Testing For Signal Activity; Managing Labels; Defining Labels - HP 64700 Series User Manual

Note
Testing for Signal
Activity

Managing Labels

8-4 Timing: Using the Analyzer
The threshold settings will not take effect until the next time you
execute a trace or activity test.
After you have connected the probe grabbers to the points which
have signals of interest, you can test for activity on the probe. The
command
activity_test <RETURN>
starts the sampling test.
A high or low status is indicated under each probe bit number on
the display, and the word "Activity" is included in the list of labels,
indicating the activity test is turned on. Enter activity_test
< RETURN> again to turn off the activity test.
The timing analyzer provides you a means of labeling probe signals,
either individually or in groups. You can use the three default
labels or define new ones. Any label can be modified, deleted, or
renamed.

Defining Labels

The "define" command allows you to label the analyzer probe
signals. Each label refers to one or more probe signals. Once a
label is defined, you can then use this label name when specifying
patterns, edges, or glitches on data signals. Label names can be up
to eight characters long, must begin with a letter, and may be
followed by up to seven alphanumeric characters.
Three labels are predefined: "XBITS", "X_lower", and "X_upper".
To define these labels yourself you would use the commands:
define XBITS xbits_bit 0 width 16
logic_polarity positive_true
define X_lower xbits_bit 0 width 8
logic_polarity positive_true
define X_upper xbits_bit 8 width 8
logic_polarity positive_true
<RETURN>
<RETURN>
<RETURN>