Introduction - Agilent Technologies G1701EA Familiarization Manual

6
Create a SIM Quantitation Method

Introduction

90
Selected ion monitoring (SIM) mode is a data acquisition
technique where only selected ion fragments are monitored in
order to obtain maximum sensitivity.
To find appropriate conditions for the SIM data acquisition,
analyze your scan data for:
• Ions (m/z) monitored for each peak - MS SIM parameters
allow you to define up to 100 groups of up to 60 ions each for
selected ion monitoring, however, Agilent recommends you
use as few ions as possible to maximize the signal to noise
ratio.
• The best time to switch groups - Agilent recommends that
you choose a time to switch groups where the peaks are well
separated to avoid variations in retention time due to sample
matrix effects.
Agilent G1701EA MSD Productivity ChemStation Familiarization Guide