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PREFACE
Thank you for purchasing the MB2144-222 (QFP-64
MB2144-222-01 (QFP-64
The MB2144-222 probe connects an emulator for the F
The MB2144-222-01 is the same as the MB2144-222 without the MB2144-210A universal cable
assembly.
This manual explains the handling and operation of the probe (MB2144-222) and probe header
(MB2144-222-01). Read this manual carefully before using these products.
*1: The FPT-64P-M06 is the package for the probe and probe header.
2
*2: F
MC is the abbreviation of FUJITSU Flexible Microcontroller.
• The contents of this document are subject to change without notice.
Customers are advised to consult with FUJITSU sales representatives before ordering.
• The information, such as descriptions of function and application circuit examples, in this document are presented solely for the
purpose of reference to show examples of operations and uses of Fujitsu semiconductor device; Fujitsu does not warrant proper
operation of the device with respect to use based on such information. When you develop equipment incorporating the device
based on such information, you must assume any responsibility arising out of such use of the information. Fujitsu assumes no
liability for any damages whatsoever arising out of the use of the information.
• Any information in this document, including descriptions of function and schematic diagrams, shall not be construed as license
of the use or exercise of any intellectual property right, such as patent right or copyright, or any other right of Fujitsu or any
third party or does Fujitsu warrant non-infringement of any third-party' s intellectual property right or other right by using such
information. Fujitsu assumes no liability for any infringement of the intellectual property rights or other rights of third parties
which would result from the use of information contained herein.
• The products described in this document are designed, developed and manufactured as contemplated for general use, including
without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed
and manufactured as contemplated (1) for use accompanying fatal risks or dangers that, unless extremely high safety is secured,
could have a serious effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss
(i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control, medical life
support system, missile launch control in weapon system), or (2) for use requiring extremely high reliability (i.e., submersible
repeater and artificial satellite).
Please note that Fujitsu will not be liable against you and/or any third party for any claims or damages arising in connection
with above-mentioned uses of the products.
• Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such
failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and
prevention of over-current levels and other abnormal operating conditions.
• If any products described in this document represent goods or technologies subject to certain restrictions on export under the
Foreign Exchange and Foreign Trade Law of Japan, the prior authorization by Japanese government will be required for export
of those products from Japan.
©2003 FUJITSU LIMITED Printed in Japan
(*1)
probe header for the F
(*1)
probe for the F
2
MC-8L series).
2
(*2)
MC
-8L to a user system.
2
MC-8L series) or the
1
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