Agilent Technologies 4156b Manuals

Manuals and User Guides for Agilent Technologies 4156b. We have 2 Agilent Technologies 4156b manuals available for free PDF download: User Manual

Agilent Technologies 4156b User Manual (414 pages)

Precision Semiconductor Parameter Analyzer

Brand: Agilent Technologies | Category: Measuring Instruments | Size: 4.76 MB

Table of Contents
9
Edition
18
- Measurement Units
  19
Edition
19
Edition
20
- Ground Unit (GNDU)
  21
- Source/Monitor Unit (SMU)
  22
- Voltage Source Unit (VSU)
  34
- Voltage Monitor Unit (VMU)
  35
- Pulse Generator Unit
  38
- Measurement Mode
  41
- Sweep Measurement Mode
  43
- Basic Sweep Measurement
  44
- Subordinate Sweep Measurement
  47
- Synchronous Sweep Measurement
  49
- Pulse Sweep Measurement
  51
- Available Units
  54
- Sampling Measurement Mode
  54
- Sampling Interval and Measurement Time
  55
- Sampling Measurement Data
  58
- Sampling Completion
  60
- Source Output Sequence and Time Origin
  62
- Linear Sampling Measurement
  64
- Thinned-Out Sampling Measurement
  67
- Logarithmic Sampling Measurement
  70
- Measurement Functions
  75
- Stress Force Function
  77
- Stress Output Channels
  78
- Stress Mode
  80
- Stress Force Sequence
  81
- Stress Stop Function at Abnormal Status
  84
- Available Units and Functions
  85
- Knob Sweep Function
  85
- Normal Sweep and Knob Sweep Measurements
  86
- Features of Knob Sweep Function
  87
- KNOB SWEEP Screen
  90
- SETUP COPY Softkey
  91
- Y-AXIS ASSIGN Softkey
  91
- DISPLAY SETUP Softkey
  92
- VAR1 SETUP Softkey
  94
- VAR2 SETUP Softkey
  97
- CONST SETUP Softkey
  99
- Analysis of the Knob Sweep Measurement Results
  100
- Standby Channels
  101
- Standby Function
  101
- Standby State
  101
- Available Units and Output Values
  102
- Output Values of Non-Standby Channels
  102
- Output Sequence of Standby Channels
  103
- When Getting Setup File
  104
- Idle State
  105
- Measurement State
  105
- Operation States
  105
- Changing Among Operation States
  106
- Standby State
  106
- Stress Force State
  106
- Output Sequence
  108
- Sequential Mode
  109
- Simultaneous Mode
  111
- Trigger Function
  113
- Trigger Input
  115
- Trigger Output
  116
- SMU/PG Selector Control
  120
- Restrictions Using Selector
  121
- Setup and Switching Conditions
  121
- Connections
  122
- R-BOX Control
  122
- Resistance Value
  122
- Setups
  124
- Circuit Diagram
  125
- Measurement Ranging Mode
  127
- Auto Ranging
  128
- Limited Auto Ranging
  129
- Compliance Range
  130
- Fixed Range
  130
- Compliance
  131
- Voltage and Current Compliance
  131
- Power Compliance
  135
- Integration Time
  137
- Short
  137
- Long
  138
- Medium
  138
- SMU Filter
  139
- To Measure Offset Data
  140
- Zero Offset Cancel
  140
- To Perform Offset Cancel
  142
- Making a Measurement
  143
- Connecting DUT
  145
- Using Test Fixture
  146
- Using Connector Plate
  148
- Sweep Measurements
  152
- To Define Measurement Units
  154
- To Set up Primary Sweep
  156
- To Set up Secondary Sweep
  158
- To Set up Synchronous Sweep
  160
- To Set up Constant Output
  162
- To Set up SMU Pulsed Output
  163
- To Set up PGU Output
  166
- To Use Standby Function
  168
- To Define a User Function
  169
- To Display Graphics Results
  170
- To Display List Results
  172
- To Execute Calibration
  173
- To Use Offset Cancel Function
  173
- To Execute or Stop Measurement
  174
- To Use R-Box
  175
- Knob Sweep Measurements
  177
- To Execute Knob Sweep Measurement
  178
- To Stop Knob Sweep Measurement
  181
- Sampling Measurements
  182
- To Define Measurement Units
  184
- To Set up Sampling Parameters
  186
- To Set up Constant Output
  188
- To Define Stop Conditions
  189
- Stress Force
  191
- To Set up Stress Source Channels
  193
- To Set up Stress Condition/Timing
  195
- To Set up Ac (Pulse) Output
  197
- To Set up DC Output
  199
- To Force Stress
  200
- To Use Selector
  202
- Analyzing Measurement Results
  205
- Manual Analysis
  207
- To Specify a Measurement Point on Curve
  208
