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4. Reliability
The reliability of products shall satisfy items listed below.
Test Items
* Temperature
cycling
*High temp. and high
humidity storage
* High temp. storage
*Low temp. storage
Operation life
Mechanical shock
Variable frequency
vibration
Reflow solder heat
In the test *mark above, the sample to be tested shall be left at normal temperature
and humidity for 2h after it is taken out of the chamber. (No dew point)
These test results are sampling examples from a specific lot for reference purpose only, and do not constitute any warranty
or assurance in connection with the products.
GP2AP01VT10F
Test Condition
1 cycle -40℃(30min) to +85℃(30min)
20 cycles test
+60℃, 90%RH, 240h
+85℃, 240h
-40℃, 240h
+25℃, VDD=VDDVCSEL=VI2C=3.5V, 240h
2
1000m/s
, 6ms
3 times / ±X, ±Y, ±Z direction
2
200m/s
100 to 2000 to 100Hz/ Approx. for 4min
48 min/ X, Y, Z direction
250℃, 10s, three times.
Temperature profile as shown in page 12.
Failure Judgment
I
CC_VDD
Up: Upper
Range accuracy
Range accuracy
Condition:
VDD=V
=2.8V,
White Card 88 ％ ,
Indoor at 120cm
10 / 18
Confidence level : 90%
LTPD : 10 or 20
Samples (n)
Criteria
Defective (C)
> U
×1.2
Ｐ
n=22, c=0
specification
n=22, c=0
limit
<-10%
n=22, c=0
>+10%
n=22, c=0
=V
VCSEL
I2C
n=11, c=0
n=22, c=0
n=22, c=0
n=22, c=0
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