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It
It
4. A2CCPU
- - - - - - - - - - - - - - - - - - - - MELSEC·A
(2)
Devices which can be sampled
Devices and the number of points which can be sampled are indicated
below.
(a) Bit devices (X, Y, M, L, S, F, B,
TIC
coil,
TIC
contact) :
Max. 8 points
(b) Word devices
(TIC
present value, D, W, R, A, Z, V) :
Max. 3 points
(3)
Number of sampling times
The number of sampling times involves the following two cases: total
number of sampling times and the number of sampling times after the
execution of the STRA instruction.
(a) Total number of sampling times
This sets the area where the sampling data is stored.
Selling is possible in the range of 0 to 1024 times (in units of 128
times).
(b) Number of sampling times after the execution of the STRA instruc-
tion
This selling is used to end the sampling trace and latch the sam-
pling trace data after the execution of the STRA instruction.
Setting is possible in the range of 0 to 1024 times in units of 128
times.
The number of sampling times
after the execution of the STRA
s
Total number of sampling times
s
1024 times
instruction
1
STRA instruction executed
I
I
I
Number of sampling times after
the execution of STRA instruction
Total number of sampling times
~
Device data is latched allar tha dasignatad
number of sample times after the execution
of the STRA instruction
Fig. 4.19 Number of Sampling Times
4-31

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