- To Specify between Measurement Points on Curve
  210
- To Display or Move Cursor
  212
- To Adjust Display Range to Measurement Curve Automatically
  213
- To Zoom the Display Range
  213
- To Center Display at Cursor Location
  214
- To Draw Line through Two Specified Points
  214
- To Draw Line through Specified Point with Specified Gradient
  216
- To Draw Tangent to Specified Point of Measurement Curve
  218
- To Draw Regression Line for Specified Region
  220
- To Display and Select a Line
  222
- To Display Grid on the Graph
  222
- To Change Data Variable on Graph
  223
- To Change Range of X or y Axis Scale
  224
- To Change Variable Assigned to X, Y1, or Y2 Axis
  225
- To Overlay an Internal Memory Measurement Curve Onto Plotting Area
  226
- To Scroll the LIST Screen
  228
- To Display or Move Marker on LIST Screen
  229
- To Change Variables of LIST Screen
  230
- Automatic Analysis
  231
- To Draw Line by Specifying Two Points
  232
- To Draw Line by Specifying Gradient and One Point
  234
- To Draw Tangent to Specified Measurement Point
  236
- To Draw Regression Line by Specifying Two Points
  238
- To Display Marker at Specified Point
  241
- Screen Organization
  243
- Screen Structure
  245
- CHANNELS Screen Group
  247
- CHANNELS: CHANNEL DEFINITION Screen
  248
- CHANNELS: USER FUNCTION DEFINITION Screen
  254
- CHANNELS: USER VARIABLE DEFINITION Screen
  256
- MEASURE Screen Group
  258
- MEASURE: SWEEP SETUP Screen
  259
- MEASURE: SAMPLING SETUP Screen
  264
- MEASURE: PGU SETUP Screen
  268
- MEASURE: MEASURE SETUP Screen
  271
- Measurement Range
  272
- MEASURE: OUTPUT SEQUENCE Screen
  274
- DISPLAY Screen Group
  277
- DISPLAY: DISPLAY SETUP Screen for Graphic Results
  278
- DISPLAY: DISPLAY SETUP Screen for List Results
  280
- DISPLAY: ANALYSIS SETUP Screen
  282
- GRAPH/LIST Screen Group
  288
- On the GRAPHICS Result Screen
  288
- On the LIST Result Screen
  288
- GRAPH/LIST: GRAPHICS Screen
  289
- GRAPH/LIST: LIST Screen
  304
- Measurement Results
  305
- STRESS Screen Group
  316
- STRESS: CHANNEL DEFINITION Screen
  317
- STRESS: STRESS SETUP Screen
  321
- STRESS: STRESS FORCE Screen
  325
- Data Input or Edit
  327
- Screen Operation
  327
- Blue Front-Panel Key Usage
  329
- Green Front-Panel Key Usage
  330
- Edit Front-Panel Keys
  331
- Status Indicators
  332
- Data Variable and Analysis Function
  333
- Data Variable
  335
- Data Variable for Output or Measurement Data
  335
- User Function
  337
- User Variable
  338
- Syntax of Data Variable Name
  339
- Expression
  340
- Built-In Function
  343
- Abs
  344
- Avg
  344
- Cond
  345
- Delta
  346
- Diff
  347
- Exp
  348
- Integ
  348
- Lgt
  349
- Log
  349
- Mavg
  350
- Max
  351
- Min
  351
- Sqrt
  351
- Read out Function
  352
- Cy1
  353
- Cy2
  353
- Iy1
  355
- Iy2
  355
- L1Co
  356
- L1G
  356
- L1G1
  357
- L1G2
  358
- L1X
  359
- L1Y
  359
- L1Y1
  359
- L1Y2
  359
- L2Co
  359
- L2G
  360
- L2G1
  361
- L2G2
  362
- L2X
  363
- L2Y
  363
- L2Y1
  363
- L2Y2
  363
- My1
  364
- My2
  364
- Analysis Function
  365
- Marker on the GRAPH/LIST: GRAPHICS Screen
  366
- Marker on the GRAPH/LIST: LIST Screen
  368
- Cursor
  370
- Line Drawing
  371
- Scaling Functions
  373
- Automatic Analysis Function
  374
- Overlay Display Function
  374
- If You Have a Problem
  375
- When You Make a Measurement
  378
- If Measured Value Oscillates When Measuring High-Frequency Devices
  379
- If Measured Value Oscillates When Measuring Negative Resistance
  380
- If Noise Affects the Measured Values
  381
- If Large Current Causes High Temperature (Thermal Drift)
  382
- If Measured Voltage Has some Error When Forcing a Large Current
  382
- If Measurement Takes more Time than Specified
  383
- If Measurement Damages the Device under Test
  384
- If You Get Unexpected Data When Performing Sampling Measurement
  386
- If Errors Occur
  387
- If Errors Occur When You Perform Self-Calibration or Diagnostics
  388
- If Errors Occur When You Operate the 4155B/4156B
  394
- If a Measurement Data Status Is Displayed
  412

