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Murata LLA219C70G475ME01 Series Reference Sheet page 3

Chip monolithic ceramic capacitor
No
Item
13 Temperature
Appearance
Sudden
Change
Capacitance
Change
D.F.
I.R.
Dielectric
Strength
14 High
Appearance
Temperature
High
Capacitance
Humidity
Change
(Steady State)
D.F.
I.R.
15 Durability
Appearance
Capacitance
Change
D.F.
I.R.
JEMCAS-00669A
Specification
No marking defects.
Within ±12.5%
0.120max.
50Ω・F min.
No failure
No marking defects.
Within ±12.5%
0.2 max.
12.5Ω・F min.
No marking defects.
Within ±12.5%
0.2 max.
25Ω・F min.
■SPECIFICATIONS AND TEST METHODS
Fix the capacitor to the supporting jig in the same manner and under
the same conditions as (10). Perform the five cycles according to the
four heat treatments listed in the following table. Let sit for 24±2
hours at room temperature, then measure.
Step
1
Min.
Operating
Temp.(℃)
Temp.+0/-3
Time(min.)
30±3
・Initial measurement
Perform a heat treatment at 150+0/-10°C for one houg and then let sit
for 24±2 hours at room temperature.
Perform the initial measurement.
Apply the rated voltage at 40±2℃ and 90 to 95% humidity for 500±12 hours.
The charge/discharge current is less than 50mA.
・Initial measurement
Perform a heat treatment at 150+0/-10°C for one houg and then let sit
for 24±2 hours at room temperature.
Perform the initial measurement.
・Measurement after test
Perform a heat treatment at 150+0/-10℃ for one houg and
then let sit for 24±2 hours at room temperature, then measure.
Apply 150% of the rated voltage for 1000±12 hours at the
maximum operating temperature ±3℃. Let sit for 24±2 hours at
room temperature,then measure.
The charge/discharge current is less than 50mA.
・Initial measurement
Perform a heat treatment at 150+0/-10℃ for one houg and then let sit
for 24±2 hours at room temperature.
Perform the initial measurement.
・Measurement after test
Perform a heat treatment at 150+0/-10℃ for one houg and
then let sit for 24±2 hours at room temperature, then measure.
3
Test Method
2
3
4
Max.
Room
Room
Operating
Temp.
Temp.
Temp.+3/-0
2 to 3
2 to 3
30±3
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