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Murata GRM188R71E224KA88 Series Reference Sheet page 5

Chip monolithic ceramic capacitor for general
Distributor of Murata Electronics North America: Excellent Integrated System Limited
Datasheet of GRM188R71E224KA88D - CAP CER 0.22UF 25V X7R 0603
Contact us: sales@integrated-circuit.com Website: www.integrated-circuit.com
No
Item
15 High
Appearance
No defects or abnormalities.
Temperature
Capacitance
Within +/-7.5% or +/-0.75pF
High Humidity
Change
(Whichever is larger)
(Steady)
Q or D.F.
30pF and over:Q≧200
30pF and below
C:Nominal Capacitance(pF)
More than 500MΩ or 25Ω·F (Whichever is smaller)
I.R.
16 Durability
Appearance
No defects or abnormalities.
Capacitance
Within +/-3% or +/-0.3pF
Change
(Whichever is larger)
Q or D.F.
30pF and over:Q≧350
10pF and over
30pF and below
10pF and below
C:Nominal Capacitance (pF)
More than 1,000MΩ or 50Ω·F (Whichever is smaller)
I.R.
Table A
Capacitance Change from 20C (%)
Char.
-55℃
Max.
Min.
2C/0C
0.82
-0.45
3C
1.37
-0.90
4C
2.56
-1.88
2P
-
-
3P
-
-
4P
-
-
2R
-
-
3R
-
-
4R
-
-
2S
-
-
3S
-
-
4S
-
-
2T
-
-
3T
-
-
4T
-
-
3U
-
-
4U
-
-
1X
-
-
Specification
Temperature
Compensating Type
Within +/-12.5%
W.V.:100Vdc :0.05max.(C<0.068µF)
 
:Q≧100+10C/3
W.V.:50/35/25Vdc :0.05max.
W.V.:16/10Vdc :0.05max.
W.V.:6.3/4Vdc :0.075max.(C<3.3µF)
Within +/-12.5%
W.V.:100Vdc :0.05max.(C<0.068µF)
W.V.:50/35/25Vdc :0.05max.
: Q≧275+5C/2 W.V.:16/10Vdc :0.05max.
W.V.:6.3/4Vdc :0.075max.(C<3.3µF)
: Q≧200+10C
-25℃
-10℃
Max.
Min.
Max.
0.49
-0.27
0.33
-0.18
0.82
-0.54
0.55
-0.36
1.54
-1.13
1.02
-0.75
1.32
0.41
0.88
1.65
0.14
1.10
2.36
-0.45
1.57
-0.30
1.70
0.72
1.13
2.03
0.45
1.35
2.74
-0.14
1.83
-0.09
2.30
1.22
1.54
2.63
0.95
1.76
3.35
0.36
2.23
3.07
1.85
2.05
3.40
1.58
2.27
4.12
0.99
2.74
4.94
2.84
3.29
5.65
2.25
3.77
-
-
-
High Dielectric
Constant Type
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature
Test Humidity
Test Time
Applied Voltage
:0.075max.(C≧0.068µF) Charge/discharge current : 50mA max.
Exposure Time
:0.125max.(C≧3.3µF)
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature
Test Time
Applied Voltage
Charge/discharge current : 50mA max.
:0.075max.(C≧0.068µF) Exposure Time
・Initial measurement for high dielectric constant type
Apply 200% of the rated DC voltage at the max. operating
:0.125max.(C≧3.3µF) temp. +/-3°C for 1h and then let sit for 24+/-2h at room temperature,
then measure.
Min.
0.27
0.09
0.48
0.30
0.81
0.63
0.24
1.23
1.05
0.66
1.89
1.50
-
Test Method
(Ref. Standard:JIS C 5101, IEC60384)
: 40+/-2℃
: 90%RH to 95%RH
: 500+/-12h
: DC Rated Voltage
: 24+/-2h
: Max. Operating Temp. +/-3℃
: 1000+/-12h
: 200% of the rated voltage
: 24+/-2h
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