Test Sample Chromatograms - HP 5890 Series II Plus Reference Manual

Test Sample Chromatograms

Test sample chromatograms
Test sample chromatograms
Figure 10-1.
Detector Type FID (or FIDw/MUG)
Temp 250 DEGREES C
Inlet Type PACKED (OR PURGED
PACKED).
Temp 200 DEGREES C
Operating Mode
Purge Time On
Purge Time Off
Oven Temp Programmed (1 ramp)
Init Temp
Init Time
Ramp
Rate
Fin Temp
Fin Time
Range 8
COLUMN:
Part No. 19095(#100)
Dimensions
Sta Phase Methyl Silicone
Flame Ionization Detector (FID)
HP 5890 Test Sample Operating
Conditions
N/A
N/A min
N/A min
110 DEGREES C
0 min
15
150
1
¿
530 MID; 5 M
START
FLOW RATES
Carrier (He) 20 +/• 1
Hydrogen 33 +/• 1
Air 400 +/• 20
Makeup (N2) 10 +/• 1
Split Vent
Septum Purge
SAMPLE:
Type FID Sample
¿
Inj Volume 1
Part No. 18710•60170
Composition 0.03%(V/V)each
C14,C15,C16 normal paraffin
hydrocarbons in hexane
C14
1.41
C15
1.95
C16
2.55
ml/min
ml/min
ml/min
ml/min
N/A ml/min
1•2 ml/min
l
3
2
225