Test - HP 4145A Operation And Service Manual

Semiconductor parameter analyzer
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Model 4145A
SECTION I
l-8.
The 4145A is equipped
with a flexible-disc
drive
unit
that
accommodates
a singlesided,
L
single-density,
13.3cm
(5.25 in.), 92K byte disc.
One cleaning
disc
and
five
work-discs--each
containing
the
necessary
operating
system
software,
four
general
purpose
measurement
programs,
and
36.6K
bytes
of user
area-are
furnished
with
the
4145A.
Up
to
47
measurement
setup
programs
or
11 sets
of
measurement
data, plus auto sequence
programs,
can be stored
(SAVE) in the
user
area
and
recalled
(GET) later.
Additional
discs can be
purchased to increase storage capability,
and the
entire
user area
of each disc can be quickly
copied.
l-9.
All instrument
functions
are handled
by a
high speed microprocessor,
under the control
of
the operating
system
software
stored
on each
furnished
flexible
disc.
Measurement
setup,
display
mode
selection,
graphic
scaling,
diagnostics,
operation
guide,
menu,
and catalog
are arranged
as individual
display pages.
Paging
is controlled
by the MENU,
PREV, and NEXT
keys.
Instructions,
softkey
labels,
and
error
messages and codes are displayed
on each page.
Also, the 4145A is remotely
controllable
via the
HP-IB and the 4145A's display can be used as an
independent
display via the HP-IB.
L'
l-10.
Furnished with the 4145A is the 16058A, a
specially
designed
shielded
test
fixture
which
connects
to
the
4145A's
rear
panel.
Eight
different
interchangeable
DUT
boards
are
provided,
allowing
measurement
of
diodes;
S-terminal
and
4-terminal
transistors;
8-pin,
lo-pin,
and 12-pin devices; and 18-pin and 24-pin
DIP
ICs.
The
16058A
is equipped
with
a
lightshielded
lid to allow stable measurement
of
light-sensitive
devices,
such as photo
diodes,
photo transistors,
and photo
resistors.
Also, to
insure
operator
safety
when
potentially
dangerous
voltages
are applied
to a sample,
a
warning
will be displayed
on the 4145A
if the
test fixture
lid is open and measurement
will not
be
made
until
the
lid
is
closed.
For
user-fabricated
test fixtures
and jigs, a special
connector,
four S-meter
triaxial
cables, and four
S-meter coaxial cables are also furnished.
l-l 1. SPECIFICATIONS
1-12.
Complete
specifications
of
the
Model
4145A
Semiconductor
Parameter
Analyzer
are
given in Table l-l.
These specifications
are the
performance
standards
or limits
against
which
the instrument
is tested.
The test
procedures
for the specifications
are covered
in Section IV,
Performance
Tests.
Table
l-2 lists
Reference
Data.
Reference
Data are not specifications
but
are typical
characteristics
included
as additional
information
for the operator.
When the 4145A
Semiconductor
Parameter
Analyzer
is shipped
from
the
factory,
it meets
the
specifications
listed in Table l-l.
1-13.
SAFETY
CONSIDERATIONS
1-14.
The
Model
4145A
Semiconductor
Parameter
Analyzer
has
been
designed
to
conform
to the safety
requirements
of an IEC
(International
Electromechanical
Committee)
Safety Class I instrument
and is shipped from the
factory
in a safe condition.
1-15.
This
operation
and
service
manual
contains
information,
cautions,
and
warnings
which
must be followed
by the user to ensure
safe operation
and to maintain
the instrument
in
a safe condition.
1-16.
INSTRUMENTS
COVERED
BY MANUAL
1-17.
Hewlett-Packard
uses a two-section
nine
character
serial number
which is stamped
on the
serial number
plate
(Figure 1-2) attached
to the
instrument's
rear-panel.
The first four digits and
the letter
are the serial prefix
and the last five
digits are the suffix.
The letter
placed between
the two sections identifies
the country
where the
instrument
was manufactured.
The prefix
is the
same for all identical
instruments;
it changes
only when a change is made to the instrument.
The suffix,
however,
is assigned sequentially
and
is different
for each instrument.
The contents
of this
manual
apply
to instruments
with
the
serial
number
prefix(es)
listed
under
SERIAL
NUMBERS on the title page.
Figure l-2.
Serial Number
Plate.
l-3

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