Radiated Emissions; Site And Test Description - SanDisk 5000 Test Report

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360 Herndon Parkway
Suite 1400
Herndon, VA 20170
http://www.rheintech.com
5

RADIATED EMISSIONS

5.1 SITE AND TEST DESCRIPTION

Before final measurements of radiated emissions were made on the open-field three/ten meter range,
the EUT was scanned indoor at one and three meter distances. This was done in order to determine
its emissions spectrum signature. The physical arrangement of the test system and associated
cabling was varied in order to determine the effect on the EUT's emissions in amplitude, direction and
frequency. This process was repeated during final radiated emissions measurements on the open-
field range, at each frequency, in order to insure that maximum emission amplitudes were attained.
Final radiated emissions measurements were made on the three/ten-meter, open-field test site. The
EUT was placed on a nonconductive turntable 0.8 meter above the ground plane. The spectrum was
examined as per FCC part 15 specifications.
At each frequency, the EUT was rotated 360°, and the antenna was raised and lowered from 1 to 4
meters in order to determine the emission's maximum level. Measurements were taken using both
horizontal and vertical antenna polarizations.
spectrum analyzer's 6 dB bandwidth was set to 120 kHz, and the analyzer was operated in the CISPR
quasi-peak detection mode. For emissions above 1000 MHz, measurement use an average detector
function with a minimum resolution bandwidth of 1 MHz. No video filter less than 10 times the
resolution bandwidth was used. The highest emission amplitudes relative to the appropriate limit
were measured and recorded in this report.
Rhein Tech Laboratories, Inc. has implemented procedures to minimize errors that occur from test
instruments, calibration, procedures, and test setups. Test instrument and calibration errors are
documented from the manufacturer or calibration lab. Other errors have been defined and calculated
within the Rhein Tech quality manual, section 6.1. Rhein Tech implements the following procedures to
minimize errors that may occur: yearly as well as daily calibration methods, technician training, and
emphasis to employees on avoiding error.
SanDisk Corporation
DoC Report
2006137
04/27/07
For frequencies between 30 and 1000 MHz, the
Page 12 of 17

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