Reference Data - HP 4145A Operation And Service Manual

Semiconductor parameter analyzer
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SECTION I
Model 4145A
Table l-2.
Reference
Data (Sheet 2 of 3)
STIMULUS/MEASUREMENT
UNIT
(SMU)
Offset
Current
when operated
as a Voltmeter
: 6pA + 2pA x Vo/lOO
Offset
Voltage
when operated
as a Current
Meter : 1OmV + 0.4Q x IO
Noise Characteristics
: (all values typical)
Voltage
Source Noise : 0.01% of range (RMS)
Current
Source Noise : 0.1% of range+3pA+O.OlpAxCg
(RMS)
(Cg : Guard capacitance
in pF)
Voltage Monitor
: 0.02% of range (peak-to-peak)
Current
Monitor
: 0.3% of range + 1OpA
(peak-to-peak)
Output
Overshoot
: (all values typical)
Voltage Source Overshoot
: 5mV
Current
Source Overshoot
: 1% or less
Current
Range Switching
Transient
Noise : (All values typical)
Range Increment
: 0.01% of voltage
range +lOmV
Range Decrement
:
When switching
into
1OnA or 1nA range,
1OmV + lOO/(lO +
Cx)mV where Cx = load capacitance
(pF); when switching
into
all other ranges, 10mV.
Guard Capacitance
: 5 7OOpF
Guard Potential
Offset
: 1mV (typical)
Guard Current
Induced Potential
Error : 1OORxIg (Ig = guard current)
Voltage Sources (Vs)
Output
Noise : 6 mVrms (typical)
Voltage
Monitors
(Vm)
Noise Level :
0.3mVp-p
at 2V-range
(when Integration
time
is set to MED or
LONG),
3mVp-p at 20V range.
REFERENCE
DATA
COMMON
TO ALL
UNITS
Noise Rejection
: (Integration
time set to MED or LONG.)
Normal
Mode Rejection
: L 60dB (typical)
Common
Mode Rejection
: (all values typical)
Current
Source/Measurement
: 2 lpA/lV
1-14

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