Chapter 2
Procedures and Provisioning
Figure 2-15
(2 times the bandwidth
of the circuit accessed)
2.2.9.6 SPLTEF
Split EF (SPLTEF) for T1 (DS1 HCDS) splits both the A and B paths, connects the E side of the accessed
circuit to FAD1 and the dual facility access digroup (DFAD) pair, and connects the F side to the FAD2
of the same DFAD pair
SPLTEF for T3 (DS3 HCDS) splits both the A and B paths and connects the E side of the accessed circuit
to the odd pair of the FAP and the F side to the even pair of the FAP.
Figure 2-16
(2 times the bandwidth
of the circuit accessed)
2.2.9.7 LOOPE
Loop E (LOOPE) splits both the A and B paths, connects the incoming line from the E direction to the
outgoing line in the E direction, and connects this looped configuration to the FAD
Figure
outgoing signal is the incoming signal and not the signal from the remote test unit (RTU).
QRS is not supported on the ONS 15454, ONS 15327, and ONS 15310-CL. The connection will remain
Note
as is. The ONS 15600 inserts AIS instead of QRS.
SPLTF Access Dual TAP
E
BB
A
AID
B
Dual-FAD TAP
(Figure
SPLTEF Access Dual TAP
E
A
AID
B
Dual-FAD TAP
2-18). Loop E and F modes are basically identical to the SPLT E and F modes except that the
F
"Mapped"
AID
2-16).
F
"Mapped"
AID
Cisco ONS SONET TL1 Command Guide, R6.0
2.2.9 Test Access Mode Definitions
(Figure 2-17
and
2-19