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Commissioning Test Menu; Opto I/p Status Cell (opto-input Status); Relay O/p Status Cell (relay Output Status); Test Port Status Cell - GE MiCOM P40 Agile Technical Manual

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P14D
3

COMMISSIONING TEST MENU

The IED provides several test facilities under the COMMISSION TESTS menu heading. There are menu cells that
allow you to monitor the status of the opto-inputs, output relay contacts, internal Digital Data Bus (DDB) signals
and user-programmable LEDs. This section describes these commissioning test facilities.
3.1

OPTO I/P STATUS CELL (OPTO-INPUT STATUS)

This cell can be used to monitor the status of the opto-inputs while they are sequentially energised with a suitable
DC voltage. The cell is a binary string that displays the status of the opto-inputs where '1' means energised and '0'
means de-energised. If you move the cursor along the binary numbers, the corresponding label text is displayed
for each logic input.
3.2

RELAY O/P STATUS CELL (RELAY OUTPUT STATUS)

This cell can be used to monitor the status of the relay outputs. The cell is a binary string that displays the status of
the relay outputs where '1' means energised and '0' means de-energised. If you move the cursor along the binary
numbers, the corresponding label text is displayed for each relay output.
The cell indicates the status of the output relays when the IED is in service. You can check for relay damage by
comparing the status of the output contacts with their associated bits.
Note:
When the Test Mode cell is set to Contacts Blocked, the relay output status indicates which contacts would operate if
the IED was in-service. It does not show the actual status of the output relays, as they are blocked.
3.3

TEST PORT STATUS CELL

This cell displays the status of the DDB signals that have been allocated in the Monitor Bit cells. If you move the
cursor along the binary numbers, the corresponding DDB signal text string is displayed for each monitor bit.
By using this cell with suitable monitor bit settings, the state of the DDB signals can be displayed as various
operating conditions or sequences are applied to the IED. This allows you to test the Programmable Scheme Logic
(PSL).
3.4

MONITOR BIT 1 TO 8 CELLS

The eight Monitor Bit cells allows you to select eight DDB signals that can be observed in the Test Port Status cell.
Each Monitor Bit cell can be assigned to a particular DDB signal. You set it by entering the required DDB signal
number from the list of available DDB signals.
3.5

TEST MODE CELL

This cell allows you to perform secondary injection testing. It also lets you test the output contacts directly by
applying menu-controlled test signals.
To go into test mode, select the Test Mode option in the Test Mode cell. This takes the IED out of service causing
an alarm condition to be recorded and the Out of Service LED to illuminate. This also freezes any information
stored in the CB CONDITION column. In IEC 60870-5-103 versions, it changes the Cause of Transmission (COT) to
Test Mode.
In Test Mode, the output contacts are still active. To disable the output contacts you must select the Contacts
Blocked option.
Once testing is complete, return the device back into service by setting the Test Mode Cell back to Disabled.
P14D-TM-EN-8
Chapter 20 - Commissioning Instructions
437

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