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GE L60 Instruction Manual Page 577

Line phase comparison system, ur series.
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APPENDIX B
Table B–10: MODBUS MEMORY MAP (Sheet 21 of 57)
ADDR
REGISTER NAME
5F81
Setting Groups Block
5F82
FlexLogic Operands to Activate Groups 2 through 6 (5
items)
5F89
Setting Group Function
5F8A
Setting Group Events
Setting Groups (Read Only)
5F8B
Current Setting Group
Setting Group Names (Read/Write Setting)
5F8C
Setting Group 1 Name
5F94
Setting Group 2 Name
5F9C
Setting Group 3 Name
5FA4
Setting Group 4 Name
5FAC
Setting Group 5 Name
5FB4
Setting Group 6 Name
Phase Comparison: Negative-Sequence Voltage Fault Detection Settings (Read/Write, Grouped Setting)
6080
Negative-Sequence Voltage Fault Detector Function
6081
Negative-Sequence Voltage Fault Detector Impedance
6082
Negative-Sequence Voltage Fault Detector Low Pickup
6083
Negative-Sequence Voltage Fault Detector High Pickup
6084
Negative-Sequence Voltage Fault Detector Block
6085
Negative-Sequence Voltage Fault Detector Target
6086
Negative-Sequence Voltage Fault Detector Events
Phase Comparison: Rate of Change of Negative-Sequence Current Settings (Read/Write, Grouped Setting)
6088
Negative-Sequence Current Rate of Change Function
6089
Negative-Sequence Current rate of Change Low Pickup
608A
Negative-Sequence Current Rate of Change Low Seal-In
608B
Negative-Sequence Current Rate of Change High Pickup
608C
Negative Sequence Current Rate of Change Seal-In
608D
Negative-Sequence Current Rate of Change Supervision
608E
Negative-Sequence Current Rate of Change Block
608F
Negative-Sequence Current Rate of Change Target
6090
Negative-Sequence Current Rate of Change Events
Phase Comparison Rate of Change of Positive-Sequence Current Settings (Read/Write Grouped Setting)
6092
Positive-Sequence Current Rate of Change (di/dt FD)
Function
6093
Positive-Sequence Current Rate of Change Low (di/dt
FDL) Pickup
6094
Positive-Sequence Current Rate of Change Low (di/dt
FDL) Seal-In
6095
Positive-Sequence Current Rate of Change High (di/dt
FDH) Pickup
6096
Positive-Sequence Current Rate of Change High (di/dt
FDH) Seal-In
6097
Positive-Sequence Current Rate of Change (di/dt FDH)
Supervision
6098
Positive-Sequence Current Rate of Change (di/dt FD)
Block
6099
Positive-Sequence Current Rate of Change (di/dt FD)
Events
609A
Positive-Sequence Current Rate of Change (di/dt FD)
Target
Phase Comparison Negative-Sequence Current Fault Detector (Read/Write Grouped Setting)
60A0
Negative-Sequence Current Fault Detector Function
60A1
Negative-Sequence Current Fault Detector Low Pickup
60A2
Negative-Sequence Current Fault Detector High Pickup
60A3
Negative-Sequence Current Fault Detector Block
60A4
Negative-Sequence Current Fault Detector Target
60A5
Negative-Sequence Current Fault Detector Events
GE Multilin
RANGE
0 to 65535
0 to 65535
0 to 1
0 to 1
0 to 5
---
---
---
---
---
---
0 to 1
0 to 100
0.005 to 3.000
0.005 to 3.000
0 to 65535
0 to 2
0 to 1
0 to 1
0.01 to 5.00
0 to 10.000
0.01 to 5.00
0 to 10.000
0 to 65535
0 to 65535
0 to 2
0 to 1
0 to 1
0.01 to 5.00
0 to 10.000
0.01 to 5.00
0 to 10.000
0 to 65535
0 to 65535
0 to 1
0 to 2
0 to 1
0.02 to 5
0.05 to 15
0 to 65535
0 to 2
0 to 1
L60 Line Phase Comparison System
B.4 MEMORY MAPPING
UNITS
STEP
FORMAT
---
1
F300
---
1
F300
---
1
F102
---
1
F102
---
1
F001
---
---
F203
---
---
F203
---
---
F203
---
---
F203
---
---
F203
---
---
F203
---
1
F102
%
.01
F001
pu
0.001
F001
pu
0.001
F001
---
1
F300
---
1
F109
---
1
F102
---
1
F102
pu
0.01
F001
s
0.001
F001
pu
0.01
F001
s
0.001
F001
---
1
F300
---
1
F300
---
1
F109
---
1
F102
---
1
F102
pu
0.01
F001
s
0.001
F001
pu
0.01
F001
s
0.001
F001
---
1
F300
---
1
F300
---
1
F102
---
1
F109
---
1
F102
pu
0.01
F001
pu
0.01
F001
---
1
F300
---
1
F109
---
1
F102
DEFAULT
0
0
0 (Disabled)
0 (Disabled)
B
0
(none)
(none)
(none)
(none)
(none)
(none)
0 (Disabled)
100
10
50
0
0 (Self-reset)
0 (Disabled)
0 (Disabled)
10
600
50
200
0
0
0 (Self-reset)
0 (Disabled)
0 (Disabled)
10
600
50
200
0
0
0 (Disabled)
0 (Self-reset
0 (Disabled)
10
50
0
0 (Self-reset)
0 (Disabled)
B-29

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