Loss Of Guard/Loss Of Carrier Test; Weak Infeed Mode Test - GE MiCOM P40 Agile Technical Manual

P44x/EN CM/Hb6
(CM) 9-36
5.3.3

Loss of guard/loss of carrier test

Setting:
TEST: Follow the truth table (section P44x/EN AP)
Note:
5.3.4

Weak infeed mode test

From MiCOM S1 Agile
(If Permissive schemes are enabled in MiCOM S1 Agile: 4 possible choices):fig winf1
Figure 20: Winf2
In case of channel-aided loss, the scheme Z1X (out fail) will be applied if selected in
MiCOM S1 Agile
Commissioning
MiCOM P40 Agile P442, P444