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<Fig. 7 When IC output of COF is poor>
Remove SR before measuring because the output TP of TCP
is covered with SR. Insulate again with insulating tape after
measuring.
(2) In case of IC damage, corresponding IC inside of TCP,
pictures by IC unit inside of TCP will not appear or Mis -
discharge. In most cases, the burnt mark can be seen
when IC failure occurs.
Test Point : Measure the output of GND~TCP before
O
expanding.
Wave format : Output wave doesn't come out
O
<TCP Normal Output Wave >
Measurance position : Enlarge the after measuring output
O
TP of TCP (Full White Pattern)
3-5. Crystal(CTRL B/D : X2) Damage
(1) When Crystal is damage, the screen doesn't be shown.
Test Point : Measuring 3pin of
O
GND~Crystal(CTRL B/D: X2)
Wave format : Output wave doesn't come out
O
(2) In case of unusual launch of the Crystal, it may blink the
screen.
Wave format : As shown fig. 8
O
<Fig. 8 When Crystal is poor>
<Crystal Normal Output Wave >
Measurance position : Measuring output 3pin of
O
Crystal(X2 : 100MHz) on CTRL B/D (Full White Pattern)
4. Shift breakdown component
compatibility consideration
4-1. Scan IC follows in application,
compatibility of Y DRV Top, Bottom B/D
(1) When B/D applicated SN755866 is breakdown, you must
mutually only replace Top B/D and Bottom B/D applicated
SN755866.
(2) When IC of B/D applicated SN755866 IC is breakdown,
you must only replace SN755866 IC.
Different IC application being not right
SN755866
When B/D is
applicated B/D
breakdown
TOP: 6871QDH088A
BTM: 6871QDH089A
SN755866
When IC is
applicated B/D
breakdown
TOP: 6871QDH088A
BTM: 6871QDH089A
When replacing the IC, notice
To prevent dust, fix the same IC after removing the silicon
and then it again stick the IC.
Silicon Part No. : 7254Q00002A (Tube Type)
7254Q00002B (Can Type)
180/185
Only use B/D applicated
SN755866
TOP: 6871QDH088A
BTM: 6871QDH089A
Only use SN755866 IC
IC : 0ILNRTI020A
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