Agilent Technologies 4156b User Manual (182 pages)

Semiconductor Parameter Analyzer

Brand: Agilent Technologies | Category: Measuring Instruments | Size: 2.05 MB

Table of Contents
7
1 Installation

13
2 Driver Functions

21
- Driver Functions for the 4155B/4156B
  23
  - Hp4156B_Abortmeasure
    26
  - Hp4156B_Addsamplesynciv
    26
  - Hp4156B_Addsamplesyncpulse
    27
  - Hp4156B_Addstresssynciv
    28
  - Hp4156B_Addstresssyncpulse
    29
  - Hp4156B_Autocal
    29
  - Hp4156B_Clearsamplesync
    30
  - Hp4156B_Clearstresssync
    30
  - Hp4156B_Close
    30
  - Hp4156B_Cmd
    30
  - Hp4156B_Cmddata_Q
    31
  - Hp4156B_Cmdint
    31
  - Hp4156B_Cmdint16Arr_Q
    32
  - Hp4156B_Cmdint16_Q
    32
  - Hp4156B_Cmdint32Arr_Q
    33
  - Hp4156B_Cmdint32_Q
    33
  - Hp4156B_Cmdreal
    34
  - Hp4156B_Cmdreal64Arr_Q
    34
  - Hp4156B_Cmdreal64_Q
    35
  - Hp4156B_Cmdstring_Q
    35
  - Hp4156B_Dcl
    35
- Hp4156B_Error_Message
  36
- Hp4156B_Error_Query
  36
- Hp4156B_Errorquerydetect
  37
- Hp4156B_Errorquerydetect_Q
  37
- Hp4156B_Esr_Q
  38
- Hp4156B_Execcal
  38
- Hp4156B_Execoffsetcancel
  39
- Hp4156B_Force
  40
- Hp4156B_Forcepulse
  41
- Hp4156B_Init
  42
- Hp4156B_Measurem
  43
- Hp4156B_Measurep
  44
- Hp4156B_Offsetcancel
  44
- Hp4156B_Opc_Q
  45
- Hp4156B_Readdata
  45
- Hp4156B_Readstatusbyte_Q
  46
- Hp4156B_Recoveroutput
  46
- Hp4156B_Reset
  46
- Hp4156B_Revision_Query
  47
- Hp4156B_Sample
  48
- Hp4156B_Self_Test
  49
- Hp4156B_Setfilter
  50
- Hp4156B_Setinteg
  50
- Hp4156B_Setiv
  51
- Hp4156B_Setpbias
  52
- Hp4156B_Setpgur
  53
- Hp4156B_Setpiv
  54
- Hp4156B_Setsample
  55
- Hp4156B_Setstress
  55
- Hp4156B_Setsweepsync
  56
- Hp4156B_Setswitch
  57
- Hp4156B_Setvm
  57
  - Hp4156B_Spotmeas
    58
  - Hp4156B_Startmeasure
    59
  - Hp4156B_Stopmode
    60
  - Hp4156B_Stress
    61
  - Hp4156B_Sweepiv
    62
  - Hp4156B_Sweepmiv
    63
  - Hp4156B_Sweeppbias
    65
  - Hp4156B_Sweeppiv
    66
  - Hp4156B_Timeout
    67
  - Hp4156B_Timeout_Q
    67
  - Hp4156B_Zerooutput
    67
  - Driver Functions for the E5250A
    68
    
