Test Access Mode Definitions - Cisco ONS 15454 Reference Manual

Chapter 2 Procedures and Provisioning
Example 2-16 ED-STS1::STS-1-1:TACC=4;
Example 2-17 CONN-TACC-STS1::<AID A or B>:102::4:<MD>
Note The I and J connections above are TAPs in
configuration.

2.2.9 Test Access Mode Definitions

The following diagrams show what the different test access modes <MD> refer to.
circuit with no access (dual FAD TAP) and
followed by all the modes. The QRS can be generated by an outside source, for example, the empty
connection of the BRTU.
MONE, MONF, and MONEF access modes are non-service effecting and can be applied to an IS (in
service) port state.
LOOPE, LOOPF, SPLTE, SPLTF, SPLTEF, SPLTA, SPLTB, and SPLTAB access modes are intrusive and
can be applied only to a circuit/port that is in the OOS_MT (out of service, maintenance) port state. The
NE will change the state of the circuit under test to OOS_MT during the period of TACC and restore it
to the original state when the connection between the TAP and the circuit is dropped.
Figure 2-5
(2 times the bandwidth
of the circuit accessed)
Figure 2-6
Single FAD TAP
(same bandwidth
as circuit accessed)
number assigned is 4.
Circuit With No Access (Dual FAD TAP)
E
A
AID
B
Dual-FAD TAP
Circuit With No Access (Single FAD TAP)
E
A
AID
B
Creates TAP with STS-1-1 and STS-1-2 through NE1. TAP
Connects TAP 4 to the circuit.
Figure 2-3, but normal connections in the
Figure 2-6 shows a circuit with no access (single FAD TAP),
F
"Mapped"
AID
F
"Mapped"
AID
Cisco ONS SONET TL1 Command Guide, R6.0
2.2.9 Test Access Mode Definitions
Figure 2-4
Figure 2-5 shows a
2-15