Page of 56
X
<Activating Test Node>
Insert the PCM card and the RAM card into their
respective
slots,
and insert
a
blank disk
for testing into the
floppy disk
drive.
Turn
on the
power while pressing both [ENTER] and
[5].
This activates the test
lode.
When the test node
is
activated, the internal tests listed below are done
autoiatical
ly.
If
the results of these tests are all nornal, the
systen
loves on
to
the external test Item
1,
<Panel SW Test>.
The internal test iteis are
as
follows^
*
Systei RON Check Sui
*
Internal RAM Test
*
Card RAM Test
*
LCD RAN Test
*
TGL
I/F
Test
*
Internal Battery Test
*
Card Battery Test
'
NIDI Loop Test
*
PCM RON TG
I/F
Test
*
PCM CARD TG
I/F
Test
(Internal
TestttOl)
(Internal Test#02)
(Interanl Test#03)
(Internal Test#04)
(Internal Test#05)
(Internal Test#06)
(Internal Test#07)
(Interanl Test#08)
(Internal
TestifOO)
(Internal TestUlO)
If
any of the internal tests
results
in
an error, the
details
are
displayed
on the LCD.
^
Notes:
-
The fora
of
activation
of the
test aode depends on the combination
of keys*
pressing while
the power
is
turned
on.
They are as follows:
[11+EENTER]
[51+EENTER]
[7]
+[ENTER]
[8]
+[£NTER]
To
perfora tests using
the test menu.
To
perfora internal and external tests.
To
display
the
System Version
No.
only.
To
perfora external tests
only.
Ordinarily,
is
used.
-
Use the
following keys
to
aove back and forth among the test steps:
Cursor key
[]:
Cursor key
[^]:
Move forward
Move backward
17

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