    Hpe5250A_Biaschancard
    70
    
    Hpe5250A_Biaschanlist
    70
    
    Hpe5250A_Biaschanlist_Q
    71
    
    Hpe5250A_Biasport
    72
    
    Hpe5250A_Biasstate
    72
    
    Hpe5250A_Close
    73
    
    Hpe5250A_Closecard_Q
    73
    
    Hpe5250A_Closelist
    74
    
    Hpe5250A_Closelist_Q
    75
    
    Hpe5250A_Cmd
    75
    
    Hpe5250A_Cmddata_Q
    76
    
    Hpe5250A_Cmdint
    76
    
    Hpe5250A_Cmdint16Arr_Q
    77
    
    Hpe5250A_Cmdint16_Q
    77
    
    Hpe5250A_Cmdint32Arr_Q
    78
    
    Hpe5250A_Cmdint32_Q
    78
    
    Hpe5250A_Cmdreal
    79
    
    Hpe5250A_Cmdreal64Arr_Q
    79
    
    Hpe5250A_Cmdreal64_Q
    80
  - Hpe5250A_Cmdstring_Q
    80
  - Hpe5250A_Compenc
    81
  - Hpe5250A_Connruleseq
    82
  - Hpe5250A_Coupleport
    83
  - Hpe5250A_Couplestate
    84
  - Hpe5250A_Dcl
    84
  - Hpe5250A_Error_Message
    85
  - Hpe5250A_Error_Query
    85
  - Hpe5250A_Errorquerydetect
    86
  - Hpe5250A_Errorquerydetect_Q
    86
  - Hpe5250A_Esr_Q
    87
  - Hpe5250A_Func
    87
  - Hpe5250A_Init
    88
  - Hpe5250A_Opc_Q
    88
  - Hpe5250A_Opencard
    89
  - Hpe5250A_Openlist
    89
  - Hpe5250A_Openlist_Q
    90
  - Hpe5250A_Readstatusbyte_Q
    90
  - Hpe5250A_Reset
    91
  - Hpe5250A_Revision_Query
    91
  - Hpe5250A_Selectcompenfile
    92
  - Hpe5250A_Self_Test
    93
  - Hpe5250A_Testclear
    93
  - Hpe5250A_Testexec_Q
    94
  - Hpe5250A_Timeout
    94
  - Hpe5250A_Timeout_Q
    94
3 Programming Examples Using HP VEE

95
- Programming Basics
  97
  - Registrating the Driver on HP VEE
    98
  - Basic Objects to Control the Instrument
    100
    
    Debugging Your Program
    108
    
    Restrictions When Using the Driver with HP VEE
    110
  - High-Speed Spot Measurements
    111
  - Multi-Channel Spot Measurements
    113
  - Staircase Sweep Measurements
    116
  - Synchronous Sweep Measurements
    118
  - Multi-Channel Sweep Measurements
    120
  - Pulsed Spot Measurements
    124
  - Multi-Channel Pulsed Spot Measurements
    126
  - Pulsed Sweep Measurements
    128
  - Multi-Channel Pulsed Sweep Measurements
    130
  - Staircase Sweep with Pulsed Bias Measurements
    133
  - Sampling Measurements
    135
  - Stress Force
    139
4 Sample Application Programs for HP VEE

141
- Introduction
  143
  - HP VEE Sample Program Disk
    143
  - What Are Sample Programs
    144
- Installation
  149
  - Required Equipment and Accessories
    149
  - Installing the Sample Programs
    150
- Using Sample1.Vee
  151
  - Program Execution Flow
    152
  - Panel Display
    154
  - To Execute Sample1.Vee
    155
- Using Sample2.Vee
  159
  - Program Execution Flow
    160
  - Panel Display
    162
  - To Execute Sample2.Vee
    163
- Customizing Sample Programs
  167
  - To Change an GPIB Address
    168
  - To Change the Vth Measurement Setup
    169
  - To Remove a Test Device
    170
  - To Remove a Source Output
    172
  - To Add a Test Device
    174
  - To Add a Measurement Parameter
    177

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Agilent Technologies 4156b Manuals

Agilent Technologies 4156b User Manual (414 pages)

Table of Contents

Agilent Technologies 4156b User Manual (182 pages)

Table of Contents

1 Installation

2 Driver Functions

3 Programming Examples Using HP VEE

4 Sample Application Programs for HP VEE

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