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4.2.4.5
AIM DPM-1-2006
This standard is based on ISO/IEC 15415 but includes modifications for more robust
measurements of Direct Part Marks. It can be used for a wide range of applications, sectors
and marking technologies.
The most noticeable differences are the use of automatic exposure control and a much
greater contrast tolerance.
Quality parameters
● Axial non-uniformity:
Difference between the height and width relative to the rows and columns.
● Cell contrast:
Measure of the uniformity of the average reflectance of the light pixels and the dark
pixels. This corresponds to "symbol contrast" according to ISO/IEC 15415, however with
different details in the implementation.
● Cell modulation:
Measurement of the uniformity of the reflectance of the dark and light areas of the data
matrix. Similar to "Modulation" according to ISO/IEC 15415, however with different details
in the implementation and lower limits for the quality levels.
● Fixed pattern damage:
Measure of the errors in the borders of the data matrix and all errors in the quiet zone
around the code necessary for decoding.
● Grid non-uniformity:
This is the deviation of the measured grid relative to the ideal grid starting from the four
corners of a data matrix.
● Minimum reflectance:
The lowest reflectance of any area in the data matrix.
● Reference decode:
A measurement of the data matrix with the result passed/failed. The measurement is
based on a binary image of the code to ISO/IEC 16022:2006.
● Unused error correction:
Proportion of error correction information not used for correction of the read result.
● Print growth:
Positive or negative size ratio of the printed cells relative to the ideal grid. Calculated only
as a reference.
SIMATIC MV420 / SIMATIC MV440
Operating Instructions, 04/2013, A5E02371045-06
Image processing
4.2 Code verification
57
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