvr: Receiver • gsyn: Signal Generator Synthesizer • rsyn: Receiver Synthesizer • spec: Spectrum Analyzer • meas: Measurement • metron: Measurement • afg1: Signaling Source/Analyzer • afg2: Signaling Source/Analyzer •...
Page 298 Service Screen Troubleshooting with the SERVICE Screen S:\agilent\e8285\ALR\Book\chapters\service_scrn.fm...
Page 299 Index AC Level Accuracy (AF Analyzer) battery replacement calibration performance test battery, Memory assembly overview AC Level Accuracy (AF battery, Regulator assembly calibration. See periodic Generator) performance test block diagrams adjustments Boot Code calibration data adjustments. See periodic Boot ROM replacement downloading adjustments how to recover...
Page 300 Index Distortion and SINAD (AF Analyzer) performance test DACs enhancements firmware downloading calibration data settings hardware timebase reference error codes. See failure codes DC Level Accuracy (AF Analyzer) error messages performance test "Autostart Test Procedure on DC Level Accuracy (AF Power-Up"...
Page 301 Index failure codes Gate Time field, SERVICE screen handles, removing diagnostic (displayed) Harmonics Spectral Purity (RF diagnostic (returned over Generator) performance test GPIB) See Also LEDs failures power up self-test firmware enhancements flowchart, troubleshooting FM Accuracy (RF Analyzer) performance test FM Accuracy (RF Generator) performance test FM Bandwidth (RF Analyzer)
Page 302 Index I/Q Modulator assembly Latch field, SERVICE screen Modulation Accuracy (CDMA IBASIC controller latches Generator) performance test IF frequencies Image Rejection (Spectrum gain modulation analysis Analyzer) performance test switch Modulation Distribution timebase assembly internal covers, top and bottom LEDs module swap. See troubleshooting, diagnostic codes assembly swap IQ Calibration adjustment...
Page 303 Index Residual FM (RF Generator) operating system parts list Residual Noise (AF Analyzer) Output assembly PC boards, locating – performance test record SINAD Accuracy (AF Analyzer) performance tests AC Level Accuracy (AF Spurious Spectral Purity (RF Analyzer) Generator) AC Level Accuracy (AF performance verification Generator) overview...
Page 304 Index RAM Initialize field, SERVICE save/recall register test equipment screen self-test diagnostics for performance tests RAM, clearing self-test failures overview for adjustments Rcvr Synth assembly SERVICE screen test points troubleshooting accessing power supply Receive DSP assembly Counter Connection field voltmeter reference –...
Page 305 Index Value (hex) field, SERVICE Wideband Sweep verification test screen Variable Frequency Notch Filter adjustment video output signal Voltmeter Connection field, SERVICE screen Voltmeter References adjustment VOLUME control Index...

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