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4.
APPLICATION EXAMPLE
Figures 5 and 6 are plots of normal measurements and examples of measurements plagued
by oscillations.
Example 1.
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Example 2.
IC
(mAl
vc
For more mformatlon. caU your locaJ HP sales offIce listed In the telephone directory white pages. Ask for the Elecm)nlC Instruments Department. Or wnte to Hewlen - Packard :
PO Box lO301. Palo Allo. CA 94303-0890 Europe_ PO. Box 999.
J .. pan. Yokogawa-Hewlen-Packard Ltd. 3·29-21. Takaldo·H,gashl. Sugonaml-ku. Tokyo 168 Elsewhere In the world. wnt. to H.wlen·Packard Interconnnental. 3495 Deer Cr •••
Road. Palo Alto. CA 94304
August
1986
GaAs (devices used for very high frequency operation). Figure 5a shows
a plot of a normal measurement while Figure 5b is an example of a
measurement with oscillation problems.
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Figure 5. GaAs MESFET Measurement
Bipolar Transistor (devices with large stray capacitance). Figure 6a is a
plot of a normal measurement while Figure 6b is an example of a mea
surement with oscillation problems.
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Figure 6. Transistor Measurement
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Printed in Japan
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U.S.A.
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M 8 . Ontano
5950-2909
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