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8.5.6.2
Implementation
This section provides all of the information necessary to implement the DST function on this drive.
8.5.6.3
State of the drive prior to testing
The drive must be in a ready state before issuing the Device Self-test command. There are multiple reasons why a
drive may not be ready, some of which are valid conditions, and not errors. For example, a drive may be in process of
doing a Format NVM, or another DST. It is the responsibility of the host application to determine the "not ready" cause.
8.5.6.4
Engage DST
To run DST, submit the Device Self-test command with the appropriate Self-test Code (STC) (1h for the short test or 2h
for the extended test) in Command Dword 10, bits 03:00.
DST has two options:
Short test (Self Test Code: 1h)
The short test provides a time-limited test that tests as much of the drive as possible within 120 seconds. The short
test does not scan the entire media contents, but does some fundamental tests and scans portions of the media. A
complete read/verify scan is not performed and only factual failures will report a "test failed" condition. This option
provides a quick confidence test of the drive.
Extended test (Self Test Code: 2h)
The extended test empirically tests critical drive components. The read operation tests the media contents. The
integrity of the media is checked through a read/verify scan of the media. The anticipated length of the Extended test
is reported through the Extended Device Self-Test Time field in the Identify Controller data structure.
8.5.6.5
Log page entries
When the drive begins DST, it creates a new entry in the Self-test Result Data Structure in Log Identifier 06h. The new
entry is created by inserting a new self test data structure starting at byte 4h of the Device Self-test Log. Existing data
is moved to make room for the new data structure. The drive reports 20 result data structures in the log. If there are
more than 20 result data structures, the oldest data structure is deleted. The new data structure is initialized.
8.5.6.6
Abort
Abort test options include:
Applications can use the abort code Fh in the Self-test Code field of the Device Self-test command. This causes a
result of 1h (self-test aborted by a Device Self-test command) to appear in the result bits (3:0) of the Device
Self-test Status field.
Any Controller-level reset that affects the controller performing the device self-test. This causes 2h (self-test
aborted by a Controller Level Reset) to appear in the result bits of the Device Self-test Status field.
8.5.7
Product warranty
For information regarding warranty support details, visit:
http://www.seagate.com/support/warranty-and-replacements/
Limited Warranty with Media Usage: This warranty is based on the shorter of term and endurance usage of the
drive.
Seagate Nytro 5050 NVMe SSD Product Manual, Rev C
26
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